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SpringerLink (Online service)

(369)

Wiley InterScience (Online service)

(27)

Dhillon, B. S. (Balbir S.), 1947-

(9)

John Wiley & Sons.

(8)

Nakagawa, Toshio. author.

(6)

(5)

Soares, C. Guedes.

(5)

Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121

(4)

Pham, Hoang. author.

(4)

Ushakov, I. A. (Igorʹ Alekseevich)

(4)

(3)

Ayyub, Bilal M.

(3)

Balakrishnan, N. editor.

(3)

Birolini, Alessandro. author.

(3)

Bitsch, Friedemann. editor.

(3)

(3)

Dhillon, B. S. author.

(3)

Finkelstein, Maxim. author.

(3)

Guiochet, Jérémie. editor.

(3)

Licari, James J., 1930-

(3)

Nikolaidis, Efstratios.

(3)

Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331

(3)

(3)

Weippl, Edgar. editor.

(3)

Willis, H. Lee, 1949-

(3)

Xu, Lida. editor.

(3)

Alampalli, Sreenivas.

(2)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(2)

Aven, Terje. author.

(2)

Ayyub, Bilal M., author.

(2)

Baggini, Angelo B.

(2)

Blischke, W. R., 1934-

(2)

Blischke, Wallace R. author.

(2)

Bloch, Heinz P., 1933-

(2)

Bondavalli, Andrea. editor.

(2)

Brown, Richard E., 1969-

(2)

Cha, Ji Hwan. author.

(2)

Chaari, Fakher. editor.

(2)

Collart-Dutilleul, Simon. editor.

(2)

Crespo Márquez, Adolfo. author.

(2)

Czaplicki, Jacek M.

(2)

Daniel, Peter. editor.

(2)

De Doncker, Rik. author.

(2)

(2)

Eerkens, Jeff W. author.

(2)

Ettouney, Mohammed.

(2)

(2)

Fakhfakh, Mourad. editor.

(2)

Flammini, Francesco. editor.

(2)

Frenkel, Ilia. author.

(2)

Frenkel, Ilia. editor.

(2)

Gallina, Barbara. editor. (orcid)0000-0002-6952-1053

(2)

Garau, Chiara. editor. (orcid)

(2)

Gertsbakh, Ilya. author.

(2)

Gervasi, Osvaldo. editor. (orcid)

(2)

Gheorghe, Adrian V. author.

(2)

Gheorghe, Adrian V. editor.

(2)

Ghiocel, Dan M.

(2)

Ghosh, Ankush. editor.

(2)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(2)

Goodarzi, Ehsan. author.

(2)

Gopalaswamy, Venky.

(2)

Guedes Soares, Carlos.

(2)

Haddar, Mohamed. editor.

(2)

Hamrol, Adam. editor.

(2)

Justiniano, Jose M.

(2)

Kabashkin, Igor. editor.

(2)

Kaminskiy, Mark, 1946-

(2)

Katina, Polinpapilinho F. author.

(2)

Klyatis, Lev M.

(2)

Koornneef, Floor. editor.

(2)

Koren, Israel, 1945-

(2)

Kurtoglu, Selahattin. author.

(2)

Lecomte, Thierry. editor.

(2)

Levitin, Gregory. editor.

(2)

Li, Jinwen. editor.

(2)

Li, Rita Yi Man. author.

(2)

Limnios, Nikolaos. author.

(2)

Liptk̀, Bľa G.

(2)

Lisnianski, Anatoly. author.

(2)

Lisnianski, Anatoly. editor.

(2)

Lutz, Josef. author.

(2)

McCuen, Richard H., 1941-

(2)

McPherson, J. W. author.

(2)

(2)

Merkow, Mark S.

(2)

Meyers, Johan. editor.

(2)

Misra, Krishna B., 1943-

(2)

Mobley, R. Keith, 1943-

(2)

Murgante, Beniamino. editor. (orcid)

(2)

Murthy, D. N. P.

(2)

Murthy, D. N. Prabhakar. author.

(2)

Nelson, Wayne, 1936-

(2)

Nikulin, M.S. editor.

(2)

Nwaoha, Chikezie, 1984-

(2)

O'Regan, Gerard. author.

(2)

Ohring, Milton, 1936-

(2)

Ortmeier, Frank. editor.

(2)

Paprzycki, Marcin. editor.

(2)

Pham, Hoang. editor.

(2)

Pluvinage, Guy. editor.

