Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 için kapak resmi
Başlık:
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Yazar:
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)
ISBN:
9780444596918
Toplantı Adı Girişi:
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)
Yayın Bilgileri:
Amsterdam : North-Holland, 1993.
Fiziksel Tanımlama:
1 online resource (xiv, 338 p.) : ill.
Seri:
European Materials Research Society symposia proceedings ; v. 34
Seri Başlığı:
European Materials Research Society symposia proceedings ; v. 34
Konu Terimleri:
Semiconductors -- Analysis -- Congresses.

Semiconductors -- Quality control -- Congresses.

Semiconductors -- Optical properties -- Congresses.

Halbleiter.

Herstellung.

Kongress.

Prozessüberwachung.
Tür:
Strassburg (1992)
Yazar Ek Girişi:
Crean, G. M.

Stuck, R.

Woollam, John A.
Tüzel Kişi Ek Girişi:
European Materials Research Society.
Elektronik Erişim:
ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
Ayırtma:
Kopya:

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