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25. 
RFID. Security and Privacy 7th International Workshop, RFIDSec 2011, Amherst, USA, June 26-28, 2011, Revised Selected Papers için kapak resmi
RFID. Security and Privacy 7th International Workshop, RFIDSec 2011, Amherst, USA, June 26-28, 2011, Revised Selected Papers
Yazar 
Juels, Ari. editor. Paar, Christof. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-25286-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
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26. 
Verification, Model Checking, and Abstract Interpretation 13th International Conference, VMCAI 2012, Philadelphia, PA, USA, January 22-24, 2012. Proceedings için kapak resmi
Verification, Model Checking, and Abstract Interpretation 13th International Conference, VMCAI 2012, Philadelphia, PA, USA, January 22-24, 2012. Proceedings
Yazar 
Kuncak, Viktor. editor. Rybalchenko, Andrey. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-27940-9
Format: 
Durum 
Çevrimiçi Kütüphane~1
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27. 
Topics in Cryptology – CT-RSA 2012 The Cryptographers’ Track at the RSA Conference 2012, San Francisco, CA, USA, February 27 – March 2, 2012. Proceedings için kapak resmi
Topics in Cryptology – CT-RSA 2012 The Cryptographers’ Track at the RSA Conference 2012, San Francisco, CA, USA, February 27 – March 2, 2012. Proceedings
Yazar 
Dunkelman, Orr. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-27954-6
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
28. 
Bioinformatics Research and Applications 8th International Symposium, ISBRA 2012, Dallas, TX, USA, May 21-23, 2012. Proceedings için kapak resmi
Bioinformatics Research and Applications 8th International Symposium, ISBRA 2012, Dallas, TX, USA, May 21-23, 2012. Proceedings
Yazar 
Bleris, Leonidas. editor. Măndoiu, Ion. editor. Schwartz, Russell. editor. Wang, Jianxin. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-30191-9
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
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29. 
Runtime Verification Second International Conference, RV 2011, San Francisco, CA, USA, September 27-30, 2011, Revised Selected Papers için kapak resmi
Runtime Verification Second International Conference, RV 2011, San Francisco, CA, USA, September 27-30, 2011, Revised Selected Papers
Yazar 
Khurshid, Sarfraz. editor. Sen, Koushik. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-29860-8
Format: 
Durum 
Çevrimiçi Kütüphane~1
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30. 
Fast Software Encryption 19th International Workshop, FSE 2012, Washington, DC, USA, March 19-21, 2012. Revised Selected Papers için kapak resmi
Fast Software Encryption 19th International Workshop, FSE 2012, Washington, DC, USA, March 19-21, 2012. Revised Selected Papers
Yazar 
Canteaut, Anne. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-34047-5
Format: 
Durum 
Çevrimiçi Kütüphane~1
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31. 
Combinatorial Image Analaysis 15th International Workshop, IWCIA 2012, Austin, TX, USA, November 28-30, 2012. Proceedings için kapak resmi
Combinatorial Image Analaysis 15th International Workshop, IWCIA 2012, Austin, TX, USA, November 28-30, 2012. Proceedings
Yazar 
Barneva, Reneta P. editor. Brimkov, Valentin E. editor. Aggarwal, Jake K. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-34732-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
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32. 
OpenMP in the Petascale Era 7th International Workshop on OpenMP, IWOMP 2011, Chicago, IL, USA, June 13-15, 2011. Proceedings için kapak resmi
OpenMP in the Petascale Era 7th International Workshop on OpenMP, IWOMP 2011, Chicago, IL, USA, June 13-15, 2011. Proceedings
Yazar 
Chapman, Barbara M. editor. Gropp, William D. editor. Kumaran, Kalyan. editor. Müller, Matthias S. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-21487-5
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
33. 
Theory and Applications of Satisfiability Testing - SAT 2011 14th International Conference, SAT 2011, Ann Arbor, MI, USA, June 19-22, 2011. Proceedings için kapak resmi
Theory and Applications of Satisfiability Testing - SAT 2011 14th International Conference, SAT 2011, Ann Arbor, MI, USA, June 19-22, 2011. Proceedings
Yazar 
Sakallah, Karem A. editor. Simon, Laurent. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-21581-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
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34. 
Trust and Trustworthy Computing 4th International Conference, TRUST 2011, Pittsburgh, PA, USA, June 22-24, 2011. Proceedings için kapak resmi
Trust and Trustworthy Computing 4th International Conference, TRUST 2011, Pittsburgh, PA, USA, June 22-24, 2011. Proceedings
Yazar 
McCune, Jonathan M. editor. Balacheff, Boris. editor. Perrig, Adrian. editor. Sadeghi, Ahmad-Reza. editor. Sasse, Angela. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-21599-5
Format: 
Durum 
Çevrimiçi Kütüphane~1
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35. 
Modern Approaches in Applied Intelligence 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 – July 1, 2011, Proceedings, Part I için kapak resmi
Modern Approaches in Applied Intelligence 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 – July 1, 2011, Proceedings, Part I
Yazar 
Mehrotra, Kishan G. editor. Mohan, Chilukuri K. editor. Oh, Jae C. editor. Varshney, Pramod K. editor. Ali, Moonis. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-21822-4
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
36. 
Modern Approaches in Applied Intelligence 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 – July 1, 2011, Proceedings, Part II için kapak resmi
Modern Approaches in Applied Intelligence 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 – July 1, 2011, Proceedings, Part II
Yazar 
Mehrotra, Kishan G. editor. Mohan, Chilukuri K. editor. Oh, Jae C. editor. Varshney, Pramod K. editor. Ali, Moonis. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-21827-9
Format: 
Durum 
Çevrimiçi Kütüphane~1
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