(2)

Prentkovskis, Olegas. editor.

(2)

(2)

Quirchmayr, Gerald. editor.

(2)

Raghavan, Lakshmikanth.

(2)

(2)

Rausand, Marvin.

(2)

Sagaut, Pierre. editor.

(2)

Sayed-Mouchaweh, Moamar. editor.

(2)

Scheuermann, Uwe. author.

(2)

Schlangenotto, Heinrich. author.

(2)

Schneidewind, Norman.

(2)

Schoitsch, Erwin. editor.

(2)

Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443

(2)

Schrieber, Randall R.

(2)

Shaw, Rabindra Nath. editor.

(2)

Shooman, Martin L.

(2)

Shpungin, Yoseph. author.

(2)

Siarry, Patrick. editor.

(2)

Singhal, Suren.

(2)

Skavhaug, Amund. editor.

(2)

(2)

Suhir, Ephraim.

(2)

Swanson, Dale W.

(2)

Tan, Cher Ming. author.

(2)

Tlelo-Cuautle, Esteban. editor.

(2)

Tonetta, Stefano. editor.

(2)

Troubitsyna, Elena. editor.

(2)

(2)

Verma, Ajit Kumar. author.

(2)

Verma, Ajit Kumar. editor.

(2)

Vinnem, Jan Erik. author.

(2)

Vinnem, Jan-Erik. author.

(2)

Whitaker, Jerry C.

(2)

Wilson, John R.

(2)

Xiao, Liquan. editor.

(2)

Xu, Weixia. editor.

(2)

Yang, Guang-Hong.

(2)

You, Ilsun. editor.

(2)

Zhang, Chengyi. editor.

(2)

Ziaei, Mina. author.

(2)

van Aartsengel, Aristide. author.

(2)

van Gulijk, Coen. editor.

(2)

A Min, Tjoa. editor.

(1)

Abbas, Nureddin Mohamed.

(1)

Abbas, Syed Mohsin. author.

(1)

Abdel-Hameed, Mohamed S.

(1)

Aboul-Enein, Hassan Y.

(1)

Abrahamsson, Pekka. editor.

(1)

Adams, Daniel. author.

(1)

Adams, Kevin MacG. author.

(1)

(1)

Agarwal, Avinash Kumar. editor.

(1)

Agrawal, Abha. editor.

(1)

Aguilar, Jesús H. (Jesús Humberto), 1962-

(1)

Ahad, Mohd Abdul. editor.

(1)

(1)

Ait-Kadi, Daoud. editor.

(1)

Ajit, Srividya. author.

(1)

Akram, Raja Naeem. editor.

(1)

Akyildiz, Ian F. editor.

(1)

Al-Turki, Umar M. author.

(1)

Aldrin, John C. author.

(1)

Alford, Terry L. author.

(1)

Ali, Syed Riffat. author.

(1)

Alias, Nor Aziah, 1961-

(1)

Aliev, Telman. author.

(1)

Allen, Theodore T. author.

(1)

Allocco, Michael.

(1)

Alouini, Mohamed-Slim.

(1)

Alwin, Duane F. (Duane Francis), 1944-

(1)

Amalberti, René. author.

(1)

Amberti, Daniele, contributor.

(1)

Amendola, Aniello. editor.

(1)

(1)

Anders, George. editor.

(1)

Andersson, Cristina. author.

(1)

Antaki, G. A. (George A.)

(1)

Apduhan, Bernady O. editor.

(1)

Arezes, Pedro M. editor.

(1)

Arezes, Pedro Miguel Ferreira Martins. editor.

(1)

Asahi, Yumi. editor.

(1)

Asai, Shojiro. editor.

(1)

Ashar, Navin G. author.

(1)

Atik, Enver, author

(1)

Attard, Mario M., editor.

(1)

Augustin, Thomas, editor.

(1)

Australasian Conference on the Mechanics of Structures and Materials (22nd : 2012 : Sydney, Australia)

(1)

Awasthi, Amit K. editor.

(1)

Ayar, Tahir. author.

(1)

(1)

(1)

Aziz, Ahmed. editor. (orcid)

(1)

Babadağ, Kadir Korhan.

(1)

Badescu, Viorel. editor.

(1)

Baiulescu, George.

(1)

Balakrishnan, N. author.

(1)

Balakrishnan, N., 1956- editor.

(1)

Balasinki, Artur.

(1)

Balasinski, Artur. author.

