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SpringerLink (Online service)

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Wiley InterScience (Online service)

(27)

Dhillon, B. S. (Balbir S.), 1947-

(9)

John Wiley & Sons.

(8)

Nakagawa, Toshio. author.

(6)

(5)

Soares, C. Guedes.

(5)

Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121

(4)

Pham, Hoang. author.

(4)

Ushakov, I. A. (Igorʹ Alekseevich)

(4)

(3)

Ayyub, Bilal M.

(3)

Balakrishnan, N. editor.

(3)

Birolini, Alessandro. author.

(3)

Bitsch, Friedemann. editor.

(3)

(3)

Dhillon, B. S. author.

(3)

Finkelstein, Maxim. author.

(3)

Guiochet, Jérémie. editor.

(3)

Licari, James J., 1930-

(3)

Nikolaidis, Efstratios.

(3)

Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331

(3)

(3)

Weippl, Edgar. editor.

(3)

Willis, H. Lee, 1949-

(3)

Xu, Lida. editor.

(3)

Alampalli, Sreenivas.

(2)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(2)

Aven, Terje. author.

(2)

Ayyub, Bilal M., author.

(2)

Baggini, Angelo B.

(2)

Blischke, W. R., 1934-

(2)

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(2)

Bondavalli, Andrea. editor.

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(2)

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(2)

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(2)

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(2)

(2)

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(2)

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(2)

(2)

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(2)

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(2)

Frenkel, Ilia. author.

(2)

Frenkel, Ilia. editor.

(2)

Gallina, Barbara. editor. (orcid)0000-0002-6952-1053

(2)

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(2)

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(2)

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(2)

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(2)

Ghiocel, Dan M.

(2)

Ghosh, Ankush. editor.

(2)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(2)

Goodarzi, Ehsan. author.

(2)

Gopalaswamy, Venky.

(2)

Guedes Soares, Carlos.

(2)

Haddar, Mohamed. editor.

(2)

Hamrol, Adam. editor.

(2)

Justiniano, Jose M.

(2)

Kabashkin, Igor. editor.

(2)

Kaminskiy, Mark, 1946-

(2)

Katina, Polinpapilinho F. author.

(2)

Klyatis, Lev M.

(2)

Koornneef, Floor. editor.

(2)

Koren, Israel, 1945-

(2)

Kurtoglu, Selahattin. author.

(2)

Lecomte, Thierry. editor.

(2)

Levitin, Gregory. editor.

(2)

Li, Jinwen. editor.

(2)

Li, Rita Yi Man. author.

(2)

Limnios, Nikolaos. author.

(2)

Liptk̀, Bľa G.

(2)

Lisnianski, Anatoly. author.

(2)

Lisnianski, Anatoly. editor.

(2)

Lutz, Josef. author.

(2)

McCuen, Richard H., 1941-

(2)

McPherson, J. W. author.

(2)

(2)

Merkow, Mark S.

(2)

Meyers, Johan. editor.

(2)

Misra, Krishna B., 1943-

(2)

Mobley, R. Keith, 1943-

(2)

Murgante, Beniamino. editor. (orcid)

(2)

Murthy, D. N. P.

(2)

Murthy, D. N. Prabhakar. author.

(2)

Nelson, Wayne, 1936-

(2)

Nikulin, M.S. editor.

(2)

Nwaoha, Chikezie, 1984-

(2)

O'Regan, Gerard. author.

(2)

Ohring, Milton, 1936-

(2)

Ortmeier, Frank. editor.

(2)

Paprzycki, Marcin. editor.

(2)

Pham, Hoang. editor.

(2)

Pluvinage, Guy. editor.

(2)

Prentkovskis, Olegas. editor.

(2)

(2)

Quirchmayr, Gerald. editor.

(2)

Raghavan, Lakshmikanth.

(2)

(2)

Rausand, Marvin.

(2)

Sagaut, Pierre. editor.

(2)

Sayed-Mouchaweh, Moamar. editor.

(2)

Scheuermann, Uwe. author.

(2)

Schlangenotto, Heinrich. author.

(2)

Schneidewind, Norman.

(2)

Schoitsch, Erwin. editor.

(2)

Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443

(2)

Schrieber, Randall R.

(2)

Shaw, Rabindra Nath. editor.

(2)

Shooman, Martin L.

(2)

Shpungin, Yoseph. author.

(2)

Siarry, Patrick. editor.

(2)

Singhal, Suren.

(2)

Skavhaug, Amund. editor.

(2)

(2)

Suhir, Ephraim.

(2)

Swanson, Dale W.

(2)

Tan, Cher Ming. author.

(2)

Tlelo-Cuautle, Esteban. editor.

(2)

Tonetta, Stefano. editor.

(2)

Troubitsyna, Elena. editor.

(2)

(2)

Verma, Ajit Kumar. author.

(2)

Verma, Ajit Kumar. editor.

(2)

Vinnem, Jan Erik. author.

(2)

Vinnem, Jan-Erik. author.

(2)

Whitaker, Jerry C.

