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Yazar

SpringerLink (Online service)

(31)

Yadav, Sanjay. editor.

(3)

Astakhov, Viktor P., author.

(2)

Collège français de métrologie.

(2)

Gåsvik, Kjell J.

(2)

John Wiley & Sons.

(2)

(2)

Mills, David L., author.

(2)

Osten, Wolfgang.

(2)

Osten, Wolfgang. editor.

(2)

Whitehouse, D. J. (David J.), author.

(2)

Whitehouse, D. J. (David J.). Handbook of surface metrology.

(2)

Wiley InterScience (Online service)

(2)

Abran, Alain, 1949-

(1)

Ahmed Osman, Osman. editor.

(1)

Arya, Yogendra. editor.

(1)

(1)

Aswal, Dinesh K. editor.

(1)

Azrar, Lahcen. editor.

(1)

Bach, Friedrich-Wilhelm. editor.

(1)

Bahubalendruni, M.V.A. Raju. editor.

(1)

Bandyopadhyay, Sanghamitra. editor.

(1)

Baqersad, Javad, editor.

(1)

Baqersad, Javad. editor.

(1)

Beidouri, Zitouni. editor.

(1)

Berglund, Birgitta.

(1)

Biswal, Bibhuti Bhusan. editor.

(1)

Boutier, A. (Alain)

(1)

Bowen, D. Keith (David Keith), 1940- author.

(1)

Brown, Christopher A. editor.

(1)

Brown, Robert. author.

(1)

Callegaro, Luca., author.

(1)

Cardoso, Jaime S. editor.

(1)

Chaari, Fakher. editor.

(1)

Chaudhary, K.P. editor.

(1)

Ciaccio, Marcello. editor.

(1)

Czichos, Horst. editor.

(1)

Dahiya, Aman. editor.

(1)

Davim, J. Paulo, editor.

(1)

Deepak, B.B.V.L. editor.

(1)

Deng, Lvxiang. editor.

(1)

Denkena, Berend. editor.

(1)

Di Maio, Dario, editor.

(1)

Di Maio, Dario. editor.

(1)

Diebold, A. C. (Alain C.)

(1)

Diering, Magdalena. editor.

(1)

Dinkelacker, Friedrich. editor.

(1)

Doering, Robert, 1946-

(1)

Donnerhacke, Karl-Heinz.

(1)

Emery, A. F. (Ashley Francis), 1934- author.

(1)

Engen, Glenn F.

(1)

(1)

Falldorf, Claas. author.

(1)

Faller, R.V., editor.

(1)

Forbes, Alistair B. editor.

(1)

Franceschini, Fiorenzo. author.

(1)

Fujita, Daisuke, editor.

(1)

Gahlot, Ajay. editor.

(1)

Galetto, Maurizio. author.

(1)

Galyer, J. F. W.

(1)

Gao, Wei. editor.

(1)

Garg, Naveen. editor.

(1)

Gilmore, Adam M., editor.

(1)

Gläser, Michael, 1942-

(1)

Guo, Chunlei, editor.

(1)

Gupta, S. V. author.

(1)

Gupta, S. V., author.

(1)

Haddar, Mohamed. editor.

(1)

Haitjema, Han, author.

(1)

Harding, Kevin G.

(1)

Harvie, Julie. editor.

(1)

Hebra, Alexius J. author.

(1)

Hocken, Robert J.

(1)

Horn, Alexander, PD Dr.

(1)

International Metrology Conference (13th : 2007 : French College of Metrology)

(1)

International Modal Analysis Conference (41st : 2023)

(1)

Jalid, Abdelilah. editor.

(1)

Jones, Frank E., author.

(1)

Jüptner, Werner. author.

(1)

Kaiser, Debra L., editor.

(1)

Kaschke, Michael F.

(1)

Kaufmann, Guillermo H.

(1)

Kes, P. H. (Peter H.)

(1)

Knoll, Gunter. editor.

(1)

Kochsiek, Manfred.

(1)

Kramer, Thomas R. author.

(1)

Kryszkiewicz, Marzena. editor.

(1)

Kujawinska, Malgorzata. editor.

(1)

Kumar, Harish. editor.