(1)

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(148)

(136)

Reliability (Engineering)

(82)

(75)

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(64)

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(62)

Quality Control, Reliability, Safety and Risk.

(51)

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(44)

Electronic books.

(44)

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(34)

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(33)

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(32)

(25)

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(22)

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(22)

(22)

(21)

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(20)

Mechanical engineering.

(14)

Artificial intelligence.

(13)

Computer Communication Networks.

(13)

Computer software -- Reliability.

(13)

Industrial engineering.

(13)

Performance and Reliability.

(13)

Computer security.

(12)

Computer simulation.

(12)

Data protection.

(12)

Engineering mathematics.

(12)

(12)

(12)

Optical materials.

(11)

Reliability (Engineering) -- Statistical methods.

(11)

(10)

Business logistics.

(10)

Computer systems -- Reliability.

(10)

(10)

Mathematical statistics.

(10)

Reliability (Engineering) -- Mathematical models.

(10)

Business planning.

(9)

Computer system performance.

(9)

(9)

(9)

Operations research.

(9)

Telecommunication.

(9)

Aerospace engineering.

(8)

(8)

Civil engineering.

(8)

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(8)

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(8)

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(8)

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(8)

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(8)

Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences.

(8)

(8)

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(7)

(7)

Electronic circuits.

(7)

Engineering economics.

(7)

GÜVENİLİRLİK (MÜHENDİSLİK).

(7)

Information Systems.

(7)

(7)

Production of electric energy or power.

(7)

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(7)

Chemical engineering.

(6)

Computer networks -- Reliability.

(6)

Dynamical systems.

(6)

Economics/Management Science.

(6)

Electric power systems--Reliability.

(6)

Environmental management.

(6)

Fault-tolerant computing.

(6)

Industrial management.

(6)

Maintainability (Engineering)

(6)

Reliability (Engineering) -- Congresses.

(6)

Risk assessment.

(6)

Structural control (Engineering).

(6)

Surfaces (Physics).

(6)

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(5)

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(5)

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(5)

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(5)

Electric power systems -- Reliability.

(5)

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(5)

Engineering Economics, Organization, Logistics, Marketing.

(5)

Industrial Chemistry/Chemical Engineering.

(5)

Information systems.

(5)

Innovation/Technology Management.

(5)

Mathematical models.

(5)

Nanotechnology.

(5)

Ocean engineering.

(5)

(5)

(5)

Production management.

(5)

Production/Logistics/Supply Chain Management.

(5)

(5)

Telecommunication systems.

(5)

Transportation engineering.

(5)

Accelerated life testing.

(4)

Algorithm Analysis and Problem Complexity.

(4)

(4)

Buildings—Design and construction.

(4)

Building—Superintendence.

(4)

Characterization and Evaluation of Materials.

(4)

Circuits and Systems.

(4)

(4)

Computer software -- Development.

(4)

Construction industry—Management.

(4)

Construction superintendence.

(4)

(4)

(4)

Data encryption (Computer science).

(4)

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(4)

Economic policy.

(4)

Electric power distribution.

(4)

Electric power systems.

(4)

Electronic digital computers -- Reliability.

(4)

Fault tolerance (Engineering)

(4)

(4)

Hydraulic engineering.

(4)

Industrial and Production Engineering.

(4)

Industrial organization.

(4)

Materials science.

(4)

Microelectronics.

(4)

Probability Theory and Stochastic Processes.

(4)

Project management.

(4)

Regional planning.

(4)

Renewable energy sources.

(4)

Technology -- Risk assessment.

(4)

User interfaces (Computer systems).

(4)

Application software.

(3)

Arithmetic and Logic Structures.

(3)

Biomedical engineering.

(3)

Building construction.

(3)

Construction Management.

(3)

Control engineering.

(3)

(3)

Earth Sciences.

(3)

Electric power systems--Protection.

(3)

Electronics -- Materials.

(3)

Engineering geology.

(3)

Environmental economics.

(3)

Failure time data analysis.

(3)

(3)

Geoengineering, Foundations, Hydraulics.

(3)

(3)

Güvenilirlik (Mühendislik)

(3)

Human engineering.

(3)

Industrial design.

(3)

Industrial organization (Economic theory).

(3)

Information storage and retrieval systems.

(3)

International economics.

(3)

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(3)

(3)

Mathematical optimization.

(3)

Medical instruments and apparatus -- Standards.

(3)

Microelectronic packaging.

