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SpringerLink (Online service)

(10)

Crowder, M. J. (Martin J.), 1943, author.

(2)

Bagdonavicius, V. (Vilijandas), author.

(1)

Balakrishnan, N., 1956- author.

(1)

Barolli, Leonard. editor.

(1)

Bruckstein, Alfred M. editor.

(1)

Calvo Rolle, José Luis. editor. (orcid)0000-0002-2333-8405

(1)

Chakrabarti, Amlan. editor.

(1)

Chen, Ding-Geng.

(1)

Chimitova, Ekaterina V., author.

(1)

Choi, Byeongkuen. editor.

(1)

Corchado, Emilio. editor.

(1)

Doumeingts, Guy, editor.

(1)

El Hami, Abdelkhalak. editor.

(1)

Estekanchi, Homayoon E., editor.

(1)

Fleming, Thomas R.

(1)

García Bringas, Pablo. editor.

(1)

Goje, Amol. editor.

(1)

Harrington, David P.

(1)

Herrero, Álvaro. editor. (orcid)0000-0002-2444-5384

(1)

Huber, Catherine.

(1)

Hudson, Harold Malcolm, author.

(1)

I-ESA (Conference) (9th : 2018 : Berlin, Germany)

(1)

Jaekel, Frank-Walter, editor.

(1)

John Wiley & Sons.

(1)

Kacprzyk, Janusz. editor. (orcid)0000-0003-4187-5877

(1)

Kadry, Seifedine. editor.

(1)

Kalbfleisch, J. D.

(1)

Kannan, SriRaman.

(1)

Khattree, Ravindra.

(1)

Kumar, Vijay. editor.

(1)

Lawless, Jerald F., 1944-

(1)

(1)

Lee, Woo Bang. editor.

(1)

Lefevre, Bruce G.

(1)

Ling, Man Ho, author.

(1)

LuValle, Michael J., author.

(1)

Ma, Jun (Statistics teacher), author.

(1)

Ma, Lin. editor.

(1)

Martínez de Pisón, Francisco Javier. editor. (orcid)0000-0002-3063-7374

(1)

Martínez Álvarez, Francisco. editor.

(1)

Mathew, Joseph. editor.

(1)

Mazurkiewicz, Jacek. editor.

(1)

Naik, Dayanand N.

(1)

Nelson, Wayne, 1936-

(1)

Nikulin, M. S. (Mikhail Stepanovich)

(1)

Nikulin, M. S. (Mikhail Stepanovich), author.

(1)

Peace, Karl E., 1941-

(1)

Pham, Hoang. editor.

(1)

(1)

Prentice, Ross L.

(1)

Pérez García, Hilde. editor. (orcid)0000-0001-7112-1983

(1)

Quintián, Héctor. editor. (orcid)0000-0002-0268-7999

(1)

Sharma, Neha. editor.

(1)

So, Hon Yiu, author.

(1)

Spizzichino, F. (Fabio), 1948, author.

(1)

Sugier, Jarosław. editor.

(1)

Sun, Jianguo, 1961-

(1)

Sun, Jianguo. author.

(1)

Thakor, Nitish V. editor.

(1)

(1)

Tricker, Samantha.

(1)

Troncoso Lora, Alicia. editor. (orcid)0000-0002-9801-7999

(1)

Vafai, Hassan A., editor.

(1)

Walkowiak, Tomasz. editor.

(1)

Wang, John Wenyu.

(1)

Webb, Annabel, author.

(1)

Wen, Shiping. editor.

(1)

Wessels, William R., author.

(1)

Wienke, Andreas., author.

(1)

Wiley InterScience (Online service)

(1)

Wollschlaeger, Martin, editor.

(1)

Yang, Cihui. editor.

(1)

Zamojski, Wojciech. editor.

(1)

Zelm, Martin, editor.

(1)

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Tümünü genişlet

Konu

Failure time data analysis.

(12)

Computational intelligence.

(4)

Electronic books.

(4)

Survival analysis (Biometry)

(4)

Accelerated life testing.

(3)

Data Engineering.

(3)

Engineering -- Data processing.

(3)

Reliability (Engineering)

(3)

Accelerated life testing -- Statistical methods.

(2)

(2)

Competing risks.

(2)

Industrial Management.

(2)

(2)

Medicine -- Research -- Statistical methods.

(2)

Accelerated life testing

(1)

Accelerated life testing -- Mathematical models.

