Arama Sonu&ccedil;lar&#305; test VLSI. - Daralt&#305;lm&#305;&#351;: Electronic circuits. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dtest$002bVLSI.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300?dt=list 2024-11-23T12:08:14Z VLSI Design and Test for Systems Dependability ent://SD_ILS/0/SD_ILS:483711 2024-11-23T12:08:14Z 2024-11-23T12:08:14Z Yazar&#160;Asai, Shojiro. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Test Generation of Crosstalk Delay Faults in VLSI Circuits ent://SD_ILS/0/SD_ILS:484415 2024-11-23T12:08:14Z 2024-11-23T12:08:14Z Yazar&#160;Jayanthy, S. author.&#160;Bhuvaneswari, M.C. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>