Search Results for Process control -- Statistical methods

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SpringerLink (Online service)

(4)

Kanfer, Isadore.

(3)

Montgomery, Douglas C.

(3)

Shargel, Leon, 1941-

(3)

Wiley InterScience (Online service)

(3)

Joglekar, Anand M.

(2)

Rogerson, Peter., author.

(2)

(2)

Ahmad, Liaquat.

(1)

Amberti, Daniele, author.

(1)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(1)

Amiri, Amirhossein, 1979-

(1)

Aslam, Muhammad.

(1)

Ayeni, Babatunde J.

(1)

Badiru, Adedeji Bodunde, 1952, author.

(1)

Berry, Ira R., 1942-

(1)

Box, George E. P.

(1)

(1)

Caulcutt, R., author.

(1)

Chakraborti, Subhabrata, author.

(1)

Chakraborty, Ashis K., author.

(1)

Chatterjee, Moutushi, author.

(1)

Chen, Zhiwen. author.

(1)

Cinar, Ali, author.

(1)

(1)

Colosimo, Bianca M.

(1)

Del Castillo, Enrique.

(1)

Fisher, N. I., translator, writer of supplementary textual content.

(1)

Ge, Zhiqiang. author.

(1)

Graham, Marien A., author.

(1)

Gupta, Bhisham C., 1942- author.

(1)

Ibidapo-Obe, Oye.

(1)

Kang, Chang W. (Chang Wok), 1957- author.

(1)

Kayihan, Ferhan, 1948-

(1)

Keller, Paul A. (Paul Andrew)

(1)

Kenett, Ron, author.

(1)

Koronacki, Jacek.

(1)

Krishnamoorthi, K. S.

(1)

Krishnamoorthi, V. Ram.

(1)

Kvam, Paul H., 1962- author.

(1)

Lawson, John, 1947- author.

(1)

Levinson, William A., 1957-

(1)

Luceno, Alberto, ort. yaz.

(1)

Luceño, Alberto.

(1)

Mandal, Nisith R. author.

(1)

(1)

Mitra, Amitava.

(1)

Moen, Ronald D.

(1)

Muir, Alastair K. S. (Alastair Kerr S.), 1957-

(1)

Nash, Robert A., 1930-

(1)

Nolan, Thomas W.

(1)

Noorossana, Rassoul, 1959-

(1)

Oakland, John, author.

(1)

Oakland, Robert James, author.

(1)

Palazoglu, Ahmet.

(1)

Paniagua-Quiñones, María del Carmen.

(1)

Papadakis, Emmanuel P., author.

(1)

Provost, Lloyd P.

(1)

Ryan, Thomas P., 1945-

(1)

Saghaei, Abbas, 1972-

(1)

(1)

Sarasohn, Homer, 1916-2001, author.

(1)

Snijkers, Ger, 1963- editor.

(1)

Song, Zhihuan. author.

(1)

Spanos, Costas J.

(1)

Stapenhurst, Tim.

(1)

Stephens, Larry J.

(1)

Tanaka, Y., translator.

(1)

Thompson, James R., 1938, author.

(1)

Zacks, Shelemyahu, 1932- author.

(1)

Zhang, Kai. author.

(1)

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Process control -- Statistical methods.

(26)

Quality control -- Statistical methods.

(14)

Electronic books.

(7)

Quality control -- Statistical methods

(4)

Qualité -- Contrôle -- Méthodes statistiques.

(4)

Quality control.

(3)

Six sigma (Quality control standard)

(3)

Acceptance sampling.

(2)

BUSINESS & ECONOMICS / Quality Control

(2)

BUSINESS & ECONOMICS.

(2)

Chemical process control -- Statistical methods.

(2)

Control and Systems Theory.

(2)

Control engineering.

(2)

Experimental design.

(2)

Feedback control systems.

(2)

(2)

Geospatial data.

