Arama Sonuçlarını Sınırlandır
Yazar
Dil
Yayın Yılı
-
Konu
Materyal Türü
Shelf Location
Kütüphane
Liste görünümüne geç
Küçük resim görünümüne geç
Eylem Seç
5 sonuç bulundu Arama sonuçlarına abone ol
00000DEFAULT_TR
Yazdır
1. 
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan için kapak resmi
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Yazar 
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) Yamada-Kaneta, Hiroshi. Sakai, Akira.
Yer Numarası 
ONLINE
Elektronik Erişim 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
2. 
Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995 için kapak resmi
Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995
Yazar 
International Symposium on Silicon Molecular Beam Epitaxy (6th : 1995 : Strasbourg, France) Kasper, E.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444824110
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
3. 
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 için kapak resmi
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Yazar 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444824134
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
4. 
Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990 için kapak resmi
Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990
Yazar 
Trieste ICTP-IUPAP Semiconductor Symposium (6th : 1990) Stutzmann, M. (Martin) Chevallier, J. (Jacques)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444891389
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
5. 
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2 için kapak resmi
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Yazar 
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444884299
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya: