Fringe pattern analysis for optical metrology : theory, algorithms, and applications
tarafından
 
Servín, Manuel, author.

Başlık
: 
Fringe pattern analysis for optical metrology : theory, algorithms, and applications

Yazar
: 
Servín, Manuel, author.

ISBN
: 
9781306840880
 
9783527681082

Basım Bilgisi
: 
First edition.

Fiziksel Tanımlama
: 
1 online resource (xvi, 328 pages) : illustrations

Konu Terimleri
: 
Interferometry.
 
Diffraction patterns.
 
Optical measurements.

Yazar Ek Girişi
: 
Quiroga, J. Antonio (Juan Antonio),
 
Padilla, J. Moisés (José Moisés),

Elektronik Erişim
: 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
 
ebrary http://site.ebrary.com/id/10881255
 
John Wiley http://dx.doi.org/10.1002/9783527681075
 
MyiLibrary http://www.myilibrary.com?id=615339


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