(2)

MATHEMATICS / Probability & Statistics / General

(2)

Process control -- Statistical methods

(2)

R (Computer program language)

(2)

Reliability (Engineering) -- Statistical methods.

(2)

Statistical maps.

(2)

Statistics -- Graphic methods.

(2)

(2)

(2)

TECHNOLOGY / Quality Control

(2)

BUSINESS & ECONOMICS -- Industrial Management.

(1)

BUSINESS & ECONOMICS -- Management Science.

(1)

BUSINESS & ECONOMICS -- Management.

(1)

BUSINESS & ECONOMICS -- Organizational Behavior.

(1)

BUSINESS & ECONOMICS / General

(1)

BUSINESS & ECONOMICS / Industries / Manufacturing Industries

(1)

BUSINESS & ECONOMICS / Production & Operations Management

(1)

BUSINESS & ECONOMICS / Total Quality Management

(1)

Bayesian statistical decision theory.

(1)

Chemical industry -- Quality control -- Statistical methods.

(1)

Chemistry, Technical.

(1)

Commercial statistics -- Methodology

(1)

Commercial statistics -- Methodology.

(1)

Computer science -- Mathematics.

(1)

Control theory.

(1)

(1)

Distribution (Probability theory) -- Outlines, syllabi, etc.

(1)

(1)

(1)

Drugs -- Standards -- United States.

(1)

(1)

Engineering -- Data processing.

(1)

Engineering -- Statistical methods -- Outlines, syllabi, etc.

(1)

Engineering design.

(1)

Engineering mathematics.

(1)

(1)

(1)

Geribildirim denetim sistemleri.

(1)

Gestion d'entreprise -- Méthodes statistiques.

(1)

Industrial Chemistry.

(1)

Industrial management

(1)

Industrial management -- Statistical methods.

(1)

Integrated circuits -- Design and construction.

(1)

JMP (Computer file)

(1)

Kalite Kontrolü -- İstatistiksel Yöntemler.

(1)

MATHEMATICS -- Applied.

(1)

MATHEMATICS -- Probability & Statistics -- General.

(1)

(1)

Mathematical and Computational Engineering Applications.

(1)

Mathematical statistics.

(1)

Measuring instruments.

(1)

Mechanics, Applied.

(1)

(1)

(1)

Multivariate analysis -- Data processing.

(1)

Nondestructive testing -- Cost effectiveness.

(1)

Nonparametric statistics

(1)

Nonparametric statistics.

(1)

Pharmaceutical chemistry.

(1)

Pharmaceutical industry -- Quality control.

(1)

Probabilities -- Outlines, syllabi, etc.

(1)

Probability & Statistics.

(1)

Probability and Statistics in Computer Science.

(1)

Process control -- Mathematical models.

(1)

Process control -- Statistical methods -- Outlines, syllabi, etc.

(1)

Production management -- Quality control.

(1)

Quality Control.

(1)

Quality control -- Planning.

(1)

Quality control -- Standards

(1)

Quality control -- Standards.

(1)

Qualité -- Contrôle -- Normes.

(1)

R (Langage de programmation)

(1)

Regression analysis.

(1)

Reliability (Engineering) -- Statistical methods

(1)

SPC/Reliability/Quality Control

(1)

Sampling (Statistics)

(1)

Security Science and Technology.

(1)

Security systems.

(1)

Semiconductors -- Design and construction.

(1)

Services statistiques.

(1)

(1)

Solid Mechanics.

(1)

Solid dosage forms.

(1)

(1)

Statistical services

(1)

Statistical services.

(1)

Statistics -- Computer programs -- Outlines, syllabi, etc.

(1)

Statistics -- Outlines, syllabi, etc.

(1)

Statistique non paramétrique.

(1)

(1)

Systems Theory, Control.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Solid State.

(1)

TECHNOLOGY & ENGINEERING.

(1)

TECHNOLOGY / Engineering / Chemical & Biochemical

(1)

(1)

(1)

Tablets (Medicine)

(1)

Traffic engineering.

