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Yazar

SpringerLink (Online service)

(482)

Wiley InterScience (Online service)

(27)

Taylor and Francis.

(10)

Nakagawa, Toshio. author.

(9)

John Wiley & Sons.

(8)

Dhillon, B. S. (Balbir S.), 1947, author.

(6)

(5)

Ayyub, Bilal M., author.

(4)

Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121

(4)

Dhillon, B. S. (Balbir S.), 1947-

(4)

Pham, Hoang. author.

(4)

Pham, Hoang. editor.

(4)

Soares, C. Guedes.

(4)

Ushakov, I. A. (Igorʹ Alekseevich)

(4)

Willis, H. Lee, 1949, author.

(4)

(3)

Balakrishnan, N. editor.

(3)

Birolini, Alessandro. author.

(3)

Bitsch, Friedemann. editor.

(3)

(3)

Chen, Wai-Fah, 1936-

(3)

Dhillon, B. S. author.

(3)

Finkelstein, Maxim. author.

(3)

Ghiocel, Dan M.

(3)

Guiochet, Jérémie. editor.

(3)

Kabashkin, Igor. editor.

(3)

Licari, James J., 1930-

(3)

Nikolaidis, Efstratios.

(3)

Prentkovskis, Olegas. editor.

(3)

Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331

(3)

Singhal, Suren.

(3)

Sugier, Jarosław. editor.

(3)

(3)

Verma, Ajit Kumar. author.

(3)

Weippl, Edgar. editor.

(3)

Whitaker, Jerry C., author.

(3)

Xu, Lida. editor.

(3)

Zamojski, Wojciech. editor.

(3)

Zhao, Xufeng. author.

(3)

Adams, Kevin MacG. author.

(2)

Ajit, Srividya. author.

(2)

Alam, M. Shahria. editor.

(2)

Alampalli, Sreenivas.

(2)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(2)

Aven, Terje. author.

(2)

Azar, Ahmad Taher. editor.

(2)

Baggini, Angelo B.

(2)

Bedny, Gregory Z., author.

(2)

Blischke, W. R., 1934-

(2)

Blischke, Wallace R. author.

(2)

Bloch, Heinz P., 1933-

(2)

Bondavalli, Andrea. editor.

(2)

Cha, Ji Hwan. author.

(2)

Chaari, Fakher. editor.

(2)

Chakrabarti, Amaresh. editor.

(2)

Chorafas, Dimitris N., author.

(2)

Collart-Dutilleul, Simon. editor.

(2)

Crespo Márquez, Adolfo. author.

(2)

Cressler, John D.

(2)

Czaplicki, Jacek M., author.

(2)

Daniel, Peter. editor.

(2)

Davim, J. Paulo. editor. (orcid)0000-0002-5659-3111

(2)

De Doncker, Rik. author.

(2)

(2)

Dorf, Richard C.

(2)

Eerkens, Jeff W. author.

(2)

(2)

Fakhfakh, Mourad. editor.

(2)

Flammini, Francesco. editor.

(2)

Frangopol, Dan M., editor.

(2)

Frenkel, Ilia. author.

(2)

Frenkel, Ilia. editor.

(2)

Gallina, Barbara. editor. (orcid)0000-0002-6952-1053

(2)

Garau, Chiara. editor. (orcid)

(2)

Gertsbakh, Ilya. author.

(2)

Gervasi, Osvaldo. editor. (orcid)

(2)

Geurts, Bernard J. editor.

(2)

Gheorghe, Adrian V. author.

(2)

Gheorghe, Adrian V. editor.

(2)

Ghosh, Ankush. editor.

(2)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(2)

Godwin, Grover Maurice.

(2)

Goodarzi, Ehsan. author.

(2)

Gopalaswamy, Venky.

(2)

Guedes Soares, Carlos.

(2)

Haddar, Mohamed. editor.

(2)

Hamrol, Adam. editor.

(2)

Harris, Gerald F.

(2)

Hausken, Kjell. editor.

(2)

Ho, Robert, author.

