Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
tarafından
Yeung, Dit-Yan. editor.
Başlık
:
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Yazar
:
Yeung, Dit-Yan. editor.
ISBN
:
9783540372417
Fiziksel Tanımlama
:
XXI, 939 p. Also available online. online resource.
Seri
:
Lecture Notes in Computer Science, 4109
Seri Başlığı
:
Lecture Notes in Computer Science, 0302-9743 ; 4109
Konu Terimleri
:
Computer science.
Computational complexity.
Artificial intelligence.
Computer graphics.
Computer vision.
Optical pattern recognition.
Yazar Ek Girişi
:
Kwok, James T.
Fred, Ana.
Roli, Fabio.
Ridder, Dick.
Tüzel Kişi Ek Girişi
:
SpringerLink (Online service)
Elektronik Erişim
:
| Kütüphane | Materyal Türü | Demirbaş Numarası | Yer Numarası | [[missing key: search.ChildField.HOLDING]] | Durumu/İade Tarihi |
|---|
| Çevrimiçi Kütüphane | E-Kitap | 184510-2001 | ONLINE | | Elektronik Kütüphane |