Arama Sonuçlarını Sınırlandır
Yazar
SpringerLink (Online service)
(7)
Kapralos, Bill. editor.
(4)
Rousseau, Jean-Jacques. editor. (orcid)
(4)
Acevedo, Miguel F., author.
(2)
Appleton, Katy, 1975-
(2)
Dil
Yayın Yılı
-
Konu
Environmental monitoring -- Data processing.
(7)
Geographic information systems -- Congresses.
(3)
TECHNOLOGY / Environmental Engineering & Technology
(3)
Environmental monitoring -- Data processing -- Congresses.
(2)
Environmental policy -- Decision making -- Equipment and supplies -- Congresses.
(2)
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21 sonuç bulundu Arama sonuçlarına abone ol
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1. 
SPATIAL INTELLIGENCE FOR A GREENER PLANET AI applications in environmental pollution mapping, analysis and mitigation için kapak resmi
SPATIAL INTELLIGENCE FOR A GREENER PLANET AI applications in environmental pollution mapping, analysis and mitigation
Yazar 
Chaurasia, Kuldeep, 1986- editor. Garg, Pradeep K., editor. P. V., Arun, 1987- editor. Yan, Yingwei, 1987- editor.
Yer Numarası 
TD193
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781032718323
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Durum 
Çevrimiçi Kütüphane~1
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Kopya:
2. 
Real-time environmental monitoring : sensors and systems için kapak resmi
Real-time environmental monitoring : sensors and systems
Yazar 
Acevedo, Miguel F., author.
Yer Numarası 
QH541.15 .M64
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003425496
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Durum 
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3. 
Real-time environmental monitoring : sensors and systems : lab manual için kapak resmi
Real-time environmental monitoring : sensors and systems : lab manual
Yazar 
Acevedo, Miguel F., author.
Yer Numarası 
QH541.15 .M64
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003184362
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Durum 
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4. 
Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022 için kapak resmi
Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
Yazar 
Di Maio, Dario. editor. Baqersad, Javad. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-04098-6
Format: 
Durum 
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5. 
Technologies and Innovation 9th International Conference, CITI 2023, Guayaquil, Ecuador, November 13-16, 2023, Proceedings için kapak resmi
Technologies and Innovation 9th International Conference, CITI 2023, Guayaquil, Ecuador, November 13-16, 2023, Proceedings
Yazar 
Valencia-García, Rafael. editor. Bucaram-Leverone, Martha. editor. Del Cioppo-Morstadt, Javier. editor. Vera-Lucio, Néstor. editor. Centanaro-Quiroz, Pablo Humberto. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-45682-4
Format: 
Durum 
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6. 
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part IV için kapak resmi
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part IV
Yazar 
Rousseau, Jean-Jacques. editor. (orcid) Kapralos, Bill. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-37745-7
Format: 
Durum 
Çevrimiçi Kütüphane~1
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7. 
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part I için kapak resmi
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part I
Yazar 
Rousseau, Jean-Jacques. editor. (orcid) Kapralos, Bill. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-37660-3
Format: 
Durum 
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8. 
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part III için kapak resmi
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part III
Yazar 
Rousseau, Jean-Jacques. editor. (orcid) Kapralos, Bill. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-37731-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
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9. 
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part II için kapak resmi
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part II
Yazar 
Rousseau, Jean-Jacques. editor. (orcid) Kapralos, Bill. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-37742-6
Format: 
Durum 
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10. 
Geographic data science with R : visualizing and analyzing environmental change için kapak resmi
Geographic data science with R : visualizing and analyzing environmental change
Yazar 
Wimberly, Michael C., author.
Yer Numarası 
G70.217 .G46
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003326199
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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11. 
Modeling and simulation of environmental systems : a computation approach için kapak resmi
Modeling and simulation of environmental systems : a computation approach
Yazar 
Maurya, Satya Prakash, editor. Yadav, Akhilesh, 1973- editor. Singh, R. P. (Ramesh P.), editor.
Yer Numarası 
TD169
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003203445
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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12. 
MONITORING CONTINUOUS PHENOMENA; BACKGROUND, METHODS AND SOLUTIONS için kapak resmi
MONITORING CONTINUOUS PHENOMENA; BACKGROUND, METHODS AND SOLUTIONS
Yazar 
Lorkowski, Peter, 1973-
Yer Numarası 
GE45 .R44
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9780429440960
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Durum 
Çevrimiçi Kütüphane~1
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