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Wang, Laung-Terng.

(2)

(1)

Agrawal, Vishwani D., 1943-

(1)

Bakir, Muhannad S., editor.

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

(1)

Chakrabarty, Krishnendu, editor of compilation.

(1)

Chen, Wai-Kai, 1936-

(1)

Domingo, George, 1937- author.

(1)

Dorf, Richard C., author

(1)

Dorf, Richard C., editor.

(1)

Franzon, Paul D., editor.

(1)

Goel, Sandeep K, editor of compilation.

(1)

Heyman, Joseph S.

(1)

Huang, Wei, editor.

(1)

Hurst, Stanley L.

(1)

(1)

Lidow, Alex, author.

(1)

Machado, Gerson A. S., ed.

(1)

Marinissen, Eric Jan, editor.

(1)

Meng, Hong, editor.

(1)

Oklobdzija, Vojin G.

(1)

Oklobdzija, Vojin G., author.

(1)

Perelroyzen, Evgeni.

(1)

Puers, R., editor.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Sharma, Rohit, editor.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Voldman, Steven H.

(1)

Wang, Albert Z. H., 1962- author.

(1)

Wang, Francis C.

(1)

(1)

Whitaker, Jerry C.

(1)

Wiley InterScience (Online service)

(1)

(1)

Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

(1)

Zurawski, Richard.

(1)

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Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

Digital integrated circuits -- Testing.

(3)

Electronic books.

(3)

(3)

Integrated circuits -- Very large scale integration -- Testing.

(3)

Computer engineering.

(2)

Electrostatics.

(2)

Integrated circuits -- Protection.

(2)

Integrated circuits -- Testing.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

TECHNOLOGY & ENGINEERING -- Mechanical.

(2)

TECHNOLOGY & ENGINEERING.

(2)

(2)

Three-dimensional integrated circuits.

(2)

(1)

Circuits intégrés -- Conception et construction.

(1)

Circuits intégrés -- Protection.

(1)

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits -- Design and construction.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Dijital entegre devreler -- Test.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges -- Prevention.

(1)

Electric discharges.

(1)

Electrical engineering.

(1)

Electronic apparatus and appliances

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic apparatus and appliances.

(1)

Electronic circuits--Testing.

(1)

Electronic digital computers.

(1)

Electronic packaging.

(1)

(1)

(1)

Embedded computer systems -- Handbooks, manuals, etc.

(1)

Expert systems (Computer science).

(1)

Field-effect transistors.

(1)

Gallium nitride.

(1)

Guides et manuels.

(1)

(1)

Handbooks and manuals

(1)

Handbooks and manuals.

(1)

Imagerie tridimensionnelle -- Guides, manuels, etc.

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Design and construction

(1)

Integrated circuits -- Design and construction.

(1)

Integrated circuits -- Protection

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits -- Very large scale integration.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Internet Resources.

(1)

Logic circuits--Computer-aided design.

(1)

(1)

Low voltage integrated circuits.

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Testing.

(1)

Microelectronic packaging.

(1)

Microelectronics.

(1)

Mise sous boîtier (Électronique)

(1)

Multichip modules (Microelectronics)

(1)

Nanoelectronics

(1)

Nanoelectronics.

(1)

Nanotechnologie.

(1)

(1)

Nanotechnology.

(1)

Nanoélectronique.

(1)

Nitrure de gallium.

(1)

Nondestructive testing -- Congresses.

(1)

Power electronics.

(1)

Power transistors.

(1)

Production engineering.

(1)

Radio frequency integrated circuits.

(1)

Semi-conducteurs.

(1)

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Semiconductors.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Solid state electronics

(1)

Solid state electronics.

(1)

Static eliminators

(1)

Static eliminators.

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional imaging

(1)

Three-dimensional imaging -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

Transistors de puissance.

(1)

Transistors à effet de champ.

(1)

(1)

antistatic agent.

(1)

electronic engineering.

(1)

(1)

(1)

Électronique de l'état solide.

(1)

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

Tümünü genişlet

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CRC Ekitapları

Elektronik Kütüphane

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1.

System-on-chip test architectures nanometer design for testability için kapak resmi

System-on-chip test architectures nanometer design for testability

System-on-chip test architectures nanometer design for testability

Yazar

Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780123739735

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2.

Digital design and fabrication için kapak resmi

Digital design and fabrication

Digital design and fabrication

Yazar

Oklobdzija, Vojin G.

Yer Numarası

TK7885 .D54 2008

Elektronik Erişim

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3.

The VLSI handbook için kapak resmi

The VLSI handbook

The VLSI handbook

Yazar

Chen, Wai-Kai, 1936-

Yer Numarası

TK7874.75 .V573 2007

Elektronik Erişim

Click here to view.

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4.

Digital integrated circuits : design-for-test using Simulink and Stateflow için kapak resmi

Digital integrated circuits : design-for-test using Simulink and Stateflow

Digital integrated circuits : design-for-test using Simulink and Stateflow

Yazar

Perelroyzen, Evgeni.

Yer Numarası

TK7874 .P445 2007

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Durum

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5.

VLSI test principles and architectures design for testability için kapak resmi

VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

Yazar

Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780123705976

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6.

Embedded systems handbook için kapak resmi

Embedded systems handbook

Embedded systems handbook

Yazar

Zurawski, Richard.

Yer Numarası

TK7895 .E42 E64 2006

Elektronik Erişim

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7.

Microelectronics için kapak resmi

Microelectronics

Microelectronics

Yazar

Whitaker, Jerry C.

Yer Numarası

TK7874 .M4587 2006

Elektronik Erişim

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8.

The Computer Engineering Handbook. için kapak resmi

The Computer Engineering Handbook.

The Computer Engineering Handbook.

Yazar

Oklobdzija, Vojin G., author. CRC Press LLC.

Yer Numarası

TK7885 .C645 2002

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9781420041545
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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9.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits için kapak resmi

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Yazar

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Yer Numarası

TK7874.75 B87 2000

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10.

VLSI Testing Digital and mixed analogue/digital techniques için kapak resmi

VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

Yazar

Hurst, Stanley L.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS009E

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11.

Low-power HF Microelectronics A unified approach için kapak resmi

Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Yazar

Machado, Gerson A. S., ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS008E

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12.

Principles of semiconductor network testing için kapak resmi

Principles of semiconductor network testing

Principles of semiconductor network testing

Yazar

Afshar, Amir.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750694728

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