Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
tarafından
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)
Başlık
:
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Yazar
:
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)
ISBN
:
9780444596918
Toplantı Adı Girişi
:
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)
Yayın Bilgileri
:
Amsterdam : North-Holland, 1993.
Fiziksel Tanımlama
:
1 online resource (xiv, 338 p.) : ill.
Seri
:
European Materials Research Society symposia proceedings ; v. 34
Seri Başlığı
:
European Materials Research Society symposia proceedings ; v. 34
Konu Terimleri
:
Semiconductors -- Analysis -- Congresses.
Semiconductors -- Quality control -- Congresses.
Semiconductors -- Optical properties -- Congresses.
Halbleiter.
Herstellung.
Kongress.
Prozessüberwachung.
Tür
:
Strassburg (1992)
Yazar Ek Girişi
:
Crean, G. M.
Stuck, R.
Woollam, John A.
Tüzel Kişi Ek Girişi
:
European Materials Research Society.
Elektronik Erişim
:
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