(1)

Transportation Technology and Traffic Engineering.

(1)

Transportation engineering.

(1)

Variational principles.

(1)

(1)

İlaçlar, Jenerik

(1)

İşlem Denetimi -- İstatistiksel Yöntemler.

(1)

İşlem yönetimi -- İstatistiksel yöntemler.

(1)

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25.

Schaum's outlines: statistics for engineers için kapak resmi

Schaum's outlines: statistics for engineers

Schaum's outlines: statistics for engineers

Yazar

Stephens, Larry J.

Yer Numarası

ONLINE

Elektronik Erişim

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26.

Statistical process control demystified için kapak resmi

Statistical process control demystified

Statistical process control demystified

Yazar

Keller, Paul A. (Paul Andrew)

Yer Numarası

ONLINE

Elektronik Erişim

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27.

Industrial statistics practical methods and guidance for improved performance için kapak resmi

Industrial statistics practical methods and guidance for improved performance

Industrial statistics practical methods and guidance for improved performance

Yazar

Joglekar, Anand M. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470584149

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28.

Statistical quality control : a modern introduction için kapak resmi

Statistical quality control : a modern introduction

Statistical quality control : a modern introduction

Yazar

Montgomery, Douglas C.

Yer Numarası

TS156 M66 2009

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29.

Statistical control by monitoring and adjustment için kapak resmi

Statistical control by monitoring and adjustment

Statistical control by monitoring and adjustment

Yazar

Box, George E. P. Luceño, Alberto. Paniagua-Quiñones, María del Carmen.

Yer Numarası

ONLINE

Elektronik Erişim

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Click here to view book
ebrary http://site.ebrary.com/id/10501391
http://swb.eblib.com/patron/FullRecord.aspx?p=848509

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30.

Statistical detection and surveillance of geographic clusters için kapak resmi

Statistical detection and surveillance of geographic clusters

Statistical detection and surveillance of geographic clusters

Yazar

Rogerson, Peter., author. Yamada, Ikuho.

Yer Numarası

HA31 .R564 2009

Elektronik Erişim

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31.

Statistical detection and surveillance of geographic clusters için kapak resmi

Statistical detection and surveillance of geographic clusters

Statistical detection and surveillance of geographic clusters

Yazar

Rogerson, Peter., author. Yamada, Ikuho.

Yer Numarası

HA31 .R564 2009

Elektronik Erişim

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32.

Fundamentals of quality control and improvement için kapak resmi

Fundamentals of quality control and improvement

Fundamentals of quality control and improvement

Yazar

Mitra, Amitava.

Yer Numarası

TS156

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692379

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33.

Bayesian process monitoring, control and optimization için kapak resmi

Bayesian process monitoring, control and optimization

Bayesian process monitoring, control and optimization

Yazar

Colosimo, Bianca M. Del Castillo, Enrique.

Yer Numarası

TS156.8 .B39 2007

Elektronik Erişim

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34.

Chemical process performance evaluation için kapak resmi

Chemical process performance evaluation

Chemical process performance evaluation

Yazar

Cinar, Ali, author. Palazoglu, Ahmet. Kayihan, Ferhan, 1948-

Yer Numarası

TP155.75 .C55 2007

Elektronik Erişim

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35.

Financial justification of nondestructive testing : cost of quality in manufacturing için kapak resmi

Financial justification of nondestructive testing : cost of quality in manufacturing

Financial justification of nondestructive testing : cost of quality in manufacturing

Yazar

Papadakis, Emmanuel P., author.

Yer Numarası

TA417.2 .P37 2007

Elektronik Erişim

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36.

Fundamentals of semiconductor manufacturing and process control için kapak resmi

Fundamentals of semiconductor manufacturing and process control

Fundamentals of semiconductor manufacturing and process control

Yazar

May, Gary S. Spanos, Costas J.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952

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