Testing for small-delay defects in nanoscale CMOS integrated circuits
tarafından
 
Goel, Sandeep K, editor of compilation.

Başlık
: 
Testing for small-delay defects in nanoscale CMOS integrated circuits

Yazar
: 
Goel, Sandeep K, editor of compilation.

ISBN
: 
9781315217819
 
9781351825016
 
9781439829424

Fiziksel Tanımlama
: 
1 online resource

Seri
: 
Devices, circuits, and systems
 
Devices, circuits, and systems.

İçerik
: 
section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics.

Konu Terimleri
: 
Metal oxide semiconductors, Complementary -- Testing.

Yazar Ek Girişi
: 
Goel, Sandeep K,
 
Chakrabarty, Krishnendu,

Elektronik Erişim
: 
Click here to view.


KütüphaneMateryal TürüDemirbaş NumarasıYer Numarası[[missing key: search.ChildField.HOLDING]]Durumu/İade Tarihi
Çevrimiçi KütüphaneE-Kitap547467-1001TK7871.99 .M44 T43 2014CRC E-Books