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Subject: Reliability (Engineering)

Yazar

Wiley InterScience (Online service)

(10)

Bayle, Franck, author.

(3)

Delaux, David, editor.

(3)

El Hami, Abdelkhalak, editor.

(3)

Grzeskowiak, Henri, editor.

(3)

(2)

Curtis, Peter M., author.

(2)

(2)

Ushakov, I. A. (Igorʹ Alekseevich)

(2)

Allocco, Michael.

(1)

Amiri, Mehdi, author.

(1)

Bahret, Adam P., 1973- author.

(1)

Beck, André T., author.

(1)

Bergman, Bo, 1943-

(1)

Blischke, W. R., 1934-

(1)

Bolia, Nomesh, author.

(1)

Chaturvedi, Sanjay K., author.

(1)

Chaturvedi, Sanjay K., editor.

(1)

Curtis, Peter M.

(1)

(1)

Dodson, Bryan, 1962- author.

(1)

El Hami, Abdelkhalak, author.

(1)

El Hami, Abdelkhalak.

(1)

Elsayed, Elsayed A., author.

(1)

(1)

Gacula, Maximo C.

(1)

Gargama, Heeralal, editor.

(1)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(1)

Grous, Ammar, author.

(1)

Grzeskowiak, Henri.

(1)

Gullo, Louis J.

(1)

Gunawan, Indra.

(1)

Hammett, Patrick C., author.

(1)

Harrison, Robert A.

(1)

Hwang, Jaejin, author.

(1)

IEEE Xplore (Online Service), distributor.

(1)

Jackson, Christopher, 1979- author.

(1)

Jackson, Scott, author.

(1)

Jackson, Scott.

(1)

Jin, Tongdan, author.

(1)

John Wiley & Sons.

(1)

(1)

Kalal, Ted T., author.

(1)

Kapur, Kailash C., 1941- author.

(1)

Kimber, Douglas A.

(1)

Klerx, Rene, author.

(1)

Kleyner, Andre.

(1)

Klyatis, Lev M.

(1)

Kuo, Way, 1951-

(1)

Lemaire, Maurice.

(1)

Leroy, Alain, author.

(1)

Levin, Mark, 1959-

(1)

Levin, Mark, 1959- author.

(1)

Levitin, Gregory, author.

(1)

Lewis, Ted G., author

(1)

Li, Yan-Fu, author.

(1)

Limnios, N. (Nikolaos)

(1)

Malik, S. C., editor.

(1)

Melchers, R. E. (Robert E.), 1945- author.

(1)

Modarres, M. (Mohammad), author.

(1)

Moskowitz, Howard R.

(1)

Murthy, D. N. P.

(1)

Muñoz, Alejandra M., 1957-

(1)

Natvig, Bent, 1946-

(1)

Nelson, Wayne, 1936-

(1)

O'Connor, Patrick P.

(1)

Pecht, Michael, author.

(1)

Radi, Bouchaïb, author.

(1)

Rai, Rajiv N., editor.

(1)

Rai, Rajiv Nandan, author.

(1)

Ranganathan, Subramanyam.

(1)

Rausand, Marvin.

(1)

Rodin, Jonathan, 1957- author.

(1)

Saket, R. K., editor.

(1)

Sanjeevikumar, Padmanaban, 1978-

(1)

Tacchini, Marco, author.

(1)

Taylor, Zachary, 1959-

(1)

Todinov, M. T., author.

(1)

Wang, Chaonan, 1986- author.

(1)

Wiley, publisher.

(1)

Wohlgemuth, J. (John), 1946- author.

(1)

Xing, Liudong, author.

(1)

Yang, Guangbin, 1964-

(1)

(1)

(1)

Zio, Enrico, author.

(1)

Tümünü genişlet

Dil

(51)

Yayın Yılı

-

(6)

(5)

(4)

(4)

(3)

(3)

(3)

(3)

(3)

(3)

(2)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Tümünü genişlet

Konu

(27)

Electronic books.

(25)

TECHNOLOGY & ENGINEERING.

(10)

TECHNOLOGY & ENGINEERING -- Engineering (General)

(7)

TECHNOLOGY & ENGINEERING -- Reference.

(7)

Quality Control.

(4)

Systems engineering.

(4)

Industrial Engineering.

(3)

Industrial safety.

(3)

Ingénierie des systèmes.

(3)

System analysis

(3)

Analyse de systèmes.

(2)

(2)

Industrial design.

(2)

(2)

(2)

Quality control.

(2)

(2)

Six sigma (Quality control standard)

(2)

System analysis.

(2)

System failures (Engineering)

(2)

(2)

Systems Analysis

(2)

Systems engineering

(2)

Sécurité du travail.

(2)

TECHNOLOGY & ENGINEERING / Quality Control

(2)

occupational safety.

(2)

systems analysis.

(2)

Accelerated life testing.

(1)

Analyse des défaillances (Ingénierie)

(1)

Cellules photovoltaïques.

(1)

Commercial products -- Sensory evaluation.

(1)

Computational intelligence

(1)

Computational intelligence.

(1)

Computer programs -- Evaluation.

(1)

Computer software -- Evaluation

(1)

Computer software -- Evaluation.

