Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992

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Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 için kapak resmi

Başlık:

Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992

Yazar:

Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)

ISBN:

9780444596918

Toplantı Adı Girişi:

Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)

Yayın Bilgileri:

Amsterdam : North-Holland, 1993.

Fiziksel Tanımlama:

1 online resource (xiv, 338 p.) : ill.

Seri:

European Materials Research Society symposia proceedings ; v. 34

Seri Başlığı:

European Materials Research Society symposia proceedings ; v. 34

Konu Terimleri:

Semiconductors -- Analysis -- Congresses.

Semiconductors -- Quality control -- Congresses.

Semiconductors -- Optical properties -- Congresses.

Prozessüberwachung.

Tür:

Strassburg (1992)

Yazar Ek Girişi:

Woollam, John A.

Tüzel Kişi Ek Girişi:

European Materials Research Society.

Elektronik Erişim:

ScienceDirect http://www.sciencedirect.com/science/book/9780444899088

Ayırtma:
Kopya:

Rafta:*

Kütüphane	Materyal Türü	Demirbaş Numarası	Yer Numarası	Durumu/İade Tarihi	Materyal Ayırtma
Arıyor... Çevrimiçi Kütüphane	E-Kitap	256273-1001	ONLINE	Arıyor... Unknown	Arıyor... Rafta

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