System-on-chip test architectures nanometer design for testability
tarafından
 
Wang, Laung-Terng.

Başlık
: 
System-on-chip test architectures nanometer design for testability

Yazar
: 
Wang, Laung-Terng.

ISBN
: 
9780123739735
 
9780080556802

Yayın Bilgileri
: 
Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.

Fiziksel Tanımlama
: 
1 online resource (xxxvi, 856 p.) : ill.

Seri
: 
The Morgan Kaufmann series in systems on silicon

Seri Başlığı
: 
The Morgan Kaufmann series in systems on silicon

Konu Terimleri
: 
Systems on a chip -- Testing.
 
Integrated circuits -- Very large scale integration -- Testing.
 
Integrated circuits -- Very large scale integration -- Design.

Yazar Ek Girişi
: 
Wang, Laung-Terng.
 
Stroud, Charles E.
 
Touba, Nur A.

Elektronik Erişim
: 
ScienceDirect http://www.sciencedirect.com/science/book/9780123739735


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Çevrimiçi KütüphaneE-Kitap148557-2001ONLINEElektronik Kütüphane