Arama Sonuçları yield. - Daraltılmış: Electronics.
SirsiDynix Enterprise
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2025-12-08T13:54:55Z
Design for Manufacturability and Yield for Nano-Scale CMOS
ent://SD_ILS/0/SD_ILS:169402
2025-12-08T13:54:55Z
2025-12-08T13:54:55Z
Yazar Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-5188-3">http://dx.doi.org/10.1007/978-1-4020-5188-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
ent://SD_ILS/0/SD_ILS:530446
2025-12-08T13:54:55Z
2025-12-08T13:54:55Z
Yazar Jin, Helena. editor. Sciammarella, Cesar. editor. Yoshida, Sanichiro. editor. Lamberti, Luciano. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06986-9">https://doi.org/10.1007/978-3-319-06986-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>