(2)

Hood, Ronald D.

(2)

Ilyas, Mohammad, 1953-

(2)

Katina, Polinpapilinho F. author.

(2)

Kim, Kuinam J. editor.

(2)

Klyatis, Lev M.

(2)

Koornneef, Floor. editor.

(2)

Koren, Israel, 1945-

(2)

Kurtoglu, Selahattin. author.

(2)

Lecomte, Thierry. editor.

(2)

Levitin, Gregory. editor.

(2)

Li, Jinwen. editor.

(2)

Li, Rita Yi Man. author.

(2)

Limnios, Nikolaos. author.

(2)

Liptak, Bela G.

(2)

Lisnianski, Anatoly. author.

(2)

Lisnianski, Anatoly. editor.

(2)

Liu, Yong. author.

(2)

Liu, Yu. author.

(2)

(2)

Lutz, Josef. author.

(2)

Marks, Richard M.

(2)

Mathew, Joseph. editor.

(2)

Matsagar, Vasant. editor.

(2)

Mazurkiewicz, Jacek. editor.

(2)

Mazzolani, Federico, editor.

(2)

McCuen, Richard H., 1941-

(2)

McPherson, J. W. author.

(2)

(2)

Merkow, Mark S., author.

(2)

Meyers, Johan. editor.

(2)

Misra, Krishna B., 1943-

(2)

Mobley, R. Keith, 1943-

(2)

Murgante, Beniamino. editor. (orcid)

(2)

Murthy, D. N. P.

(2)

Murthy, D. N. Prabhakar. author.

(2)

Natali, Arturo N.

(2)

Nelson, Wayne, 1936-

(2)

Ng, Kelvin Tsun Wai. editor.

(2)

Nikulin, M.S. editor.

(2)

Nwaoha, Chikezie, 1984-

(2)

O'Regan, Gerard. author.

(2)

Ohring, Milton, 1936-

(2)

Ortmeier, Frank. editor.

(2)

Papadrakakis, Manolis.

(2)

Papadrakakis, Manolis. editor.

(2)

Paprzycki, Marcin. editor.

(2)

Pecht, Michael, author.

(2)

Pluvinage, Guy. editor.

(2)

Prakash, Raghu V. editor.

(2)

(2)

Quirchmayr, Gerald. editor.

(2)

Raghavan, Lakshmikanth.

(2)

(2)

Rausand, Marvin.

(2)

Sagaut, Pierre. editor.

(2)

Sayed-Mouchaweh, Moamar. editor.

(2)

Scheuermann, Uwe. author.

(2)

Schlangenotto, Heinrich. author.

(2)

Schneidewind, Norman.

(2)

Schoitsch, Erwin. editor.

(2)

Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443

(2)

Schrieber, Randall R.

(2)

Shaw, Rabindra Nath. editor.

(2)

Shooman, Martin L.

(2)

Shoukri, M. M. (Mohamed M.), author.

(2)

Shpungin, Yoseph. author.

(2)

Siarry, Patrick. editor.

(2)

Skavhaug, Amund. editor.

(2)

Smith, Peter A., 1959-

(2)

(2)

Suhir, Ephraim.

(2)

Swanson, Dale W.

(2)

Tan, Cher Ming. author.

(2)

Tlelo-Cuautle, Esteban. editor.

(2)

Tonetta, Stefano. editor.

(2)

Troubitsyna, Elena. editor.

(2)

(2)

Varde, Prabhakar V. author.

(2)

Varde, Prabhakar V. editor.

(2)

Verma, Ajit Kumar. editor.

(2)

Vinnem, Jan Erik. author.

(2)

Vinnem, Jan-Erik. author.

(2)

Vittorini, Valeria. editor.

(2)

Walkowiak, Tomasz. editor.

(2)

Whitaker, Jerry C.

(2)

Wilpert, Bernhard, 1936-

(2)

Xiao, Liquan. editor.

(2)

Xie, Liquan, 1972- editor.

(2)

Xu, Weixia. editor.

