Search Results for Process control -- Statistical methods.

Skip to:Search Results

|

|

|

|

Kütüphane Hesabım

|

|

|

Remember to clear the cache and close the browser window.

Search Limit

Rooms Restriction Values

14

Search Field

Target Value

Limit Value

Restriction Value

Arama:

Gelişmiş Arama

Arama Sonuçlarını Sınırlandır

Yazar

Montgomery, Douglas C.

(3)

Wiley InterScience (Online service)

(3)

Joglekar, Anand M.

(2)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(1)

Amiri, Amirhossein, 1979-

(1)

Ayeni, Babatunde J.

(1)

Badiru, Adedeji Bodunde, 1952-

(1)

Box, George E. P.

(1)

(1)

(1)

Colosimo, Bianca M.

(1)

Del Castillo, Enrique.

(1)

Ge, Zhiqiang. author.

(1)

Ibidapo-Obe, Oye.

(1)

Kanfer, Isadore.

(1)

Kang, Chang W. (Chang Wok), 1957- author.

(1)

Kayihan, Ferhan, 1948-

(1)

Keller, Paul A. (Paul Andrew)

(1)

Koronacki, Jacek.

(1)

Krishnamoorthi, K. S.

(1)

Krishnamoorthi, V. Ram.

(1)

Kvam, Paul H., 1962- author.

(1)

Luceno, Alberto, ort. yaz.

(1)

Luceño, Alberto.

(1)

(1)

Moen, Ronald D.

(1)

Muir, Alastair K. S. (Alastair Kerr S.), 1957-

(1)

Nolan, Thomas W.

(1)

Noorossana, Rassoul, 1959-

(1)

Oakland, John S.

(1)

Palazo?lu, Ahmet.

(1)

Paniagua-Quiñones, María del Carmen.

(1)

Provost, Lloyd P.

(1)

Ryan, Thomas P., 1945-

(1)

Saghaei, Abbas, 1972-

(1)

Shargel, Leon, 1941-

(1)

Song, Zhihuan. author.

(1)

Spanos, Costas J.

(1)

SpringerLink (Online service)

(1)

Stapenhurst, Tim.

(1)

Stephens, Larry J.

(1)

Thompson, James R., 1938-

(1)

Tümünü genişlet

Dil

(24)

Yayın Yılı

-

(7)

(3)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Tümünü genişlet

Konu

Process control -- Statistical methods.

(20)

Quality control -- Statistical methods.

(10)

Electronic books.

(5)

Chemical process control -- Statistical methods.

(2)

Experimental design.

(2)

Feedback control systems.

(2)

Quality control.

(2)

Six sigma (Quality control standard)

(2)

Acceptance sampling.

(1)

Bayesian statistical decision theory.

(1)

Chemical industry -- Quality control -- Statistical methods.

(1)

(1)

Distribution (Probability theory) -- Outlines, syllabi, etc.

(1)

(1)

(1)

Engineering -- Statistical methods -- Outlines, syllabi, etc.

(1)

(1)

Geribildirim denetim sistemleri.

(1)

Integrated circuits -- Design and construction.

(1)

Kalite Kontrolü -- İstatistiksel Yöntemler.

(1)

Measuring instruments.

(1)

Probabilities -- Outlines, syllabi, etc.

(1)

Process control -- Mathematical models.

(1)

Process control -- Statistical methods -- Outlines, syllabi, etc.

(1)

Production management -- Quality control.

(1)

Quality control -- Planning.

(1)

Regression analysis.

(1)

Reliability (Engineering) -- Statistical methods.

(1)

Sampling (Statistics)

(1)

Semiconductors -- Design and construction.

(1)

Statistics -- Computer programs -- Outlines, syllabi, etc.

(1)

Statistics -- Outlines, syllabi, etc.

(1)

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Solid State.

(1)

(1)

(1)

Variational principles.

(1)

(1)

İlaçlar, Jenerik

(1)

İşlem Denetimi -- İstatistiksel Yöntemler.

(1)

İşlem yönetimi -- İstatistiksel yöntemler.

