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C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 için kapak resmi
Başlık:
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Yazar:
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France)
ISBN:
9780444596338
Yayın Bilgileri:
Oxford : Elsevier Science, 1996.
Fiziksel Tanımlama:
1 online resource (580 p.)
Seri:
European Materials Research Society Symposia Proceedings
Seri Başlığı:
European Materials Research Society Symposia Proceedings
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