(2)

Yadav, Sanjay. editor.

(2)

Yatskiv, Irina. editor.

(2)

You, Ilsun. editor.

(2)

Zhang, Chengyi. editor.

(2)

Zhuang, Jun. editor.

(2)

Ziaei, Mina. author.

(2)

van Aartsengel, Aristide. author.

(2)

van Gulijk, Coen. editor.

(2)

A Min, Tjoa. editor.

(1)

AITCHISON, JEAN, contributor.

(1)

Abbas, Nureddin Mohamed.

(1)

Abbas, Syed Mohsin. author.

(1)

Abdel-Hameed, Mohamed S.

(1)

Abrahamsson, Pekka. editor.

(1)

Acartürk, Cengiz, contributor.

(1)

Adams, Daniel. author.

(1)

Adimoolam, Boominathan. editor.

(1)

Adumene, Sidum. author.

(1)

(1)

Agarwal, Amit. editor.

(1)

Agarwal, Avinash Kumar. editor.

(1)

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Reliability (Engineering)

(87)

(76)

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(65)

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(65)

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(52)

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(51)

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(45)

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(45)

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(34)

(33)

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(33)

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(31)

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(27)

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(26)

(23)

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(22)

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(22)

(21)

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(21)

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(21)

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(20)

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(18)

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(18)

(17)

(17)

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(17)

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(17)

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(14)

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(14)

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(13)

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(13)

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(13)

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(13)

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(13)

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(13)

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(12)

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(11)

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(11)

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(10)

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(10)

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(10)

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(10)

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(10)

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(10)

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(9)

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(9)

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(9)

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(9)

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(8)

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(8)

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(8)

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(8)

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(8)

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(8)

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(8)

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(7)

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(7)

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(7)

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(7)

Hardware Performance and Reliability.

(7)

Information Systems.

(7)

Machinery and Machine Elements.

(7)

Maintainability (Engineering)

(7)

Mathematical Modeling and Industrial Mathematics.

(7)

Nonlinear theories.

(7)

(7)

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(7)

Production of electric energy or power.

(7)

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(7)

Transportation Technology and Traffic Engineering.

(7)

Biomedical engineering.

(6)

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(6)

Dynamical systems.

(6)

Economics/Management Science.

(6)

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(6)

Electric power systems--Reliability.

(6)

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(6)

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(6)

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(6)

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(6)

Industrial organization.

(6)

Nanotechnology.

(6)

(6)

Renewable energy sources.

(6)

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(6)

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(6)

(6)

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(6)

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(6)

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(6)

Aerospace Technology and Astronautics.

(5)

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(5)

Chemical engineering.

(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

Electric power systems.

(5)

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(5)

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(5)

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(5)

Hydraulic engineering.

(5)

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(5)

Information systems.

(5)

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(5)

LANGUAGE ARTS & DISCIPLINES / Linguistics / General.

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Microelectronics.

(5)

Nuclear engineering.

(5)

Ocean engineering.

(5)

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(5)

(5)

Processor Architectures.

(5)

Production/Logistics/Supply Chain Management.

(5)

Reliability (Engineering) -- Congresses.

(5)

Social sciences -- Statistical methods.

(5)

(5)

Telecommunication systems.

(5)

Accelerated life testing.

(4)

Algorithm Analysis and Problem Complexity.

(4)

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(4)

(4)

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(4)

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(4)

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(4)

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(4)

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(4)

Circuits and Systems.

(4)

(4)

Construction industry—Management.

(4)

Construction superintendence.

(4)

(4)

(4)

Data encryption (Computer science).

(4)

(4)

Decision making.

(4)

Economic policy.

(4)

Electronic digital computers -- Reliability.

(4)

Embedded computer systems.

(4)

Financial risk management.

(4)

(4)

Geotechnical Engineering and Applied Earth Sciences.

(4)

Industrial design.

(4)

Materials Engineering.

(4)

Materials science.

(4)

Mathematics -- Data processing.

(4)

Natural Hazards.