(2)

Wilson, John R.

(2)

Xiao, Liquan. editor.

(2)

Xu, Weixia. editor.

(2)

Yang, Guang-Hong.

(2)

You, Ilsun. editor.

(2)

Zhang, Chengyi. editor.

(2)

Ziaei, Mina. author.

(2)

van Aartsengel, Aristide. author.

(2)

van Gulijk, Coen. editor.

(2)

A Min, Tjoa. editor.

(1)

Abbas, Nureddin Mohamed.

(1)

Abbas, Syed Mohsin. author.

(1)

Abdel-Hameed, Mohamed S.

(1)

Aboul-Enein, Hassan Y.

(1)

Abrahamsson, Pekka. editor.

(1)

Adams, Daniel. author.

(1)

Adams, Kevin MacG. author.

(1)

(1)

Agarwal, Avinash Kumar. editor.

(1)

Agrawal, Abha. editor.

(1)

Aguilar, Jesús H. (Jesús Humberto), 1962-

(1)

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(1)

(1)

Ait-Kadi, Daoud. editor.

(1)

Ajit, Srividya. author.

(1)

Akram, Raja Naeem. editor.

(1)

Akyildiz, Ian F. editor.

(1)

Al-Turki, Umar M. author.

(1)

Aldrin, John C. author.

(1)

Alford, Terry L. author.

(1)

Ali, Syed Riffat. author.

(1)

Alias, Nor Aziah, 1961-

(1)

Aliev, Telman. author.

(1)

Allen, Theodore T. author.

(1)

Allocco, Michael.

(1)

Alouini, Mohamed-Slim.

(1)

Alwin, Duane F. (Duane Francis), 1944-

(1)

Amalberti, René. author.

(1)

Amberti, Daniele, contributor.

(1)

Amendola, Aniello. editor.

(1)

(1)

Anders, George. editor.

(1)

Andersson, Cristina. author.

(1)

Antaki, G. A. (George A.)

(1)

Apduhan, Bernady O. editor.

(1)

Arezes, Pedro M. editor.

(1)

Arezes, Pedro Miguel Ferreira Martins. editor.

(1)

Asahi, Yumi. editor.

(1)

Asai, Shojiro. editor.

(1)

Ashar, Navin G. author.

(1)

Atik, Enver, author

(1)

Attard, Mario M., editor.

(1)

Augustin, Thomas, editor.

(1)

Australasian Conference on the Mechanics of Structures and Materials (22nd : 2012 : Sydney, Australia)

(1)

Awasthi, Amit K. editor.

(1)

Ayar, Tahir. author.

(1)

(1)

(1)

Aziz, Ahmed. editor. (orcid)

(1)

Babadağ, Kadir Korhan.

(1)

Badescu, Viorel. editor.

(1)

Baiulescu, George.

(1)

Balakrishnan, N. author.

(1)

Balakrishnan, N., 1956- editor.

(1)

Balasinki, Artur.

(1)

Balasinski, Artur. author.

(1)

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(148)

(136)

Reliability (Engineering)

(82)

(75)

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(64)

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(62)

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(51)

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(44)

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(44)

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(34)

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(33)

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(32)

(25)

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(22)

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(22)

(21)

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(20)

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(14)

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(13)

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(13)

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(13)

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(13)

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(13)

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(12)

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(12)

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(12)

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(12)

(12)

(12)

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(11)

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(11)

(10)

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(10)

Computer systems -- Reliability.

(10)

(10)

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(10)

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(10)

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(9)

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(9)

(9)

(9)

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(9)

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(9)

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(8)

(8)

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(8)

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(8)

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(8)

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(8)

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(8)

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(8)

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(8)

(8)

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(7)

(7)

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(7)

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(7)

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(7)

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(7)

(7)

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(7)

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(7)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

Nanotechnology.

(5)

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(5)

(5)

(5)

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(5)

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(5)

(5)

Telecommunication systems.

(5)

Transportation engineering.

(5)

Accelerated life testing.

(4)

Algorithm Analysis and Problem Complexity.

(4)

(4)

Buildings—Design and construction.

(4)

Building—Superintendence.

(4)

Characterization and Evaluation of Materials.

(4)

Circuits and Systems.

(4)

(4)

Computer software -- Development.

(4)

Construction industry—Management.

(4)

Construction superintendence.

(4)

(4)

(4)

Data encryption (Computer science).

(4)

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(4)

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(4)

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(4)

Electric power systems.

(4)

Electronic digital computers -- Reliability.

(4)

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(4)

(4)

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(4)

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(4)

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(4)

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(4)

Microelectronics.

(4)

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(4)

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(4)

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(4)

Renewable energy sources.

(4)

Technology -- Risk assessment.

(4)

User interfaces (Computer systems).

(4)

Application software.

(3)

Arithmetic and Logic Structures.

(3)

Biomedical engineering.

(3)

Building construction.

(3)

Construction Management.

(3)

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(3)

(3)

Earth Sciences.