(3)

Natural Hazards.

(3)

Nuclear engineering.

(3)

Processor Architectures.

(3)

Product life cycle.

(3)

Project Management.

(3)

Quality control -- Statistical methods.

(3)

Risk assessment -- Congresses.

(3)

Risk management.

(3)

Safety factor in engineering.

(3)

Semiconductors.

(3)

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(3)

Social sciences -- Statistical methods.

(3)

Social sciences.

(3)

Statistical Theory and Methods.

(3)

Statistics for Life Sciences, Medicine, Health Sciences.

(3)

(3)

Structural Mechanics.

(3)

System Performance and Evaluation.

(3)

System failures (Engineering) -- Prevention.

(3)

Systems and Data Security.

(3)

Systems engineering -- Management.

(3)

Technology -- Philosophy.

(3)

Traffic engineering.

(3)

(2)

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(2)

(2)

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

Chemistry, Technical.

(2)

Climate Change.

(2)

Climatic changes.

(2)

Cloud computing.

(2)

Communications software.

(2)

Compressors -- Maintenance and repair.

(2)

Computational Intelligence.

(2)

Computational Science and Engineering.

(2)

Computer System Implementation.

(2)

Computer communication systems.

(2)

Computer engineering.

(2)

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133.

Quality and Reliability of Large-Eddy Simulations için kapak resmi

Quality and Reliability of Large-Eddy Simulations

Quality and Reliability of Large-Eddy Simulations

Yazar

Meyers, Johan. editor. Geurts, Bernard J. editor. Sagaut, Pierre. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1007/978-1-4020-8578-9

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134.

Rules of thumb for maintenance and reliability engineers için kapak resmi

Rules of thumb for maintenance and reliability engineers

Rules of thumb for maintenance and reliability engineers

Yazar

Smith, Ricky. Mobley, R. Keith, 1943-

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750678629

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135.

Emerging Nanotechnologies Test, Defect Tolerance, and Reliability için kapak resmi

Emerging Nanotechnologies Test, Defect Tolerance, and Reliability

Emerging Nanotechnologies Test, Defect Tolerance, and Reliability

Yazar

Tehranipoor, Mohammad. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1007/978-0-387-74747-7

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136.

Solder Joint Technology Materials, Properties, and Reliability için kapak resmi

Solder Joint Technology Materials, Properties, and Reliability

Solder Joint Technology Materials, Properties, and Reliability

Yazar

Tu, King-Ning. author. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1007/978-0-387-38892-2

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137.

Reliability and risk models setting reliability requirements için kapak resmi

Reliability and risk models setting reliability requirements

Reliability and risk models setting reliability requirements

Yazar

Todinov, M. T. John Wiley & Sons.

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/0470094907

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138.

Reliability and risk models : setting reliability requirements için kapak resmi

Reliability and risk models : setting reliability requirements

Reliability and risk models : setting reliability requirements

Yazar

Todinov, M. T.

Yer Numarası

TA169 .T65 2005

Format:

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139.

Managing risk and reliability of process plants için kapak resmi

Managing risk and reliability of process plants

Managing risk and reliability of process plants

Yazar

Tweeddale, Mark.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750677349

Format:

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140.

Practical reliability of electronic equipment and products için kapak resmi

Practical reliability of electronic equipment and products

Practical reliability of electronic equipment and products

Yazar

Hnatek, Eugene R.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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141.

High reliability magnetic devices design and fabrication için kapak resmi

High reliability magnetic devices design and fabrication

High reliability magnetic devices design and fabrication

Yazar

McLyman, Colonel William T., 1932-

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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142.

Cognitive reliability and error analysis method CREAM için kapak resmi

Cognitive reliability and error analysis method CREAM

Cognitive reliability and error analysis method CREAM

Yazar

Hollnagel, Erik, 1941-

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780080428482

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143.

System reliability theory models and statistical methods için kapak resmi

System reliability theory models and statistical methods

System reliability theory models and statistical methods

Yazar

Høyland, Arnljot, 1924- Rausand, Marvin.

Yer Numarası

ONLINE

Elektronik Erişim

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047
John Wiley http://dx.doi.org/10.1002/9780470316900
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/30072858.html

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144.

Electronics reliability and measurement technology nondestructive evaluation için kapak resmi

Electronics reliability and measurement technology nondestructive evaluation

Electronics reliability and measurement technology nondestructive evaluation

Yazar

Heyman, Joseph S.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780815511717

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