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(13)
Li, Jinwen. editor.
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13.
Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Yazar
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
Yer Numarası
ONLINE(335669.1)
Elektronik Erişim
http://dx.doi.org/10.1007/978-90-481-9644-9
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