Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
tarafından
 
Im, Seongil. author.

Başlık
: 
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Yazar
: 
Im, Seongil. author.

ISBN
: 
9789400763920

Fiziksel Tanımlama
: 
XI, 101 p. 61 illus. online resource.

Seri
: 
SpringerBriefs in Physics,

Konu Terimleri
: 
Physics.
 
Systems engineering.
 
Electronic Circuits and Devices.
 
Solid State Physics.
 
Circuits and Systems.
 
Optics, Optoelectronics, Plasmonics and Optical Devices.
 
Measurement Science and Instrumentation.

Yazar Ek Girişi
: 
Chang, Youn-Gyoung.
 
Kim, Jae Hoon.

Tüzel Kişi Ek Girişi
: 
SpringerLink (Online service)

Elektronik Erişim
: 
http://dx.doi.org/10.1007/978-94-007-6392-0


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