Başlık:
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Yazar:
Dahoo, Pierre Richard, author.
ISBN:
9781119818984
Fiziksel Tanımlama:
1 online resource
Seri:
Reliability of Multiphysical Systems Set ; Volume 10
Reliability of multiphysical systems set ; v. 10.
İçerik:
Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics
Notlar:
John Wiley and Sons
Elektronik Erişim:
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984Kopya:
Rafta:*
Kütüphane | Materyal Türü | Demirbaş Numarası | Yer Numarası | Durumu/İade Tarihi | Materyal Ayırtma |
|---|---|---|---|---|---|
Arıyor... | E-Kitap | 596749-1001 | QC88 | Arıyor... | Arıyor... |