(1)

Kumar, Rahul. editor.

(1)

Lamouri, Samir. editor.

(1)

(1)

Leach, Richard, author.

(1)

Link, Albert N., author.

(1)

Lira, Ignacio, 1951- author.

(1)

Liu, Zheng. editor.

(1)

Lund, Anders. editor.

(1)

Maier, Hans Jürgen. editor.

(1)

Maisano, Domenico. author.

(1)

Malacara, Daniel, 1937-

(1)

Mansfield, Elisabeth, editor.

(1)

Mark, William D.

(1)

Mastrogiacomo, Luca. author.

(1)

Meinrath, G. author.

(1)

Moneim Elhadi Sulieman, Abdel. editor.

(1)

Muralikrishnan, Bala. author.

(1)

Niel, Kurt. editor.

(1)

Nishi, Yoshio, 1940-

(1)

Padilla, J. Moisés (José Moisés), author.

(1)

Pal, Sankar K. editor.

(1)

Papadakis, Emmanuel P., author.

(1)

Pardo, Xosé M. editor.

(1)

Paredes, Roberto. editor.

(1)

Parhi, D.R.K. editor.

(1)

Pavese, Franco. editor.

(1)

Pereira, Paulo H.

(1)

Prakash, Chander, editor.

(1)

Pralio, Barbara. author.

(1)

Proulx, Tom. editor.

(1)

Quinten, Michael.

(1)

Quiroga, J. Antonio (Juan Antonio), author.

(1)

Rachakonda, Prem. editor.

(1)

Raja, Jay. author.

(1)

Ramuhalli, Pradeep. editor.

(1)

Raza, Hassan. editor.

(1)

Reingand, Nadya.

(1)

Reithmeier, Eduard. editor.

(1)

Rienäcker, Adrian. editor.

(1)

Rill, Michael Stefan.

(1)

(1)

Rogalla, H. (Horst)

(1)

Rybinski, Henryk. editor.

(1)

Saito, Tetsuya. editor.

(1)

Schaeffer, Ronald D., author.

(1)

Schnars, Ulf. author.

(1)

Schneider, Petra. author.

(1)

Schoonover, Randall M.

(1)

Sennaroglu, Alphan.

(1)

Servín, Manuel, author.

(1)

Shiotani, Masaru. editor.

(1)

Shotbolt, C. R., ort. yaz.

(1)

Siadat, Ali. editor.

(1)

Silvani, Xavier. author.

(1)

Singh, Subhash Chandra (Writer on technology), editor.

(1)

Singh, Sunpreet, 1989- editor.

(1)

(1)

Smith, Bruce W., 1959-

(1)

Smith, Leslie. editor.

(1)

(1)

Stefanski, Matthew. editor.

(1)

Stock, Stuart R., author.

(1)

Suzuki, Kazuaki.

(1)

Taha Janan, Mourad. editor.

(1)

Takatsuji, Toshiyuki. editor.

(1)

Tanner, B. K. (Brian Keith)

(1)

Taylor and Francis.

(1)

Thompson, Brian J.

(1)

Tuchin, V. V. (Valerii Viktorovich)

(1)

Ukida, Hiroyuki. editor.

(1)

Voorde, M. H. van de (Marcel H.), editor.

(1)

Vosk, Ted, author.

(1)

Walber, Chad. editor.

(1)

Watson, John. author.

(1)

Wieczorowski, Michał. editor.

(1)

Wong, Terence K. S.

(1)

Xu, Xun. author.

(1)

(1)

Yoshizawa, Toru, 1939-

(1)

Zainuddin, Hidayat. editor.

(1)

Zarbane, Khalid. editor.

(1)

Zhao, Yaoyao (Fiona). author.

(1)

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Tümünü genişlet

Konu

(15)

Electronic books.

(8)

(8)

Nanotechnology.

(7)

(6)

Optical measurements.

(6)

(5)

(5)

(4)

Surfaces (Physics).

(4)

(3)

Computer aided design.

(3)

Computer vision.

(3)

Industrial engineering.

(3)

Machinery and Machine Elements.

(3)

Metrology and Fundamental Constants.

(3)

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(3)

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(2)

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(2)

(2)

(2)

(2)

Drilling and boring machinery.

