The book presents result in the field of testing and diagnosis of analog and mixed-signal circuits. The most important feature of the book is that it promotes artificial intelligence as a key tool in the subject of test signal generation and, especially, in analog and mixed-signal diagnosis. The book covers definitions of faults and fault effects; analog signal test synthesis, concurrent fault simulation of linear and nonlinear analog dynamic circuits; combinational circuit test synthesis; mixed-signal testing; design for testability of digital and mixed-signal circuits; built-in test for analog circuits; diagnosis of analog and mixed-signal circuits; and an overview of testing and diagnosis as industrial and business activity. A chapter containing a set of worked examples is added. To complete, a short repositorium of analog artificial neural networks is given at the end of the book.