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Yayın Yılı: 2013

Yazar

SpringerLink (Online service)

(78)

Kurtoglu, Selahattin. author.

(2)

Li, Jinwen. editor.

(2)

Xiao, Liquan. editor.

(2)

Xu, Weixia. editor.

(2)

Zhang, Chengyi. editor.

(2)

van Aartsengel, Aristide. author.

(2)

Alampalli, Sreenivas.

(1)

Aldrin, John C. author.

(1)

Amalberti, René. author.

(1)

Amendola, Aniello. editor.

(1)

(1)

Ashar, Navin G. author.

(1)

Attard, Mario M., editor.

(1)

Australasian Conference on the Mechanics of Structures and Materials (22nd : 2012 : Sydney, Australia)

(1)

Aven, Terje. author.

(1)

Awasthi, Amit K. editor.

(1)

Balakrishnan, N. author.

(1)

Benaroya, Haym, 1954- author.

(1)

Bhattacharya, Gautam. editor.

(1)

Billinton, Roy. editor.

(1)

Bitner-Gregersen, Elzbieta Maria. author.

(1)

Bitsch, Friedemann. editor.

(1)

Bosselmann, Philipp. author.

(1)

Bostan, Ion. author.

(1)

Bostan, Viorel. author.

(1)

Brayner, Roberta. editor.

(1)

Brinkmann, Steffen. editor.

(1)

Bässler, Hans-Jürgen. author.

(1)

Calixto, Eduardo.

(1)

Caron, Franco. author.

(1)

Cha, Ji Hwan. author.

(1)

Chakrabarti, Amaresh. editor.

(1)

Chakraborty, Subrata. editor.

(1)

Chan, Hing Kai. author.

(1)

(1)

Chemuturi, Murali. author.

(1)

Cheptsov, Alexey. editor.

(1)

Chorafas, Dimitris N. author.

(1)

Chudnovsky, Bella H.

(1)

Cogan, Scott. editor.

(1)

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)

(1)

Coradin, Thibaud. editor.

(1)

Cotroneo, Domenico. editor.

(1)

Cressler, John D.

(1)

Cuzzocrea, Alfredo. editor.

(1)

Czichos, Horst. editor.

(1)

Dadashi, Nastaran.

(1)

Deodatis, G. (George), editor.

(1)

(1)

Dietrich, Wilhelm. author.

(1)

Ding, Steven X. author.

(1)

Dohi, Tadashi. editor.

(1)

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(1)

Dubrova, Elena. author.

(1)

Dulgheru, Valeriu. author.

(1)

Dutta, Rudra. author.

(1)

Eide, Lars Ingolf. author.

(1)

El Fallah Seghrouchni, Amal. author.

(1)

El-Reedy, Mohamed Abdallah.

(1)

Ellingwood, Bruce R., editor.

(1)

Epperlein, Peter W.

(1)

Ermolieva, Tatiana. editor.

(1)

Ettouney, Mohammed.

(1)

Fan, X.J. editor.

(1)

Ferreira, Kurt. author.

(1)

Finkelstein, Maxim. author.

(1)

Fiévet, Fernand. editor.

(1)

Frangopol, Dan M., editor.

(1)

Fries, Richard C.

(1)

Fujita, Kohei. author.

(1)

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(1)

Garvey, Paul R., 1956-

(1)

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(1)

(1)

Gfrerrer, Anton. author.

(1)

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(1)

Gielen, Georges. author.

(1)

Glismann, Peter J.

(1)

Golwalkar, Kiran R. author.

(1)

Goodarzi, Ehsan. author.

(1)

Goyal, Neeraj Kumar. author.

(1)

Gracia, José. editor.

(1)

Grigsby, Leonard L.

(1)

Grous, Ammar, author.

(1)

(1)

Guerritore, Walter B.

(1)

Guiochet, Jérémie. editor.

(1)

Guo, Xiaqng-Gui.

(1)

Gurtuna, Ozgur. author.

(1)

Han, Seon Mi, author.

(1)

Hayes, John P. author.

(1)

He, Feifei. author.

(1)

Heyden, Anders. editor.

(1)

Hillerbrand, Rafaela. editor.

(1)

Hugo, Clemens. author.

(1)

Hørte, Torfinn. author.

(1)

IEEE Xplore (Online Service), distributor.

(1)

International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor.

(1)

Jaeger, Carlo. editor.

(1)

Javaherdashti, Reza.

(1)

Jelali, Mohieddine. author.

(1)

Jensen, Uwe. author.

(1)

Jha, Kumar Neeraj. author.

(1)

Kahl, Fredrik. editor.

(1)

Kaminskiy, Mark, 1946-

(1)

Karadeniz, Halil. author.

(1)

Karki, Rajesh. editor.

(1)

Kaul, Anupama B.

(1)

Kaâniche, Mohamed. editor.

(1)

Kelly, Suzanne M. author.

(1)

Khonsari, Michael M.

(1)

Kittl, Christian. editor.

(1)

Knopp, Jeremy S. author.

(1)

Kovacic, Samuel F. editor.

(1)

Krishnaswamy, Smita. author.

(1)

Krüger, Jörg. editor.

(1)

Kunkel, Julian Martin. editor.

(1)

Lang, Johann. author.

(1)

Laros III, James H. author.

(1)

Lehmann, Frank. author.

(1)

Leira, Bernt J. author.

(1)

Li, Guoqiang. author.

(1)

Li, Haijun. editor.

(1)

Li, Rita Yi Man. author.

(1)

Li, Shengcai. author.

(1)

Li, Xiaohu. editor.

(1)

Lin, Shi-Woei. editor.