(4)

Probability Theory and Stochastic Processes.

(4)

Process Engineering.

(4)

Product life cycle.

(4)

Project management.

(4)

Regional planning.

(4)

Risk Management.

(4)

Risk management.

(4)

Semiconductors.

(4)

Signal, Speech and Image Processing.

(4)

Six sigma (Quality control standard)

(4)

Statistics in Engineering, Physics, Computer Science, Chemistry and Earth Sciences.

(4)

Structural analysis (Engineering) -- Congresses.

(4)

(4)

Technology -- Risk assessment.

(4)

Thermodynamics.

(4)

User interfaces (Computer systems).

(4)

Vehicle Engineering.

(4)

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Application software.

(3)

Arithmetic and Logic Structures.

(3)

(3)

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565.

Spacecraft power systems için kapak resmi

Spacecraft power systems

Spacecraft power systems

Yazar

Patel, Mukund R., 1942, author.

Yer Numarası

TL1100 .P38 2005

Elektronik Erişim

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566.

The engineering handbook için kapak resmi

The engineering handbook

The engineering handbook

Yazar

Dorf, Richard C.

Yer Numarası

TA151 .E424 2005

Elektronik Erişim

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567.

Handbook of structural engineering için kapak resmi

Handbook of structural engineering

Handbook of structural engineering

Yazar

Chen, Wai-Fah, 1936- Lui, E. M.

Yer Numarası

TA633 .H36 2005

Elektronik Erişim

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568.

Handbook of sensor networks : compact wireless and wired sensing systems için kapak resmi

Handbook of sensor networks : compact wireless and wired sensing systems

Handbook of sensor networks : compact wireless and wired sensing systems

Yazar

Ilyas, Mohammad, 1953- Mahgoub, Imad.

Yer Numarası

TK7872 .D48 H36 2005

Elektronik Erişim

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569.

What every engineer should know about decision making under uncertainty için kapak resmi

What every engineer should know about decision making under uncertainty

What every engineer should know about decision making under uncertainty

Yazar

Wang, John X., 1962- CRC Press.

Yer Numarası

TA190 .W36 2005

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9780429222733
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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570.

The electronics handbook için kapak resmi

The electronics handbook

The electronics handbook

Yazar

Whitaker, Jerry C.

Yer Numarası

TK7867 .E4244 2005

Elektronik Erişim

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571.

Accelerated testing and validation testing, engineering, and management tools for lean development için kapak resmi

Accelerated testing and validation testing, engineering, and management tools for lean development

Accelerated testing and validation testing, engineering, and management tools for lean development

Yazar

Porter, Alex.

Yer Numarası

ONLINE

Elektronik Erişim

Volltext http://www.sciencedirect.com/science/book/9780750676533

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572.

Pipeline risk management manual ideas, techniques, and resources için kapak resmi

Pipeline risk management manual ideas, techniques, and resources

Pipeline risk management manual ideas, techniques, and resources

Yazar

Muhlbauer, W. Kent.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750675796

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573.

RCM gateway to world class maintenance için kapak resmi

RCM gateway to world class maintenance

RCM gateway to world class maintenance

Yazar

Smith, Anthony M. Hinchcliffe, Glenn R.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750674614

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574.

Mobile and Wireless Communications Key technologies and future applications için kapak resmi

Mobile and Wireless Communications Key technologies and future applications

Mobile and Wireless Communications Key technologies and future applications

Yazar

Smyth, Peter, ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBBT009E

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575.

Parts selection and management için kapak resmi

Parts selection and management

Parts selection and management

Yazar

Pecht, Michael.

Yer Numarası

ONLINE

Elektronik Erişim

Authentication may be required
Full text available from Wiley InterScience
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/54046845.html
John Wiley http://dx.doi.org/10.1002/0471723886
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576.

High availability guide to DB2 için kapak resmi

High availability guide to DB2

High availability guide to DB2

Yazar

Eaton, Chris. Cialini, Enzo.

Yer Numarası

QA76.9 E28 2004

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