(1)

Tümünü genişlet

Materyal Türü

Shelf Location

Beytepe Genel Koleksiyon

Elektronik Kütüphane

Sağlık Bilimleri Genel Koleksiyon

Kütüphane

Beytepe Kütüphanesi

Sağlık Bilimleri Kütüphanesi

Çevrimiçi Kütüphane

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Liste görünümüne geç

Küçük resim görünümüne geç

25 sonuç bulundu

Arama sonuçlarına abone ol

1 2 3

000000000000DEFAULT_TR

Yazdır

Liste seç

Bunu varsayılan liste yap.

Öğeler başarıyla eklendi

Öğeler eklenirken hata oldu. Lütfen tekrar deneyiniz.

One or more items could not be added because you are not logged in.

13.

Statistical control by monitoring and adjustment için kapak resmi

Statistical control by monitoring and adjustment

Statistical control by monitoring and adjustment

Yazar

Box, George E. P. Luceño, Alberto. Paniagua-Quiñones, María del Carmen.

Yer Numarası

ONLINE

Elektronik Erişim

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Click here to view book
ebrary http://site.ebrary.com/id/10501391
http://swb.eblib.com/patron/FullRecord.aspx?p=848509

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

14.

Statistical quality control : a modern introduction için kapak resmi

Statistical quality control : a modern introduction

Statistical quality control : a modern introduction

Yazar

Montgomery, Douglas C.

Yer Numarası

TS156 M66 2009

Format:

Durum

Beytepe Kütüphanesi~1

Rafta:
Kopya:

15.

Statistical process control için kapak resmi

Statistical process control

Statistical process control

Yazar

Oakland, John S.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750669627

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

16.

Chemical process performance evaluation için kapak resmi

Chemical process performance evaluation

Chemical process performance evaluation

Yazar

Cinar, Ali. Palazo?lu, Ahmet. Kayihan, Ferhan, 1948-

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

17.

Bayesian process monitoring, control and optimization için kapak resmi

Bayesian process monitoring, control and optimization

Bayesian process monitoring, control and optimization

Yazar

Colosimo, Bianca M. Del Castillo, Enrique.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

18.

Fundamentals of semiconductor manufacturing and process control için kapak resmi

Fundamentals of semiconductor manufacturing and process control

Fundamentals of semiconductor manufacturing and process control

Yazar

May, Gary S. Spanos, Costas J.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

19.

Mastering statistical process control a handbook for performance improvement using cases için kapak resmi

Mastering statistical process control a handbook for performance improvement using cases

Mastering statistical process control a handbook for performance improvement using cases

Yazar

Stapenhurst, Tim.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750665292

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

20.

Generic drug product development : solid oral dosage forms için kapak resmi

Generic drug product development : solid oral dosage forms

Generic drug product development : solid oral dosage forms

Yazar

Shargel, Leon, 1941- Kanfer, Isadore.

Yer Numarası

QV 704 D8426 2005

Format:

Durum

Sağlık Bilimleri Kütüphanesi~1

Rafta:
Kopya:

21.

Introduction to statistical quality control için kapak resmi

Introduction to statistical quality control

Introduction to statistical quality control

Yazar

Montgomery, Douglas C.

Yer Numarası

TS156 .M64 2005

Format:

Durum

Beytepe Kütüphanesi~1

Rafta:
Kopya:

22.

Statistical methods for six sigma in R & D and manufacturing için kapak resmi

Statistical methods for six sigma in R & D and manufacturing

Statistical methods for six sigma in R & D and manufacturing

Yazar

Joglekar, Anand M.

Yer Numarası

ONLINE

Elektronik Erişim

Click for information
Full text available from Wiley InterScience
Authentication may be required
John Wiley http://dx.doi.org/10.1002/0471721212
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2003003583.html

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

23.

Statistical process control the Deming paradigm and beyond için kapak resmi

Statistical process control the Deming paradigm and beyond

Statistical process control the Deming paradigm and beyond

Yazar

Thompson, James R., 1938- Koronacki, Jacek.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

24.

Guidelines for improving plant reliability through data collection and analysis için kapak resmi

Guidelines for improving plant reliability through data collection and analysis

Guidelines for improving plant reliability through data collection and analysis

Yazar

American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470935262

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

1 2 3

Go to:Search Results

|

|

Copyright 2011 Sirsi Corporation - Enterprise Version 5.0.0.11