(2)

(2)

Engineering design.

(2)

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(2)

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(2)

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(2)

(2)

(2)

Mass (Physics) -- Measurement.

(2)

(2)

Measurement Science and Instrumentation.

(2)

(2)

Mechanics, Applied.

(2)

Microtechnology.

(2)

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(2)

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(2)

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(2)

Quality control.

(2)

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(2)

Speckle metrology.

(2)

Surfaces (Technology) -- Measurement.

(2)

(2)

TECHNOLOGY / Material Science

(2)

Telecommunication.

(2)

Analytical biochemistry.

(1)

Applied Dynamical Systems.

(1)

Ağırlıklar ve ölçüler -- Türkiye

(1)

BUSINESS & ECONOMICS / Econometrics

(1)

BUSINESS & ECONOMICS / Economics / Theory

(1)

BUSINESS & ECONOMICS / Government & Business

(1)

(1)

Building materials.

(1)

COMPUTERS -- Software Development & Engineering -- Quality Assurance & Testing.

(1)

Cellular Stress.

(1)

Characterization and Analytical Technique.

(1)

Chemical engineering.

(1)

Chemistry, Physical and theoretical.

(1)

(1)

Communications Engineering, Networks.

(1)

Compound semiconductors -- Design and construction -- Materials.

(1)

Computer networks -- Management.

(1)

Computer networks.

(1)

Computer science -- Mathematics.

(1)

Computer vision -- Congresses.

(1)

Control engineering systems.

(1)

Control engineering.

(1)

Control, Robotics, Automation.

(1)

Coordinate measuring machines.

(1)

Corrosion and anti-corrosives.

(1)

(1)

Dental Medicine

(1)

(1)

Diffraction patterns.

(1)

Dimensional analysis -- Handbooks, manuals, etc.

(1)

Dimensional analysis.

(1)

Distribution (Probability theory).

(1)

(1)

Electric network analyzers.

(1)

Electric power production.

(1)

Electrical Power Engineering.

(1)

(1)

Electronics and Microelectronics, Instrumentation.

(1)

Engineering Fluid Dynamics.

(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

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(1)

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(1)

(1)

Fluid mechanics -- Measurement.

(1)

(1)

Food -- Analysis.

(1)

Food -- Microbiology.

(1)

Food -- Safety measures.

(1)

Food Chemistry.

(1)

Food Microbiology.

(1)

(1)

(1)

(1)

Forensic sciences.

(1)

Gearing -- Vibration -- Mathematical models.

(1)

Gearing -- Vibration -- Measurement.

(1)

(1)

Holographic testing.

(1)

Human information processing -- Mathematical models.

(1)

Hydraulic measurements.

(1)

Imaging systems in medicine -- Handbooks, manuals, etc.

(1)

Imaging systems.

(1)

Industrial safety.

(1)

Integrated circuits -- Masks.

(1)

Integrated circuits -- Measurement.

(1)

Interferometry.

(1)

Lasers -- Industrial applications.

(1)

(1)

Machines, Tools, Processes.

(1)

Manufacturing processes.

(1)

Masks (Electronics) -- Handbooks, manuals, etc.

(1)

Materials -- Analysis.

(1)

Materials -- Testing.

(1)

Materials Engineering.

(1)

Mathematical statistics.

(1)

(1)

(1)

Measurement -- Congresses.

(1)

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(1)

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(1)

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(1)

Mechanics, applied.

(1)

Metal oxide semiconductors, Complementary -- Design and construction.

(1)

(1)

(1)

Metrology -- Economic aspects.

(1)

Metrology -- Handbooks, manuals, etc.

(1)

(1)

Microelectromechanical systems -- Measurement.

(1)

Microelectronics -- Measurement.

(1)

Microelectronics.

(1)

Microfabrication.

(1)

Microlithography -- Industrial applications.

(1)

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(1)

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(1)

Microwave measurements.

(1)

Microwaves, RF Engineering and Optical Communications.

(1)

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(1)

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(1)

Multibody Systems and Mechanical Vibrations.

(1)

Multibody systems.

(1)

(1)

Nanophotonics -- Handbooks, manuals, etc.