(1)

Lin, Yi-Kuei. editor.

(1)

Linnerooth-Bayer, Joanne. editor.

(1)

Liu, Shuhong. author.

(1)

Lu, Pingjing. editor.

(1)

Ludwig, Thomas. editor.

(1)

Lunau, Stephan. editor.

(1)

(1)

(1)

Malyshkin, Victor. editor.

(1)

Mandenius, Carl-Fredrik. editor.

(1)

Mantooth, H. Alan, 1963-

(1)

Maricau, Elie. author.

(1)

Mario, Hirz. author.

(1)

Markov, Igor L. author.

(1)

McPherson, J. W. author.

(1)

Mechler, Reinhard. editor.

(1)

Meier, Horst. editor.

(1)

Meran, Renata. author.

(1)

Meuer, Hans Werner. editor.

(1)

(1)

Moaveni, Babak. editor.

(1)

Mollenhauer, Jens-Peter. author.

(1)

Mortimore, Sara. author.

(1)

Moustafa, Abbas. author.

(1)

Murphy, R. Kim. author.

(1)

Nagel, Wolfgang E. editor.

(1)

Nagurka, Mark L., author.

(1)

Nair, N. Unnikrishnan. author.

(1)

Nakagawa, Toshio. editor.

(1)

Nickolay, Bertram. editor.

(1)

Nikolaidis, Yiannis. editor.

(1)

Nwaoha, Chikezie, 1984-

(1)

Olsson, Carl. editor.

(1)

Oskarsson, Magnus. editor.

(1)

Osterhage, Wolfgang W. author.

(1)

Pandey, Ajeet Kumar. author.

(1)

Papadimitriou, Costas. editor.

(1)

Parente, Eugenio. editor.

(1)

Pathak, Parth H. author.

(1)

Pavlova, Yulia. author.

(1)

Pearson, Siani. editor.

(1)

Pearton, Stephen J. editor.

(1)

Pedretti, Kevin. author.

(1)

Peterson, Martin. editor.

(1)

Pinto, Cesar Ariel.

(1)

Poon, Sun Wah. author.

(1)

Potiron, Katia. author.

(1)

Qian, Zhongdong. author.

(1)

Rabinovich, Semyon G. author.

(1)

Ranganathan, Subramanyam.

(1)

Reniers, Genserik. author.

(1)

Resch, Michael M. editor.

(1)

Roe, Michael. author.

(1)

Roenpage, Olin. author.

(1)

Roeser, Sabine. editor.

(1)

Sabbagh, Elias H. author.

(1)

Sabbagh, Harold A. author.

(1)

Samali, Bijan, editor.

(1)

Sandin, Per. editor.

(1)

Sankaran, P.G. author.

(1)

Schon, Klaus. author.

(1)

Schrieber, Randall R.

(1)

(1)

Sene, Kevin. author.

(1)

Shi, Peijun. editor.

(1)

(1)

Shu, Wei. author.

(1)

Simmermacher, Todd. editor.

(1)

Simos, Dimitris E. editor.

(1)

Singh, Karan. editor.

(1)

Skjong, Rolf. author.

(1)

Sobor, Ion. author.

(1)

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Quality Control, Reliability, Safety and Risk.

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(40)

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(20)

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(13)

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(13)

(10)

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(8)

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(7)

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(6)

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(6)

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(6)

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(6)

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(4)

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(4)

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(3)

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(3)

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(3)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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13.

Fracture mechanics. 1, Analysis of reliability and quality control için kapak resmi

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Yer Numarası

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Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118580004

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14.

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Elektronik Erişim

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International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor. Deodatis, G. (George), editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.

Yer Numarası

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Elektronik Erişim

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16.

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Yer Numarası

ONLINE

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17.

Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings için kapak resmi

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Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)

Yer Numarası

ONLINE(335005.1)

Elektronik Erişim

http://dx.doi.org/10.1007/978-3-642-40793-2

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18.

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Reliability and Risk Evaluation of Wind Integrated Power Systems

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Billinton, Roy. editor. Karki, Rajesh. editor. Verma, Ajit Kumar. editor. SpringerLink (Online service)

Yer Numarası

ONLINE(335484.1)

Elektronik Erişim

http://dx.doi.org/10.1007/978-81-322-0987-4

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19.

Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples için kapak resmi

Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples

Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples

Yazar

Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.

Yer Numarası

ONLINE(365001.1)

Elektronik Erişim

Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863

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20.

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices için kapak resmi

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Yazar

Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)

Yer Numarası

ONLINE(331478.1)

Elektronik Erişim

http://dx.doi.org/10.1007/978-1-4614-4337-7

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21.

Gas and oil reliability engineering modeling and analysis için kapak resmi

Gas and oil reliability engineering modeling and analysis

Gas and oil reliability engineering modeling and analysis

Yazar

Calixto, Eduardo.

Yer Numarası

ONLINE

Elektronik Erişim

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22.

Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices. için kapak resmi

Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.

Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.

Yazar

Epperlein, Peter W.

Yer Numarası

ONLINE

Elektronik Erişim

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506
John Wiley http://dx.doi.org/10.1002/9781118481882

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23.

Reliability Physics and Engineering Time-To-Failure Modeling için kapak resmi

Reliability Physics and Engineering Time-To-Failure Modeling

Reliability Physics and Engineering Time-To-Failure Modeling

Yazar

McPherson, J. W. author. SpringerLink (Online service)

Yer Numarası

ONLINE(332682.1)

Elektronik Erişim

http://dx.doi.org/10.1007/978-3-319-00122-7

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Durum

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24.

Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications için kapak resmi

Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications

Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications

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Wu, Bin, author.

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ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780124077119

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