Search Results for Integrated circuits -- Testing.

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Yazar

SpringerLink (Online service)

(6)

Chaturvedi, Nitin. editor.

(2)

Dwivedi, Devesh. editor.

(2)

Gupta, Anu. editor.

(2)

Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438

(2)

Wang, Laung-Terng.

(2)

Abramovici, Miron.

(1)

(1)

Agrawal, Vishwani D., 1943-

(1)

Bakir, Muhannad S., editor.

(1)

Breuer, Melvin A.

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

(1)

Chakrabarty, Krishnendu, editor of compilation.

(1)

Chakrabarty, Krishnendu. author.

(1)

Chen, Wai-Kai, 1936-

(1)

Domingo, George, 1937- author.

(1)

Dorf, Richard C., author

(1)

Dorf, Richard C., editor.

(1)

Franzon, Paul D., editor.

(1)

Friedman, Arthur D.

(1)

Frobenius, Rex.

(1)

Goel, Sandeep K, editor of compilation.

(1)

Heyman, Joseph S.

(1)

Huang, Wei, editor.

(1)

Hurst, Stanley L.

(1)

IEEE Circuits and Systems Society.

(1)

Iniewski, Krzysztof Kris. author.

(1)

J.M. Veendrick, Harry. author.

(1)

(1)

Lidow, Alex, author.

(1)

Machado, Gerson A. S., ed.

(1)

Marinissen, Eric Jan, editor.

(1)

Meng, Hong, editor.

(1)

Oklobdzija, Vojin G.

(1)

Oklobdzija, Vojin G., author.

(1)

Perelroyzen, Evgeni.

(1)

Pineda de Gyvez, José.

(1)

Pradhan, Dhiraj K.

(1)

Puers, R., editor.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Scott, Allan W.

(1)

Sharma, Rohit, editor.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Veendrick, Harry. author.

(1)

Voldman, Steven H.

(1)

Wang, Albert Z. H., 1962- author.

(1)

Wang, Francis C.

(1)

Wang, Ran. author.

(1)

(1)

Whitaker, Jerry C.

(1)

Wiley InterScience (Online service)

(1)

(1)

Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

(1)

Zurawski, Richard.

(1)

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Tümünü genişlet

Konu

Electronic Circuits and Systems.

(6)

Electronic books.

(6)

Electronic circuits.

(6)

(5)

Computer engineering.

(4)

Digital integrated circuits -- Testing.

(4)

Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

Integrated circuits -- Testing.

(3)

Integrated circuits -- Very large scale integration -- Testing.

(3)

Computer Engineering and Networks.

(2)

Computer networks .

(2)

Digital integrated circuits -- Design and construction.

(2)

Electronics and Microelectronics, Instrumentation.

(2)

Electrostatics.

(2)

Integrated circuits -- Protection.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

(2)

TECHNOLOGY & ENGINEERING -- Mechanical.

(2)

TECHNOLOGY & ENGINEERING.

(2)

(2)

Three-dimensional integrated circuits.

(2)

(1)

Cell phones -- Equipment and supplies -- Design and construction.

(1)

Circuits intégrés -- Conception et construction.

(1)

Circuits intégrés -- Protection.

(1)

(1)

Computer architecture.

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Dijital entegre devreler -- Test.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges -- Prevention.

(1)

Electric discharges.

(1)

Electrical engineering.

(1)

Electronic apparatus and appliances

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic apparatus and appliances.

(1)

Electronic circuits--Testing.

(1)

Electronic digital computers.

(1)

Electronic packaging.

(1)

(1)

(1)

Embedded Systems.

(1)

Embedded computer systems -- Handbooks, manuals, etc.

(1)

Embedded computer systems.

(1)

Expert systems (Computer science).

(1)

Field-effect transistors.

(1)

Gallium nitride.

(1)

Guides et manuels.

(1)

(1)

Handbooks and manuals

(1)

Handbooks and manuals.

(1)

Imagerie tridimensionnelle -- Guides, manuels, etc.

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Computer-aided design.

(1)

Integrated circuits -- Design and construction

(1)

Integrated circuits -- Design and construction.

(1)

Integrated circuits -- Protection

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits -- Very large scale integration.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Internet Resources.

(1)

Logic circuits--Computer-aided design.