(1)

(1)

Nanotechnologie.

(1)

Network Time Protocol (Computer network protocol)

(1)

(1)

Nondestructive testing -- Cost effectiveness.

(1)

Nonlinear theories.

(1)

Nuclear chemistry.

(1)

(1)

(1)

Oceanographic instruments.

(1)

Oceanography -- Measurement.

(1)

Ophthalmology -- Equipment and supplies.

(1)

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(1)

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(1)

Optical detectors -- Industrial applications.

(1)

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(1)

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(1)

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(1)

(1)

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(1)

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(1)

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(1)

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(1)

(1)

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(1)

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(1)

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(1)

(1)

Quantum Measurement and Metrology.

(1)

Quantum physics.

(1)

Radiation Dosimetry and Protection.

(1)

Radiation dosimetry.

(1)

(1)

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SCIENCE / Mechanics / General

(1)

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(1)

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(1)

Semiconductor industry -- Handbooks, manuals, etc.

(1)

Semiconductor wafers -- Inspection.

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

Sensors and biosensors.

(1)

Signal, Speech and Image Processing.

(1)

Silicon-on-insulator technology.

(1)

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(1)

Software measurement -- Design.

(1)

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(1)

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Elektronik Kütüphane

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85.

Solid-state lasers and applications için kapak resmi

Solid-state lasers and applications

Solid-state lasers and applications

Yazar

Sennaroglu, Alphan.

Yer Numarası

TA1705 .S6748 2007

Elektronik Erişim

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86.

Financial justification of nondestructive testing : cost of quality in manufacturing için kapak resmi

Financial justification of nondestructive testing : cost of quality in manufacturing

Financial justification of nondestructive testing : cost of quality in manufacturing

Yazar

Papadakis, Emmanuel P., author.

Yer Numarası

TA417.2 .P37 2007

Elektronik Erişim

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87.

Computer network time synchronization : the network time protocol için kapak resmi

Computer network time synchronization : the network time protocol

Computer network time synchronization : the network time protocol

Yazar

Mills, David L., author.

Yer Numarası

TK5105.5 .M564 2006

Elektronik Erişim

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88.

Handbook of photomask manufacturing technology için kapak resmi

Handbook of photomask manufacturing technology

Handbook of photomask manufacturing technology

Yazar

Rizvi, Syed.

Yer Numarası

TK7872 .M3 H36 2005

Elektronik Erişim

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89.

Handbook of Laser Technology and Applications (Three- Volume Set). için kapak resmi

Handbook of Laser Technology and Applications (Three- Volume Set).

Handbook of Laser Technology and Applications (Three- Volume Set).

Yazar

Taylor and Francis.

Yer Numarası

TA1675 .H363 2003

Elektronik Erişim

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90.

Evaluating the measurement uncertainty : fundamentals and practical guidance için kapak resmi

Evaluating the measurement uncertainty : fundamentals and practical guidance

Evaluating the measurement uncertainty : fundamentals and practical guidance

Yazar

Lira, Ignacio, 1951- author.

Yer Numarası

T50

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9780367801564
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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91.

Practical density measurement and hydrometry için kapak resmi

Practical density measurement and hydrometry

Practical density measurement and hydrometry

Yazar

Gupta, S. V., author.

Yer Numarası

QD169 .W3

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9780367801496
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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92.

Handbook of mass measurement için kapak resmi

Handbook of mass measurement

Handbook of mass measurement

Yazar

Jones, Frank E., author. Schoonover, Randall M.

Yer Numarası

QC106 .J66 2002

Elektronik Erişim

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93.

Handbook of optical engineering için kapak resmi

Handbook of optical engineering

Handbook of optical engineering

Yazar

Malacara, Daniel, 1937- Thompson, Brian J.

Yer Numarası

TA1520 .H368 2001

Elektronik Erişim

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94.

Assessment of Oral Health : Diagnostic Techniques and Validation Criteria için kapak resmi

Assessment of Oral Health : Diagnostic Techniques and Validation Criteria

Assessment of Oral Health : Diagnostic Techniques and Validation Criteria

Yazar

Faller, R.V., editor.

Yer Numarası

XX(548684.1)

Elektronik Erişim

https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3

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