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SpringerLink (Online service)
(30)
Castro, Félix. editor.
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Gelbukh, Alexander. editor.
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González, Miguel. editor.
(2)
Guo, Chengan. editor.
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2013
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Algorithm Analysis and Problem Complexity.
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Computer science.
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Image Processing and Computer Vision.
(24)
Optical pattern recognition.
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25. 
Advances in Computer Entertainment 10th International Conference, ACE 2013, Boekelo, The Netherlands, November 12-15, 2013. Proceedings için kapak resmi
Advances in Computer Entertainment 10th International Conference, ACE 2013, Boekelo, The Netherlands, November 12-15, 2013. Proceedings
Yazar 
Reidsma, Dennis. editor. Katayose, Haruhiro. editor. Nijholt, Anton. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE(332968.1)
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-319-03161-3
Format: 
Durum 
Çevrimiçi Kütüphane~1
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26. 
Scale Space and Variational Methods in Computer Vision 4th International Conference, SSVM 2013, Schloss Seggau, Leibnitz, Austria, June 2-6, 2013. Proceedings için kapak resmi
Scale Space and Variational Methods in Computer Vision 4th International Conference, SSVM 2013, Schloss Seggau, Leibnitz, Austria, June 2-6, 2013. Proceedings
Yazar 
Kuijper, Arjan. editor. Bredies, Kristian. editor. Pock, Thomas. editor. Bischof, Horst. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE(334572.1)
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-38267-3
Format: 
Durum 
Çevrimiçi Kütüphane~1
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27. 
Computational Intelligence Methods for Bioinformatics and Biostatistics 9th International Meeting, CIBB 2012, Houston, TX, USA, July 12-14, 2012 Revised Selected Papers için kapak resmi
Computational Intelligence Methods for Bioinformatics and Biostatistics 9th International Meeting, CIBB 2012, Houston, TX, USA, July 12-14, 2012 Revised Selected Papers
Yazar 
Peterson, Leif E. editor. Masulli, Francesco. editor. Russo, Giuseppe. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE(334585.1)
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-38342-7
Format: 
Durum 
Çevrimiçi Kütüphane~1
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Kopya:
28. 
Recent Trends in Applied Artificial Intelligence 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013, Amsterdam, The Netherlands, June 17-21, 2013. Proceedings için kapak resmi
Recent Trends in Applied Artificial Intelligence 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013, Amsterdam, The Netherlands, June 17-21, 2013. Proceedings
Yazar 
Ali, Moonis. editor. Bosse, Tibor. editor. Hindriks, Koen V. editor. Hoogendoorn, Mark. editor. Jonker, Catholijn M. editor.
Yer Numarası 
ONLINE(334627.1)
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-38577-3
Format: 
Durum 
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29. 
Augmented Reality Environments for Medical Imaging and Computer-Assisted Interventions 6th International Workshop, MIAR 2013 and 8th International Workshop, AE-CAI 2013, Held in Conjunction with MICCAI 2013, Nagoya, Japan, September 22, 2013. Proceedings için kapak resmi
Augmented Reality Environments for Medical Imaging and Computer-Assisted Interventions 6th International Workshop, MIAR 2013 and 8th International Workshop, AE-CAI 2013, Held in Conjunction with MICCAI 2013, Nagoya, Japan, September 22, 2013. Proceedings
Yazar 
Liao, Hongen. editor. Linte, Cristian A. editor. Masamune, Ken. editor. Peters, Terry M. editor. Zheng, Guoyan. editor.
Yer Numarası 
ONLINE(335016.1)
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-40843-4
Format: 
Durum 
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30. 
Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications 18th Iberoamerican Congress, CIARP 2013, Havana, Cuba, November 20-23, 2013, Proceedings, Part I için kapak resmi
Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications 18th Iberoamerican Congress, CIARP 2013, Havana, Cuba, November 20-23, 2013, Proceedings, Part I
Yazar 
Ruiz-Shulcloper, José. editor. Sanniti di Baja, Gabriella. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE(335145.1)
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-41822-8
Format: 
Durum 
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