(1)

Low voltage integrated circuits.

(1)

Materials for Devices.

(1)

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Computer-aided design.

(1)

Metal oxide semiconductors, Complementary -- Testing.

(1)

Microelectronic packaging.

(1)

Microelectronics.

(1)

Microprocessors.

(1)

Microwaves, RF Engineering and Optical Communications.

(1)

Mise sous boîtier (Électronique)

(1)

Multichip modules (Microelectronics)

(1)

Nanoelectronics

(1)

Nanoelectronics.

(1)

Nanotechnologie.

(1)

(1)

Nanotechnology.

(1)

Nanoélectronique.

(1)

Nitrure de gallium.

(1)

Nondestructive testing -- Congresses.

(1)

Power electronics.

(1)

Power transistors.

(1)

Processor Architectures.

(1)

Production engineering.

(1)

Radio frequency integrated circuits -- Testing.

(1)

Radio frequency integrated circuits.

(1)

Semi-conducteurs.

(1)

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Semiconductors.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Solid state electronics

(1)

Solid state electronics.

(1)

Static eliminators

(1)

Static eliminators.

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

Telecommunication.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional imaging

(1)

Three-dimensional imaging -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

Transistors de puissance.

(1)

Transistors à effet de champ.

(1)

(1)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(1)

antistatic agent.

(1)

electronic engineering.

(1)

(1)

(1)

Électronique de l'état solide.

(1)

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

Tümünü genişlet

Materyal Türü

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Beytepe Genel Koleksiyon

CRC Ekitapları

Elektronik Kütüphane

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13.

Nanometer CMOS ICs From Basics to ASICs için kapak resmi

Nanometer CMOS ICs From Basics to ASICs

Nanometer CMOS ICs From Basics to ASICs

Yazar

J.M. Veendrick, Harry. author. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-319-47597-4

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14.

Nanoelectronics : materials, devices, applications için kapak resmi

Nanoelectronics : materials, devices, applications

Nanoelectronics : materials, devices, applications

Yazar

Puers, R., editor.

Yer Numarası

TK7874.84

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728

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15.

Design of 3D integrated circuits and systems için kapak resmi

Design of 3D integrated circuits and systems

Design of 3D integrated circuits and systems

Yazar

Sharma, Rohit, editor.

Yer Numarası

TK7874.893 .D48 2014

Elektronik Erişim

Click here to view.

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16.

3D IC stacking technology için kapak resmi

3D IC stacking technology

3D IC stacking technology

Yazar

Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

Yer Numarası

ONLINE

Elektronik Erişim

Subscription required

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17.

ESD failure mechanisms and models için kapak resmi

ESD failure mechanisms and models

ESD failure mechanisms and models

Yazar

Voldman, Steven H. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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18.

Digital design and fabrication için kapak resmi

Digital design and fabrication

Digital design and fabrication

Yazar

Oklobdzija, Vojin G.

Yer Numarası

TK7885 .D54 2008

Elektronik Erişim

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19.

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach için kapak resmi

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Yazar

Yichuang Sun, ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS019E

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20.

RF measurements for cellular phones and wireless data systems için kapak resmi

RF measurements for cellular phones and wireless data systems

RF measurements for cellular phones and wireless data systems

Yazar

Scott, Allan W. Frobenius, Rex.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014

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21.

System-on-chip test architectures nanometer design for testability için kapak resmi

System-on-chip test architectures nanometer design for testability

System-on-chip test architectures nanometer design for testability

Yazar

Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780123739735

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22.

Digital integrated circuits : design-for-test using Simulink and Stateflow için kapak resmi

Digital integrated circuits : design-for-test using Simulink and Stateflow

Digital integrated circuits : design-for-test using Simulink and Stateflow

Yazar

Perelroyzen, Evgeni.

Yer Numarası

TK7874 .P445 2007

Format:

Durum

Beytepe Kütüphanesi~1

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23.

The VLSI handbook için kapak resmi

The VLSI handbook

The VLSI handbook

Yazar

Chen, Wai-Kai, 1936-

Yer Numarası

TK7874.75 .V573 2007

Elektronik Erişim

Click here to view.

Format:

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24.

VLSI test principles and architectures design for testability için kapak resmi

VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

Yazar

Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780123705976

Format:

Durum

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