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Yayın Yılı: 2009

Yazar

Morkoç, Hadis.

(4)

Morkoç, Hadis. Electronic and optical processes in nitrides.

(4)

SpringerLink (Online service)

(4)

Wiley InterScience (Online service)

(4)

Orton, J. W. (John Wilfred)

(2)

Achuthan, M. K.

(1)

Adachi, Sadao, 1950-

(1)

(1)

Beer, Albert C., ed.

(1)

Benson, Oliver.

(1)

(1)

Bhattacharya, Sitangshu. author.

(1)

DasGupta, A. (Amitava)

(1)

Dasgupta, Nandini.

(1)

De, Debashis. author.

(1)

Deleonibus, Simon.

(1)

Duarte, F. J. (Frank J.)

(1)

Fisher, Dennis G., Ph. D.

(1)

Föll, Helmut. author.

(1)

Ghatak, Kamakhya Prasad. author.

(1)

Ghione, Giovanni.

(1)

Henneberger, Fritz.

(1)

(1)

Hong, Soon-Ku. editor.

(1)

(1)

Jüngel, Ansgar. author.

(1)

(1)

Kochergin, Vladimir. author.

(1)

(1)

Materials Science & Technology Conference (2008 : Pittsburgh, Pa.)

(1)

Perret, Robert (Robert Jos)

(1)

Plekhanov, Vladimir G., ed.

(1)

(1)

Siffert, P. (Paul)

(1)

Slater, John Clarke, 1900-

(1)

Stallinga, Peter, 1966-

(1)

Strong, Alvin Wayne, 1946-

(1)

(1)

(1)

Voldman, Steven H.

(1)

Weber, Eicke R., ed.

(1)

Willardson, Robert K. ed.

(1)

Wong, Ban P., 1953-

(1)

Wöll, Christof.

(1)

Yao, Takafumi. editor.

(1)

Tümünü genişlet

Dil

(29)

Konu

Electronic books.

(9)

Semiconductors -- Materials.

(5)

(4)

Semiconductors.

(4)

Optical materials.

(3)

Organic semiconductors.

(3)

Electronics -- Materials.

(2)

(2)

(2)

Metal oxide semiconductors, Complementary -- Reliability.

(2)

Nanoelectronics.

(2)

Organic electronics.

(2)

Particles (Nuclear physics).

(2)

(2)

Semiconductors -- History.

(2)

Yarıiletkenler.

(2)

CMOS-Schaltung.

(1)

COMPUTERS / Logic Design

(1)

Cadmium alloys.

(1)

Condensed matter.

(1)

Conjugated polymers.

(1)

Electric discharges.

(1)

Electron-phonon interactions.

(1)

Electronic apparatus and appliances -- History.

(1)

Electronic apparatus and appliances -- Materials.

(1)

Electrostatics.

(1)

Field-effect transistors.

(1)

Gallium arsenide semiconductors.

(1)

Information technology -- History.

(1)

Integrated circuits -- Design and construction.

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing.

(1)

KUANTUM KURAMI.

(1)

Laser communication systems.

(1)

Layer structure (Solids)

(1)

MADDE -- YAPIMI.

(1)

MOLEKÜLER KURAM.

(1)

Mathematical physics.

(1)

Metal oxide semiconductors, Complementary -- Defects.

(1)

Metal oxide semiconductors, Complementary -- Design and construction.

(1)

Metal oxide semiconductors, Complementary.

(1)

Microwave integrated circuits.

(1)

(1)

Nanostructured materials -- Congresses.

(1)

Nanostructures.

(1)

Nanotechnology.

(1)

Optoelectronic devices.

(1)

Physical optics.

(1)

Power electronics.

(1)

Power semiconductors.

(1)

Quantum optics.

(1)

(1)

Schaltungsentwurf.

(1)

Semiconductors -- Analysis.

(1)

Semiconductors -- Congresses.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Periodicals.

(1)

Semiconductors -- Surfaces.

(1)

Semimetals -- Periodicals..

(1)

Silicon alloys.

(1)

Solid state electronics.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Digital.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.

(1)

TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic

(1)

TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI

(1)

Tunable lasers.

(1)

YARIMETALLER -- SÜRELİ YAYINLAR..

(1)

YARIİLETKENLER -- SÜRELİ YAYINLAR.

(1)

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25.

Reliability wearout mechanisms in advanced CMOS technologies için kapak resmi

Reliability wearout mechanisms in advanced CMOS technologies

Reliability wearout mechanisms in advanced CMOS technologies

Yazar

Strong, Alvin Wayne, 1946-

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029

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26.

Semiconductor quantum bits için kapak resmi

Semiconductor quantum bits

Semiconductor quantum bits

Yazar

Benson, Oliver. Henneberger, Fritz.

Yer Numarası

ONLINE

Elektronik Erişim

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27.

Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices için kapak resmi

Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices

Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices

Yazar

Deleonibus, Simon.

Yer Numarası

ONLINE

Elektronik Erişim

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28.

Tunable laser applications için kapak resmi

Tunable laser applications

Tunable laser applications

Yazar

Duarte, F. J. (Frank J.)

Yer Numarası

ONLINE

Elektronik Erişim

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29.

ESD failure mechanisms and models için kapak resmi

ESD failure mechanisms and models

ESD failure mechanisms and models

Yazar

Voldman, Steven H. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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30.

Electrical characterization of organic electronic materials and devices için kapak resmi

Electrical characterization of organic electronic materials and devices

Electrical characterization of organic electronic materials and devices

Yazar

Stallinga, Peter, 1966- Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470750162
http://site.ebrary.com/lib/alltitles/Doc?id=10342813

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31.

Fundamentals of semiconductor devices için kapak resmi

Fundamentals of semiconductor devices

Fundamentals of semiconductor devices

Yazar

Achuthan, M. K. Bhat, K. N.

Yer Numarası

TK7871.85 A24 2009

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