Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability
tarafından
 
Lee, Tae-Kyu. author.

Başlık
Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability

Yazar
Lee, Tae-Kyu. author.

ISBN
9781461492665

Basım Bilgisi
1st ed. 2015.

Fiziksel Tanımlama
XIII, 253 p. 151 illus., 81 illus. in color. online resource.

İçerik
Introduction -- Interconnection : The Joint -- Phase Equilibria and Microstructure of Sn-Ag-Cu Alloys -- Microstructure Development; Solidification and Isothermal Aging -- Thermal Cycling Performance -- Mechanical Stability and Performance -- Chemical and Environment Attack -- Challenges in Future Generation Interconnects: Microstructure Again.

Konu Terimleri
Electronics.
 
Optical materials.
 
Electronic circuits.
 
Electronics and Microelectronics, Instrumentation.
 
Electronic Circuits and Systems.

Yazar Ek Girişi
Bieler, Thomas R.
 
Kim, Choong-Un.
 
Ma, Hongtao.

Tüzel Kişi Ek Girişi
SpringerLink (Online service)

Elektronik Erişim
https://doi.org/10.1007/978-1-4614-9266-5


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