Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
tarafından
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
Başlık
:
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Yazar
:
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
ISBN
:
9783038138563
Toplantı Adı Girişi
:
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
Yayın Bilgileri
:
Durnten-Zurich ; Enfield, N.H. : Trans Tech Publications, c2012.
Fiziksel Tanımlama
:
1 online resource (xiii, 299 p.) : ill.
Seri
:
Materials science forum, v. 725
Seri Başlığı
:
Materials science forum, 0255-5476 ; v. 725
Konu Terimleri
:
Semiconductors -- Defects -- Congresses.
Image processing -- Congresses.
Yazar Ek Girişi
:
Yamada-Kaneta, Hiroshi.
Sakai, Akira.
Elektronik Erişim
:
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