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SpringerLink (Online service)
(18)
Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121
(2)
Gallina, Barbara. editor. (orcid)0000-0002-6952-1053
(2)
Skavhaug, Amund. editor.
(2)
Alampalli, Sreenivas.
(1)
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13. 
Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latvia için kapak resmi
Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latvia
Yazar 
Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-74454-4
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14. 
Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedings için kapak resmi
Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedings
Yazar 
Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-99130-6
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15. 
Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings için kapak resmi
Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings
Yazar 
Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-78078-8
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16. 
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip için kapak resmi
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Yazar 
Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-10-1073-6
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17. 
Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability için kapak resmi
Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
Yazar 
Suganuma, Katsuaki, editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect https://www.sciencedirect.com/science/book/9780081020944
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18. 
Risk-Based Engineering An Integrated Approach to Complex Systems—Special Reference to Nuclear Plants için kapak resmi
Risk-Based Engineering An Integrated Approach to Complex Systems—Special Reference to Nuclear Plants
Yazar 
Varde, Prabhakar V. author. Pecht, Michael G. author. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-13-0090-5
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19. 
Advanced Maintenance Policies for Shock and Damage Models için kapak resmi
Advanced Maintenance Policies for Shock and Damage Models
Yazar 
Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-70456-2
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20. 
Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance için kapak resmi
Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance
Yazar 
Gheorghe, Adrian V. author. Vamanu, Dan V. author. Katina, Polinpapilinho F. author. Pulfer, Roland. author. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-69224-1
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21. 
Infrastructure health in civil engineering için kapak resmi
Infrastructure health in civil engineering
Yazar 
Ettouney, Mohammed. Alampalli, Sreenivas.
Yer Numarası 
ONLINE
Elektronik Erişim 
Distributed by publisher. Purchase or institutional license may be required for access.
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