chapter 1 An Overview of ICP Mass Spectrometry -- chapter 2 Principles of Ion Formation -- chapter 3 Sample Introduction -- chapter 4 Plasma Source -- chapter 5 Interface Region -- chapter 6 Ion-Focusing System -- chapter 7 Mass Analyzers: Quadrupole Technology -- chapter 8 Mass Analyzers: Double-Focusing Magnetic Sector Technology -- chapter 9 Mass Analyzers: Time-of-Flight Technology -- chapter 10 Mass Analyzers: Collision/Reaction Cell and Interface Technology -- chapter 11 Ion Detectors -- chapter 12 Peak Measurement Protocol -- chapter 13 Methods of Quantitation -- chapter 14 Review of Interferences -- chapter 15 Contamination Issues Associated with Sample Preparation -- chapter 16 Routine Maintenance -- chapter 17 Alternative Sample Introduction Techniques -- chapter 18 Coupling ICP-MS with Chromatographic Techniques for Trace Element Speciation Studies -- chapter 19 ICP-MS Applications -- chapter 20 Comparing ICP-MS with Other Atomic Spectroscopic Techniques -- chapter 21 How to Select an ICP Mass Spectrometer: Some Important Analytical Considerations -- chapter 22 Glossary of ICP-MS Terms -- chapter 23 Useful Contact Information.