Measurement and modeling of silicon heterostructure devices
tarafından
Cressler, John D.
Başlık
:
Measurement and modeling of silicon heterostructure devices
Yazar
:
Cressler, John D.
ISBN
:
9781420066937
9781315218878
9781351826075
Fiziksel Tanımlama
:
1 online resource (200 pages)
İçerik
:
chapter 001 Best-Practice AC Measurement Techniques. 4- -- chapter 002 A Brief History of the Field -- chapter 003 Overview: Measurement and Modeling -- chapter 004 Best-Practice AC Measurement Techniques -- chapter 005 Industrial Application of TCAD for SiGe Development -- chapter 006 Compact Modeling of SiGe HBTs: HICUM -- chapter 007 Compact Modeling of SiGe HBTs: Mextram -- chapter 008 CAD Tools and Design Kits -- chapter 009 Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs -- chapter 010 Transmission Lines on Si -- chapter 011 Improved De-Embedding Techniques.
Konu Terimleri
:
Bipolar transistors -- Mathematical models.
Bipolar transistors.
Heterostructures.
Integrated circuits -- Design and construction.
Yazar Ek Girişi
:
Cressler, John D.
Elektronik Erişim
:
| Kütüphane | Materyal Türü | Demirbaş Numarası | Yer Numarası | [[missing key: search.ChildField.HOLDING]] | Durumu/İade Tarihi |
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| Çevrimiçi Kütüphane | E-Kitap | 540479-1001 | TK7871.96 .B55 M33 2008 | | CRC E-Books |