Search Results for Integrated circuits--Testing.

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Yazar

Wang, Laung-Terng.

(2)

Abramovici, Miron.

(1)

(1)

Agrawal, Vishwani D., 1943-

(1)

Breuer, Melvin A.

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

(1)

Chakrabarty, Krishnendu, editor of compilation.

(1)

Chen, Wai-Kai, 1936-

(1)

Dorf, Richard C., author

(1)

Dorf, Richard C., editor.

(1)

Friedman, Arthur D.

(1)

Frobenius, Rex.

(1)

Goel, Sandeep K, editor of compilation.

(1)

Heyman, Joseph S.

(1)

Hurst, Stanley L.

(1)

IEEE Circuits and Systems Society.

(1)

(1)

Machado, Gerson A. S., ed.

(1)

Oklobdzija, Vojin G.

(1)

Oklobdzija, Vojin G., author.

(1)

Perelroyzen, Evgeni.

(1)

Pineda de Gyvez, José.

(1)

Pradhan, Dhiraj K.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Scott, Allan W.

(1)

Sharma, Rohit, editor.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Voldman, Steven H.

(1)

Wang, Francis C.

(1)

(1)

Whitaker, Jerry C.

(1)

Wiley InterScience (Online service)

(1)

(1)

Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

(1)

Zurawski, Richard.

(1)

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Tümünü genişlet

Konu

Digital integrated circuits -- Testing.

(4)

Electronic books.

(4)

Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

Integrated circuits -- Testing.

(3)

Integrated circuits -- Very large scale integration -- Testing.

(3)

Computer engineering.

(2)

Digital integrated circuits -- Design and construction.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

(2)

Three-dimensional integrated circuits.

(2)

Cell phones -- Equipment and supplies -- Design and construction.

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Dijital entegre devreler -- Test.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges.

(1)

Electrical engineering.

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic circuits--Testing.

(1)

Electronic digital computers.

(1)

Electrostatics.

(1)

Embedded computer systems -- Handbooks, manuals, etc.

(1)

Expert systems (Computer science).

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Computer-aided design.

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits -- Very large scale integration.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Logic circuits--Computer-aided design.

(1)

(1)

Low voltage integrated circuits.

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Computer-aided design.

(1)

Metal oxide semiconductors, Complementary -- Testing.

(1)

Microelectronic packaging.

(1)

Microelectronics.

(1)

Multichip modules (Microelectronics)

(1)

Nondestructive testing -- Congresses.

(1)

Power electronics.

(1)

Production engineering.

(1)

Radio frequency integrated circuits -- Testing.

(1)

Radio frequency integrated circuits.

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

(1)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

Tümünü genişlet

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1.

Embedded systems handbook için kapak resmi

Embedded systems handbook

Embedded systems handbook

Yazar

Zurawski, Richard.

Yer Numarası

TK7895 .E42 E64 2006

Elektronik Erişim

Click here to view.

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2.

Microelectronics için kapak resmi

Microelectronics

Microelectronics

Yazar

Whitaker, Jerry C.

Yer Numarası

TK7874 .M4587 2006

Elektronik Erişim

Click here to view.

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3.

The Computer Engineering Handbook. için kapak resmi

The Computer Engineering Handbook.

The Computer Engineering Handbook.

Yazar

Oklobdzija, Vojin G., author. CRC Press LLC.

Yer Numarası

TK7885 .C645 2002

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9781420041545
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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4.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits için kapak resmi

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Yazar

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Yer Numarası

TK7874.75 B87 2000

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5.

Integrated circuit manufacturability the art of process and design integration için kapak resmi

Integrated circuit manufacturability the art of process and design integration

Integrated circuit manufacturability the art of process and design integration

Yazar

Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097

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6.

VLSI Testing Digital and mixed analogue/digital techniques için kapak resmi

VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

Yazar

Hurst, Stanley L.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS009E

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7.

Low-power HF Microelectronics A unified approach için kapak resmi

Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Yazar

Machado, Gerson A. S., ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS008E

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8.

Principles of semiconductor network testing için kapak resmi

Principles of semiconductor network testing

Principles of semiconductor network testing

Yazar

Afshar, Amir.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750694728

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9.

Algorithmic and Knowledge-based CAD for VLSI için kapak resmi

Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Yazar

Taylor, Gaynor, ed. Russell, Gordon, ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS004E

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10.

Digital circuit testing a guide to DFT and other techniques için kapak resmi

Digital circuit testing a guide to DFT and other techniques

Digital circuit testing a guide to DFT and other techniques

Yazar

Wang, Francis C.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780127345802

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11.

Digital systems testing and testable design için kapak resmi

Digital systems testing and testable design

Digital systems testing and testable design

Yazar

Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057

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12.

Electronics reliability and measurement technology nondestructive evaluation için kapak resmi

Electronics reliability and measurement technology nondestructive evaluation

Electronics reliability and measurement technology nondestructive evaluation

Yazar

Heyman, Joseph S.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780815511717

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