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1. 
Passive and Active Measurement 13th International Conference, PAM 2012, Vienna, Austria, March 12-14th, 2012. Proceedings için kapak resmi
Passive and Active Measurement 13th International Conference, PAM 2012, Vienna, Austria, March 12-14th, 2012. Proceedings
Yazar 
Taft, Nina. editor. Ricciato, Fabio. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-28537-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
2. 
Performance Evaluation, Measurement and Characterization of Complex Systems Second TPC Technology Conference, TPCTC 2010, Singapore, September 13-17, 2010. Revised Selected Papers için kapak resmi
Performance Evaluation, Measurement and Characterization of Complex Systems Second TPC Technology Conference, TPCTC 2010, Singapore, September 13-17, 2010. Revised Selected Papers
Yazar 
Nambiar, Raghunath. editor. Poess, Meikel. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-18206-8
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
3. 
Passive and Active Measurement 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011. Proceedings için kapak resmi
Passive and Active Measurement 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011. Proceedings
Yazar 
Spring, Neil. editor. Riley, George F. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-19260-9
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
4. 
Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings için kapak resmi
Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings
Yazar 
Krishnamurthy, Arvind. editor. Plattner, Bernhard. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-12334-4
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
5. 
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings için kapak resmi
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Yazar 
Abran, Alain. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Cuadrado-Gallego, Juan J. editor. Brunekreef, Jacob. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-05415-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
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