Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists
tarafından
 
Dong, ZhiLi, author.

Başlık
: 
Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists

Yazar
: 
Dong, ZhiLi, author.

ISBN
: 
9780429351662
 
9781000569889
 
9781000569902

Basım Bilgisi
: 
First edition.

Fiziksel Tanımlama
: 
1 online resource.

Seri
: 
Advances in materials science and engineering

Konu Terimleri
: 
Materials -- Analysis.
 
Crystallography.
 
X-ray diffraction imaging.
 
Transmission electron microscopy.
 
SCIENCE / Solid State Physics
 
SCIENCE / Spectroscopy & Spectrum Analysis
 
TECHNOLOGY / Material Science

Elektronik Erişim
: 
Taylor & Francis https://www.taylorfrancis.com/books/9780429351662
 
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf


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