Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
tarafından
Li, Xiaowei. author.
Başlık
:
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Yazar
:
Li, Xiaowei. author.
ISBN
:
9789811985515
Basım Bilgisi
:
1st ed. 2023.
Fiziksel Tanımlama
:
XVIII, 304 p. 1 illus. online resource.
İçerik
:
Chapter 1: Introduction -- Chapter 2: Fault-tolerant general circuits with 3S -- Chapter 3: Fault-tolerant general purposed processors with 3S -- Chapter 4: Fault-tolerant network-on-chip with 3S -- Chapter 5: Fault-tolerant deep learning processors with 3S -- Chapter 6: Conclusion.
Yazar Ek Girişi
:
Yan, Guihai.
Liu, Cheng.
Tüzel Kişi Ek Girişi
:
SpringerLink (Online service)
Elektronik Erişim
:
| Kütüphane | Materyal Türü | Demirbaş Numarası | Yer Numarası | [[missing key: search.ChildField.HOLDING]] | Durumu/İade Tarihi |
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| Çevrimiçi Kütüphane | E-Kitap | 520291-1001 | ONLINE | | Elektronik Kütüphane |