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1. 
Transforming cybersecurity with machine learning için kapak resmi
Transforming cybersecurity with machine learning
Yazar 
Thakur, Kutub, author. Pathan, Al-Sakib Khan, author.
Yer Numarası 
QA76.9 .A25
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003688327
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Innovations in computing için kapak resmi
Innovations in computing
Yazar 
Kamboj, Sushil, editor. Tiwana, Pardeep Singh, editor.
Yer Numarası 
T173.8
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003652755
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
Emerging trends and future directions in artificial intelligence, machine learning, and internet of things innovations için kapak resmi
Emerging trends and future directions in artificial intelligence, machine learning, and internet of things innovations
Yazar 
Singh, Khumukcham Robindro, editor. Hoque, Nazrul, editor. Maji, Arnab Kumar, editor. Mondal, Sabyasachi, editor. Banerjee, Jyoti Sekhar, editor.
Yer Numarası 
Q335
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003675235
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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4. 
OPTIMIZATION METHODS FOR FINITE ELEMENT ANALYSIS AND DESIGN için kapak resmi
OPTIMIZATION METHODS FOR FINITE ELEMENT ANALYSIS AND DESIGN
Yer Numarası 
TA347 .F5
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003564911
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
MACHINE LEARNING IN FORENSIC EVIDENCE EXAMINATION a new era. için kapak resmi
MACHINE LEARNING IN FORENSIC EVIDENCE EXAMINATION a new era.
Yer Numarası 
HV8073
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003449164
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
MACHINA SAPIENS how intelligent machines passed turing's test (and what happened the next day). için kapak resmi
MACHINA SAPIENS how intelligent machines passed turing's test (and what happened the next day).
Yazar 
Cristianini, Nello.
Yer Numarası 
Q325.5
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003582212
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Smart agriculture for sustainable practices : the role of AI, IoT, and machine learning için kapak resmi
Smart agriculture for sustainable practices : the role of AI, IoT, and machine learning
Yazar 
Kumar, S. N., 1985- editor. Zafar, Sherin, editor. S., Arun, editor. Naaz, Sameena, 1977- editor. Beg, M. M. Sufyan, editor.
Yer Numarası 
S494.5 .D3
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003594093
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
STRUCTURAL DESIGN AND OPTIMIZATION OF LIFTING SELF-FORMING GFRP ELASTIC GRIDSHELLS BASED ON... MACHINE LEARNING için kapak resmi
STRUCTURAL DESIGN AND OPTIMIZATION OF LIFTING SELF-FORMING GFRP ELASTIC GRIDSHELLS BASED ON... MACHINE LEARNING
Yazar 
KOOKALANI, SOHEILA.
Yer Numarası 
TA455 .P55
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003565055
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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9. 
AI AND MACHINE LEARNING FOR MECHANICAL AND ELECTRICAL ENGINEERING için kapak resmi
AI AND MACHINE LEARNING FOR MECHANICAL AND ELECTRICAL ENGINEERING
Yer Numarası 
TK145
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003479062
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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10. 
DATA-DRIVEN FAULT DIAGNOSIS a machine learning approach for industrial components. için kapak resmi
DATA-DRIVEN FAULT DIAGNOSIS a machine learning approach for industrial components.
Yazar 
VASHISHTHA, GOVIND.
Yer Numarası 
Q325.5
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003614821
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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11. 
Optimizing edge and fog computing applications with AI and metaheuristic algorithms için kapak resmi
Optimizing edge and fog computing applications with AI and metaheuristic algorithms
Yazar 
H. S., Madhusudhan, editor. Gupta, Punit, editor. Saini, Dinesh Kumar, 1974- editor.
Yer Numarası 
QA76.583
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003610168
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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12. 
Artificial intelligence and machine learning algorithms for engineering applications için kapak resmi
Artificial intelligence and machine learning algorithms for engineering applications
Yazar 
Arora, Krishan, editor. Sharma, Himanshu, editor. Mahesh, Aeidapu editor
Yer Numarası 
TA347 .A78
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003563440
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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