(1)

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Chi-square test

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Chi-square test.

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Clinical trials -- Statistical methods.

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Computational Mathematics and Numerical Analysis.

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Conference papers and proceedings

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Earthquake resistant design.

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(1)

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(1)

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(1)

Electronic apparatus and appliances -- Testing.

(1)

Electronic books

(1)

Enterprise application integration (Computer systems)

(1)

Enterprise application integration (Computer systems) -- Congresses.

(1)

Environmental engineering -- Standards.

(1)

Environmental testing -- Standards.

(1)

Equipment Failure Analysis

(1)

Essais accélérés (Technologie)

(1)

Failure analysis (Engineering)

(1)

Failure time data analysis -- Data processing.

(1)

Failure time data analysis -- Mathematics.

(1)

Failure time data analysis -- Standards.

(1)

Financial risk management.

(1)

Intégration d'applications d'entreprise (Systèmes informatiques) -- Congrès.

(1)

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(1)

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(1)

MATHEMATICS / Probability & Statistics / General

(1)

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(1)

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(1)

Management information systems -- Congresses.

(1)

Management science.

(1)

(1)

Martingales (Mathematics)

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

Medicine -- Research -- Data processing.

(1)

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(1)

Mortality -- Mathematical models.

(1)

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(1)

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(1)

Point processes.

(1)

(1)

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(1)

Product life cycle.

(1)

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(1)

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(1)

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(1)

(1)

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(1)

Reliability (Engineering) -- Statistical methods.

(1)

Risk Management.

(1)

(1)

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(1)

Security systems.

(1)

Solid Mechanics.

(1)

(1)

(1)

Survival Analysis.

(1)

Survival analysis (Biometry) -- Data processing.

(1)

Survival analysis (Biometry) -- Mathematics.

(1)

Systèmes d'information de gestion -- Congrès.

(1)

TECHNOLOGY & ENGINEERING -- Mechanical.

(1)

TECHNOLOGY / Engineering / Civil

(1)

Test du khi-carré.

(1)

Theoretical, Mathematical and Computational Physics.

(1)

accelerated aging.

(1)

proceedings (reports)

(1)

Tümünü genişlet

Materyal Türü

Shelf Location

CRC Ekitapları

Elektronik Kütüphane

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25.

Design and analysis of accelerated tests for mission critical reliability için kapak resmi

Design and analysis of accelerated tests for mission critical reliability

Design and analysis of accelerated tests for mission critical reliability

Yazar

LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.

Yer Numarası

TA169.3 .L88 2004

Elektronik Erişim

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26.

Statistical methods for survival data analysis için kapak resmi

Statistical methods for survival data analysis

Statistical methods for survival data analysis

Yazar

Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/0471458546
http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html

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27.

Statistical models and methods for lifetime data için kapak resmi

Statistical models and methods for lifetime data

Statistical models and methods for lifetime data

Yazar

Lawless, Jerald F., 1944-

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9781118033005
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html

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28.

Accelerated life models : modeling and statistical analysis için kapak resmi

Accelerated life models : modeling and statistical analysis

Accelerated life models : modeling and statistical analysis

Yazar

Bagdonavicius, V. (Vilijandas), author. Nikulin, M. S. (Mikhail Stepanovich)

Yer Numarası

TA169.3 .N55 2002

Elektronik Erişim

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29.

Subjective probability models for lifetimes için kapak resmi

Subjective probability models for lifetimes

Subjective probability models for lifetimes

Yazar

Spizzichino, F. (Fabio), 1948, author.

Yer Numarası

QA276 .S66 2001

Elektronik Erişim

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30.

Classical competing risks için kapak resmi

Classical competing risks

Classical competing risks

Yazar

Crowder, M. J. (Martin J.), 1943, author.

Yer Numarası

QA273 .C855 2001

Elektronik Erişim

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31.

Environmental requirements for electromechanical and electronic equipment için kapak resmi

Environmental requirements for electromechanical and electronic equipment

Environmental requirements for electromechanical and electronic equipment

Yazar

Tricker, Ray. Tricker, Samantha.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750639026

Format:

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32.

Accelerated testing statistical models, test plans and data analyses için kapak resmi

Accelerated testing statistical models, test plans and data analyses

Accelerated testing statistical models, test plans and data analyses

Yazar

Nelson, Wayne, 1936-

Yer Numarası

ONLINE

Elektronik Erişim

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757
John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html

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