Arama Sonuçları test VLSI. - Daraltılmış: Electronic circuits.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dtest$002bVLSI.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-01-11T07:52:13Z
VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
2026-01-11T07:52:13Z
2026-01-11T07:52:13Z
Yazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test Generation of Crosstalk Delay Faults in VLSI Circuits
ent://SD_ILS/0/SD_ILS:484415
2026-01-11T07:52:13Z
2026-01-11T07:52:13Z
Yazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
ent://SD_ILS/0/SD_ILS:529630
2026-01-11T07:52:13Z
2026-01-11T07:52:13Z
Yazar Bhuvaneswari, M.C. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-81-322-1958-3">https://doi.org/10.1007/978-81-322-1958-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>