Arama Sonuçlarını Sınırlandır
Yazar
SpringerLink (Online service)
(27)
Liu, Qingshan. editor. (orcid)0000-0002-8161-1780
(13)
Chen, Xilin. editor.
(11)
Ji, Rongrong. editor. (orcid)0000-0003-4739-8936
(11)
Ma, Zhanyu. editor.
(11)
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Computer vision.
(24)
Application software.
(17)
Biometric identification.
(17)
Computer and Information Systems Applications.
(17)
Biometrics.
(14)
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30 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Pattern Recognition and Computer Vision 6th Chinese Conference, PRCV 2023, Xiamen, China, October 13-15, 2023, Proceedings, Part VII için kapak resmi
Pattern Recognition and Computer Vision 6th Chinese Conference, PRCV 2023, Xiamen, China, October 13-15, 2023, Proceedings, Part VII
Yazar 
Liu, Qingshan. editor. (orcid)0000-0002-8161-1780 Wang, Hanzi. editor. Ma, Zhanyu. editor. Zheng, Weishi. editor. (orcid)0000-0001-8327-0003 Zha, Hongbin. editor. (orcid)0000-0001-5860-4673
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-99-8540-1
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2. 
Pattern Recognition and Computer Vision 6th Chinese Conference, PRCV 2023, Xiamen, China, October 13-15, 2023, Proceedings, Part X için kapak resmi
Pattern Recognition and Computer Vision 6th Chinese Conference, PRCV 2023, Xiamen, China, October 13-15, 2023, Proceedings, Part X
Yazar 
Liu, Qingshan. editor. (orcid)0000-0002-8161-1780 Wang, Hanzi. editor. Ma, Zhanyu. editor. Zheng, Weishi. editor. (orcid)0000-0001-8327-0003 Zha, Hongbin. editor. (orcid)0000-0001-5860-4673
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-99-8549-4
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3. 
Pattern Recognition and Computer Vision 6th Chinese Conference, PRCV 2023, Xiamen, China, October 13-15, 2023, Proceedings, Part III için kapak resmi
Pattern Recognition and Computer Vision 6th Chinese Conference, PRCV 2023, Xiamen, China, October 13-15, 2023, Proceedings, Part III
Yazar 
Liu, Qingshan. editor. (orcid)0000-0002-8161-1780 Wang, Hanzi. editor. Ma, Zhanyu. editor. Zheng, Weishi. editor. (orcid)0000-0001-8327-0003 Zha, Hongbin. editor. (orcid)0000-0001-5860-4673
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-99-8435-0
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4. 
Dependable Computer Systems and Networks Proceedings of the Eighteenth International Conference on Dependability of Computer Systems DepCoS-RELCOMEX, July 3-7, 2023, Brunów, Poland için kapak resmi
Dependable Computer Systems and Networks Proceedings of the Eighteenth International Conference on Dependability of Computer Systems DepCoS-RELCOMEX, July 3-7, 2023, Brunów, Poland
Yazar 
Zamojski, Wojciech. editor. Mazurkiewicz, Jacek. editor. Sugier, Jarosław. editor. Walkowiak, Tomasz. editor. Kacprzyk, Janusz. editor. (orcid)0000-0003-4187-5877
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-37720-4
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5. 
Proceedings of ICACTCE'23 - The International Conference on Advances in Communication Technology and Computer Engineering New Artificial Intelligence and the Internet of Things Based Perspective and Solutions için kapak resmi
Proceedings of ICACTCE'23 - The International Conference on Advances in Communication Technology and Computer Engineering New Artificial Intelligence and the Internet of Things Based Perspective and Solutions
Yazar 
Iwendi, Celestine. editor. Boulouard, Zakaria. editor. (orcid)0000-0002-4891-3760 Kryvinska, Natalia. editor. (orcid)0000-0003-3678-9229 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-37164-6
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6. 
AI and deep learning in biometric security : trends, potential, and challenges için kapak resmi
AI and deep learning in biometric security : trends, potential, and challenges
Yazar 
Jaswal, Gaurav, editor. Kanhangad, Vivek, editor. Ramachandra, Raghavendra, editor.
Yer Numarası 
TK7882 .B56
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003003489
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Image and Graphics 9th International Conference, ICIG 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part II için kapak resmi
Image and Graphics 9th International Conference, ICIG 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part II
Yazar 
Zhao, Yao. editor. Kong, Xiangwei. editor. Taubman, David. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-71589-6
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8. 
Image and Graphics 9th International Conference, ICIG 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part I için kapak resmi
Image and Graphics 9th International Conference, ICIG 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part I
Yazar 
Zhao, Yao. editor. Kong, Xiangwei. editor. Taubman, David. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-71607-7
Format: 
Durum 
Çevrimiçi Kütüphane~1
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9. 
Pattern Recognition and Machine Intelligence 7th International Conference, PReMI 2017, Kolkata, India, December 5-8, 2017, Proceedings için kapak resmi
Pattern Recognition and Machine Intelligence 7th International Conference, PReMI 2017, Kolkata, India, December 5-8, 2017, Proceedings
Yazar 
Shankar, B. Uma. editor. Ghosh, Kuntal. editor. Mandal, Deba Prasad. editor. Ray, Shubhra Sankar. editor. Zhang, David. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-69900-4
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10. 
Mining Intelligence and Knowledge Exploration 5th International Conference, MIKE 2017, Hyderabad, India, December 13-15, 2017, Proceedings için kapak resmi
Mining Intelligence and Knowledge Exploration 5th International Conference, MIKE 2017, Hyderabad, India, December 13-15, 2017, Proceedings
Yazar 
Ghosh, Ashish. editor. (orcid)0000-0003-1548-5576 Pal, Rajarshi. editor. Prasath, Rajendra. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-71928-3
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11. 
Image and Graphics 9th International Conference, ICIG 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part III için kapak resmi
Image and Graphics 9th International Conference, ICIG 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part III
Yazar 
Zhao, Yao. editor. Kong, Xiangwei. editor. Taubman, David. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-71598-8
Format: 
Durum 
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12. 
Deep Learning for Biometrics için kapak resmi
Deep Learning for Biometrics
Yazar 
Bhanu, Bir. editor. Kumar, Ajay. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-61657-5
Format: 
Durum 
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