Search Results for Process control -- Statistical methods.

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Montgomery, Douglas C.

(3)

Wiley InterScience (Online service)

(3)

Joglekar, Anand M.

(2)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(1)

Amiri, Amirhossein, 1979-

(1)

Ayeni, Babatunde J.

(1)

Badiru, Adedeji Bodunde, 1952-

(1)

Box, George E. P.

(1)

(1)

(1)

Colosimo, Bianca M.

(1)

Del Castillo, Enrique.

(1)

Ge, Zhiqiang. author.

(1)

Ibidapo-Obe, Oye.

(1)

Kanfer, Isadore.

(1)

Kang, Chang W. (Chang Wok), 1957- author.

(1)

Kayihan, Ferhan, 1948-

(1)

Keller, Paul A. (Paul Andrew)

(1)

Koronacki, Jacek.

(1)

Krishnamoorthi, K. S.

(1)

Krishnamoorthi, V. Ram.

(1)

Kvam, Paul H., 1962- author.

(1)

Luceno, Alberto, ort. yaz.

(1)

Luceño, Alberto.

(1)

(1)

Moen, Ronald D.

(1)

Muir, Alastair K. S. (Alastair Kerr S.), 1957-

(1)

Nolan, Thomas W.

(1)

Noorossana, Rassoul, 1959-

(1)

Oakland, John S.

(1)

Palazo?lu, Ahmet.

(1)

Paniagua-Quiñones, María del Carmen.

(1)

Provost, Lloyd P.

(1)

Ryan, Thomas P., 1945-

(1)

Saghaei, Abbas, 1972-

(1)

Shargel, Leon, 1941-

(1)

Song, Zhihuan. author.

(1)

Spanos, Costas J.

(1)

SpringerLink (Online service)

(1)

Stapenhurst, Tim.

(1)

Stephens, Larry J.

(1)

Thompson, James R., 1938-

(1)

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Process control -- Statistical methods.

(20)

Quality control -- Statistical methods.

(10)

Electronic books.

(5)

Chemical process control -- Statistical methods.

(2)

Experimental design.

(2)

Feedback control systems.

(2)

Quality control.

(2)

Six sigma (Quality control standard)

(2)

Acceptance sampling.

(1)

Bayesian statistical decision theory.

(1)

Chemical industry -- Quality control -- Statistical methods.

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(1)

Distribution (Probability theory) -- Outlines, syllabi, etc.

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(1)

(1)

Engineering -- Statistical methods -- Outlines, syllabi, etc.

(1)

(1)

Geribildirim denetim sistemleri.

(1)

Integrated circuits -- Design and construction.

(1)

Kalite Kontrolü -- İstatistiksel Yöntemler.

(1)

Measuring instruments.

(1)

Probabilities -- Outlines, syllabi, etc.

(1)

Process control -- Mathematical models.

(1)

Process control -- Statistical methods -- Outlines, syllabi, etc.

(1)

Production management -- Quality control.

(1)

Quality control -- Planning.

(1)

Regression analysis.

(1)

Reliability (Engineering) -- Statistical methods.

(1)

Sampling (Statistics)

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Semiconductors -- Design and construction.

(1)

Statistics -- Computer programs -- Outlines, syllabi, etc.

(1)

Statistics -- Outlines, syllabi, etc.

(1)

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TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

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TECHNOLOGY & ENGINEERING -- Electronics -- Solid State.

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Variational principles.

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İlaçlar, Jenerik

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İşlem Denetimi -- İstatistiksel Yöntemler.

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İşlem yönetimi -- İstatistiksel yöntemler.

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13.

Statistical control by monitoring and adjustment için kapak resmi

Statistical control by monitoring and adjustment

Statistical control by monitoring and adjustment

Yazar

Box, George E. P. Luceño, Alberto. Paniagua-Quiñones, María del Carmen.

Yer Numarası

ONLINE

Elektronik Erişim

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Click here to view book
ebrary http://site.ebrary.com/id/10501391
http://swb.eblib.com/patron/FullRecord.aspx?p=848509

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14.

Statistical quality control : a modern introduction için kapak resmi

Statistical quality control : a modern introduction

Statistical quality control : a modern introduction

Yazar

Montgomery, Douglas C.

Yer Numarası

TS156 M66 2009

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15.

Statistical process control için kapak resmi

Statistical process control

Statistical process control

Yazar

Oakland, John S.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750669627

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16.

Bayesian process monitoring, control and optimization için kapak resmi

Bayesian process monitoring, control and optimization

Bayesian process monitoring, control and optimization

Yazar

Colosimo, Bianca M. Del Castillo, Enrique.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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17.

Chemical process performance evaluation için kapak resmi

Chemical process performance evaluation

Chemical process performance evaluation

Yazar

Cinar, Ali. Palazo?lu, Ahmet. Kayihan, Ferhan, 1948-

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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18.

Fundamentals of semiconductor manufacturing and process control için kapak resmi

Fundamentals of semiconductor manufacturing and process control

Fundamentals of semiconductor manufacturing and process control

Yazar

May, Gary S. Spanos, Costas J.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952

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19.

Generic drug product development : solid oral dosage forms için kapak resmi

Generic drug product development : solid oral dosage forms

Generic drug product development : solid oral dosage forms

Yazar

Shargel, Leon, 1941- Kanfer, Isadore.

Yer Numarası

QV 704 D8426 2005

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20.

Introduction to statistical quality control için kapak resmi

Introduction to statistical quality control

Introduction to statistical quality control

Yazar

Montgomery, Douglas C.

Yer Numarası

TS156 .M64 2005

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21.

Mastering statistical process control a handbook for performance improvement using cases için kapak resmi

Mastering statistical process control a handbook for performance improvement using cases

Mastering statistical process control a handbook for performance improvement using cases

Yazar

Stapenhurst, Tim.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750665292

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22.

Statistical methods for six sigma in R & D and manufacturing için kapak resmi

Statistical methods for six sigma in R & D and manufacturing

Statistical methods for six sigma in R & D and manufacturing

Yazar

Joglekar, Anand M.

Yer Numarası

ONLINE

Elektronik Erişim

Click for information
Full text available from Wiley InterScience
Authentication may be required
John Wiley http://dx.doi.org/10.1002/0471721212
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2003003583.html

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23.

Statistical process control the Deming paradigm and beyond için kapak resmi

Statistical process control the Deming paradigm and beyond

Statistical process control the Deming paradigm and beyond

Yazar

Thompson, James R., 1938- Koronacki, Jacek.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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24.

Guidelines for improving plant reliability through data collection and analysis için kapak resmi

Guidelines for improving plant reliability through data collection and analysis

Guidelines for improving plant reliability through data collection and analysis

Yazar

American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470935262

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