(1)

Conception technique.

(1)

Constructions -- Stabilité.

(1)

Corporate culture

(1)

Corporate culture.

(1)

Culture organisationnelle.

(1)

Développement durable.

(1)

Electric power systems.

(1)

(1)

Engineering design.

(1)

Engineering inspection.

(1)

Fabrication -- Informatique.

(1)

Failure analysis (Engineering)

(1)

Finite element method.

(1)

Fracture Mechanics.

(1)

Gestion du risque.

(1)

Industrial design -- Statistical methods.

(1)

Industrial priorities.

(1)

Industrial safety

(1)

Intelligence informatique.

(1)

Interconnects (Integrated circuit technology)

(1)

(1)

(1)

Logiciels -- Évaluation.

(1)

(1)

Machinery -- Safety regulations.

(1)

Machinery -- Standards

(1)

Machinery -- Standards.

(1)

Machines -- Normes.

(1)

Maintainability (Engineering)

(1)

Manufacturing processes -- Data processing

(1)

Manufacturing processes -- Data processing.

(1)

(1)

Mechanical wear

(1)

Mechanical wear.

(1)

(1)

(1)

(1)

Multidisciplinary design optimization

(1)

Méthode des éléments finis.

(1)

Occupational Health

(1)

Photovoltaic cells

(1)

Photovoltaic cells.

(1)

(1)

(1)

(1)

Product life cycle.

(1)

Python (Computer program language)

(1)

Python (Langage de programmation)

(1)

Quality assurance.

(1)

Quality control

(1)

Qualité -- Contrôle.

(1)

Risk assessment.

(1)

Risk management

(1)

Risk management.

(1)

Robust statistics.

(1)

Réseaux électriques (Énergie)

(1)

SCIENCE -- Energy.

(1)

Safety factor in engineering

(1)

Safety regulations

(1)

(1)

Stochastic systems.

(1)

Structural engineering -- Mathematics.

(1)

Structural failures.

(1)

Structural stability

(1)

Structural stability.

(1)

Sustainable development

(1)

Sustainable development.

(1)

Sustainable engineering

(1)

Systems engineering -- Case studies.

(1)

Sécurité des systèmes.

(1)

TECHNOLOGY & ENGINEERING -- Civil -- General.

(1)

TECHNOLOGY & ENGINEERING -- Electrical.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- General.

(1)

TECHNOLOGY & ENGINEERING -- Quality Control.

(1)

Trees (Graph theory)

(1)

Usure (Mécanique)

(1)

(1)

(1)

Tümünü genişlet

Materyal Türü

Shelf Location

Elektronik Kütüphane

Wiley E-Kitap Koleksiyonu

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49.

Fundamentals of reliability engineering : applications in multistage interconnection networks için kapak resmi

Fundamentals of reliability engineering : applications in multistage interconnection networks

Fundamentals of reliability engineering : applications in multistage interconnection networks

Yazar

Gunawan, Indra.

Yer Numarası

ONLINE(342010.1)

Elektronik Erişim

Books24x7 http://www.books24x7.com/marc.asp?bookid=63558
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079
Ebook Library http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0
ebrary http://site.ebrary.com/id/10843879
John Wiley http://dx.doi.org/10.1002/9781118914410

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50.

Fracture mechanics. 1, Analysis of reliability and quality control için kapak resmi

Fracture mechanics. 1, Analysis of reliability and quality control

Fracture mechanics. 1, Analysis of reliability and quality control

Yazar

Grous, Ammar, author.

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9781118580004
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118580004

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51.

Importance measures in reliability, risk, and optimization principles and applications için kapak resmi

Importance measures in reliability, risk, and optimization principles and applications

Importance measures in reliability, risk, and optimization principles and applications

Yazar

Kuo, Way, 1951- Zhu, Xiaoyan.

Yer Numarası

ONLINE

Elektronik Erişim

Available by subscription from Safari Books Online
Cover image http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160
John Wiley http://dx.doi.org/10.1002/9781118314593
http://site.ebrary.com/lib/alltitles/Doc?id=10559415

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52.

Design for reliability information and computer-based systems için kapak resmi

Design for reliability information and computer-based systems

Design for reliability information and computer-based systems

Yazar

Bauer, Eric.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779

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53.

Practical system reliability için kapak resmi

Practical system reliability

Practical system reliability

Yazar

Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.

Yer Numarası

ONLINE

Elektronik Erişim

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294

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54.

Maintaining mission critical systems in a 24/7 environment için kapak resmi

Maintaining mission critical systems in a 24/7 environment

Maintaining mission critical systems in a 24/7 environment

Yazar

Curtis, Peter M.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749

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55.

Assurance technologies principles and practices : a product, process, and system safety perspective için kapak resmi

Assurance technologies principles and practices : a product, process, and system safety perspective

Assurance technologies principles and practices : a product, process, and system safety perspective

Yazar

Raheja, Dev. Allocco, Michael.

Yer Numarası

ONLINE

Elektronik Erişim

MyiLibrary, Table of contents http://www.myilibrary.com?id=54979&ref=toc
John Wiley http://dx.doi.org/10.1002/047000942X
http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/62326785.html

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