Arama Sonuçlarını Sınırlandır
Yazar
Wiley InterScience (Online service)
(8)
Aven, Terje.
(3)
Abbott, Martin, 1949-
(1)
Aitken, C. G. G., author.
(1)
American Institute of Chemical Engineers. Center for Chemical Process Safety.
(1)
Dil
Yayın Yılı
-
Konu
Process control -- Statistical methods.
(5)
Risk assessment -- Statistical methods.
(5)
Engineering -- Statistical methods.
(4)
Experimental design.
(3)
Medical statistics.
(3)
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13. 
Bayesian networks for probabilistic inference and decision analysis in forensic science için kapak resmi
Bayesian networks for probabilistic inference and decision analysis in forensic science
Yazar 
Taroni, Franco, author. Biedermann, Alex, author. Bozza, Silvia, author. Garbolino, Paolo, 1955- author. Aitken, C. G. G., author.
Yer Numarası 
ONLINE(342015.1)
Elektronik Erişim 
Available by subscription from Safari Books Online
John Wiley http://dx.doi.org/10.1002/9781118914762
Wiley Online Library http://onlinelibrary.wiley.com/book/10.1002/9781118914762
Volltext http://proquest.tech.safaribooksonline.de/9781118914748
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14. 
Big data, big innovation : enabling competitive differentiation through business analytics için kapak resmi
Big data, big innovation : enabling competitive differentiation through business analytics
Yazar 
Stubbs, Evan.
Yer Numarası 
ONLINE(342017.1)
Elektronik Erişim 
Cover image http://catalogimages.wiley.com/images/db/jimages/9781118724644.jpg
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1729078
ebrary http://site.ebrary.com/id/10891188
John Wiley http://dx.doi.org/10.1002/9781118914984
http://onlinelibrary.wiley.com/book/10.1002/9781118914984
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15. 
Uncertainty in risk assessment : the representation and treatment of uncertainties by probabilistic and non-probabilistic methods için kapak resmi
Uncertainty in risk assessment : the representation and treatment of uncertainties by probabilistic and non-probabilistic methods
Yazar 
Aven, Terje, author.
Yer Numarası 
ONLINE(341744.1)
Elektronik Erişim 
John Wiley http://dx.doi.org/10.1002/9781118763032
Books24x7 http://www.books24x7.com/marc.asp?bookid=63789
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16. 
Probabilistic design for optimization and robustness for engineers için kapak resmi
Probabilistic design for optimization and robustness for engineers
Yazar 
Dodson, Bryan, 1962- author. Hammett, Patrick C., author. Klerx, Rene, author.
Yer Numarası 
ONLINE(341796.1)
Elektronik Erişim 
Available by subscription from Safari Books Online
ebrary http://alltitles.ebrary.com/Doc?id=10896040
John Wiley http://dx.doi.org/10.1002/9781118796245
Volltext http://proquest.tech.safaribooksonline.de/9781118796306
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17. 
Problem solving and data analysis using Minitab : a clear and easy guide to six sigma methodology için kapak resmi
Problem solving and data analysis using Minitab : a clear and easy guide to six sigma methodology
Yazar 
Khan, Rehman M.
Yer Numarası 
ONLINE
Elektronik Erişim 
Wiley Online Library http://onlinelibrary.wiley.com/book/10.1002/9781118307502
John Wiley http://dx.doi.org/10.1002/9781118307502
Cover image http://catalogimages.wiley.com/images/db/jimages/9781118307571.jpg
ebrary http://site.ebrary.com/id/10657930
http://rbdigital.oneclickdigital.com
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18. 
Understanding and applying research design için kapak resmi
Understanding and applying research design
Yazar 
Abbott, Martin, 1949- McKinney, Jennifer, 1969-
Yer Numarası 
ONLINE
Elektronik Erişim 
Ebook Library Click here to view book
John Wiley http://dx.doi.org/10.1002/9781118647325
http://swb.eblib.com/patron/FullRecord.aspx?p=1120726
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19. 
Statistics for censored environmental data using Minitab and R için kapak resmi
Statistics for censored environmental data using Minitab and R
Yazar 
Helsel, Dennis R. Helsel, Dennis R. Nondetects and data analysis.
Yer Numarası 
ONLINE
Elektronik Erişim 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Click here to view book
ebrary http://site.ebrary.com/id/10577548
http://swb.eblib.com/patron/FullRecord.aspx?p=818500
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20. 
Statistical and machine learning approaches for network analysis için kapak resmi
Statistical and machine learning approaches for network analysis
Yazar 
Dehmer, Matthias, 1968- Basak, Subhash C., 1945-
Yer Numarası 
ONLINE
Elektronik Erişim 
Connect to MyiLibrary resource.
Available by subscription from Safari Books Online
Cover image http://catalogimages.wiley.com/images/db/jimages/9780470195154.jpg
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894394
John Wiley http://dx.doi.org/10.1002/9781118346990
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21. 
Risk assessment : tools, techniques, and their applications için kapak resmi
Risk assessment : tools, techniques, and their applications
Yazar 
Ostrom, Lee T., author. Wilhelmsen, Cheryl A., 1933- author.
Yer Numarası 
ONLINE
Elektronik Erişim 
Available by subscription from Safari Books Online
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=875917
John Wiley http://dx.doi.org/10.1002/9781118309629
Cover image http://catalogimages.wiley.com/images/db/jimages/9780470892039.jpg
Books24x7 http://www.books24x7.com/marc.asp?bookid=46805
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22. 
Structural equation modeling applications using Mplus için kapak resmi
Structural equation modeling applications using Mplus
Yazar 
Wang, Jichuan. Wang, Xiaoqian.
Yer Numarası 
ONLINE
Elektronik Erişim 
Ebook Library Click here to view book
Available by subscription from Safari Books Online
Cover image http://catalogimages.wiley.com/images/db/jimages/9781119978299.jpg
Wiley InterScience http://dx.doi.org/10.1002/9781118356258
ebrary http://site.ebrary.com/id/10587611
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23. 
Industrial statistics with Minitab için kapak resmi
Industrial statistics with Minitab
Yazar 
Grima Cintas, Pedro. Marco-Almagro, Lluis. Tort-Martorell Llabres, Javier.
Yer Numarası 
ONLINE
Elektronik Erişim 
Connect to MyiLibrary resource
Available by subscription from Safari Books Online
Wiley InterScience http://dx.doi.org/10.1002/9781118383773
http://lib.myilibrary.com?id=395759
ebrary http://site.ebrary.com/id/10587607
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24. 
Foundations of risk analysis için kapak resmi
Foundations of risk analysis
Yazar 
Aven, Terje.
Yer Numarası 
ONLINE
Elektronik Erişim 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=847490
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781119945482
Wiley InterScience http://dx.doi.org/10.1002/9781119945482
http://swb.eblib.com/patron/FullRecord.aspx?p=847490
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