Reliability wearout mechanisms in advanced CMOS technologies
tarafından
 
Strong, Alvin Wayne, 1946-

Başlık
: 
Reliability wearout mechanisms in advanced CMOS technologies

Yazar
: 
Strong, Alvin Wayne, 1946-

ISBN
: 
9780470455265
 
9780470455258

Yayın Bilgileri
: 
Piscataway, NJ : IEEE Press ; Hoboken, NJ : Wiley, c2009.

Fiziksel Tanımlama
: 
1 online resource (xv, 624 p.) : ill.

Seri
: 
IEEE Press series on microelectronic systems
 
IEEE Press series on microelectronic systems.

Konu Terimleri
: 
Metal oxide semiconductors, Complementary -- Reliability.
 
TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
 
TECHNOLOGY & ENGINEERING -- Electronics -- Digital.
 
CMOS-Schaltung.
 
Schaltungsentwurf.

Tür
: 
Electronic books.

Yazar Ek Girişi
: 
Strong, Alvin Wayne, 1946-

Elektronik Erişim
: 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029


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