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

(3)

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(3)

(3)

Güvenilirlik (Mühendislik)

(3)

Human engineering.

(3)

Industrial design.

(3)

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(3)

Information storage and retrieval systems.

(3)

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(3)

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(3)

(3)

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(3)

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(3)

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(3)

Natural Hazards.

(3)

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(3)

Processor Architectures.

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

(3)

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(3)

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(3)

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(3)

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(3)

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Compressors -- Maintenance and repair.

(2)

Computational Intelligence.

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(2)

Computer communication systems.

(2)

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(2)

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313.

Reliability of computer systems and networks fault tolerance, analysis and design için kapak resmi

Reliability of computer systems and networks fault tolerance, analysis and design

Reliability of computer systems and networks fault tolerance, analysis and design

Yazar

Shooman, Martin L. John Wiley & Sons.

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/047122460X
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html

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314.

Risk, Reliability, Uncertainty, and Robustness of Water Resource Systems için kapak resmi

Risk, Reliability, Uncertainty, and Robustness of Water Resource Systems

Risk, Reliability, Uncertainty, and Robustness of Water Resource Systems

Yazar

Bogardi, Janos J.. Kundzewicz, Zbigniew W..

Yer Numarası

ONLINE

Elektronik Erişim

Access by subscription

Format:

Durum

Çevrimiçi Kütüphane~1

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315.

Fault detectability in DWDM toward higher signal quality & system reliability için kapak resmi

Fault detectability in DWDM toward higher signal quality & system reliability

Fault detectability in DWDM toward higher signal quality & system reliability

Yazar

Kartalopoulos, Stamatios V.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624

Format:

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Çevrimiçi Kütüphane~1

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316.

Güvenlik kısıtlı tamsayılı doğrusal programlama modeli ve Ankara ili itfaye hizmetkerinde uygulanması = Reliability restricted integer linear programming model and its application on fire department in Ankara için kapak resmi

Güvenlik kısıtlı tamsayılı doğrusal programlama modeli ve Ankara ili itfaye hizmetkerinde uygulanması = Reliability restricted integer linear programming model and its application on fire department in Ankara

Güvenlik kısıtlı tamsayılı doğrusal programlama modeli ve Ankara ili itfaye hizmetkerinde uygulanması = Reliability restricted integer linear programming model and its application on fire department in Ankara

Yazar

Babadağ, Kadir Korhan.

Yer Numarası

TEZ 4218 .B33 1999

Format:

Durum

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317.

Engineering maintainability how to design for reliability and easy maintenance için kapak resmi

Engineering maintainability how to design for reliability and easy maintenance

Engineering maintainability how to design for reliability and easy maintenance

Yazar

Dhillon, B. S. (Balbir S.), 1947-

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780884152576

Format:

Durum

Çevrimiçi Kütüphane~1

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318.

Software safety and reliability : techniques, approaches, and standards of key industrial sectors için kapak resmi

Software safety and reliability : techniques, approaches, and standards of key industrial sectors

Software safety and reliability : techniques, approaches, and standards of key industrial sectors

Yazar

Herrmann, Debra S.

Yer Numarası

QA76.76.R44 H39 1999

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319.

Reliability and failure of electronic materials and devices için kapak resmi

Reliability and failure of electronic materials and devices

Reliability and failure of electronic materials and devices

Yazar

Ohring, Milton, 1936-

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780125249850

Format:

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320.

Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems için kapak resmi

Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems

Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems

Yazar

Pukite, Jan, 1928- Pukite, Paul.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338

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321.

Reliability for the social sciences : theory and applications için kapak resmi

Reliability for the social sciences : theory and applications

Reliability for the social sciences : theory and applications

Yazar

Traub, Ross E.

Yer Numarası

HA29 T668 1994

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Durum

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322.

Aksaklığa katlanır yazılımda güvenirlik çözümlemesi ve bir hata kurtarma çalışması = Reliability analysis in fault-tolerant software and an errorr recovery study için kapak resmi

Aksaklığa katlanır yazılımda güvenirlik çözümlemesi ve bir hata kurtarma çalışması = Reliability analysis in fault-tolerant software and an errorr recovery study

Aksaklığa katlanır yazılımda güvenirlik çözümlemesi ve bir hata kurtarma çalışması = Reliability analysis in fault-tolerant software and an errorr recovery study

Yazar

Ege, Mustafa.

Yer Numarası

TEZ 2308 .E34 1993

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323.

Guardians of science fairness and reliability of peer review için kapak resmi

Guardians of science fairness and reliability of peer review

Guardians of science fairness and reliability of peer review

Yazar

Daniel, Hans-Dieter, 1955- Russey, William E. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/29859865.html
John Wiley http://dx.doi.org/10.1002/3527602208

Format:

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324.

Reliability analysis and prediction a methodology oriented treatment için kapak resmi

Reliability analysis and prediction a methodology oriented treatment

Reliability analysis and prediction a methodology oriented treatment

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Misra, Krishna B., 1943-

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ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780444896063

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Çevrimiçi Kütüphane~1

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