Search Results for Electronic circuits -- Testing.

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Yazar

Agrawal, Vishwani D., 1943-

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

Domingo, George, 1937- author.

(1)

Foster, Harry, 1956-

(1)

Franca, J., ed.

(1)

Gizopoulos, Dimitris.

(1)

Huang, Wei, editor.

(1)

Lidow, Alex, author.

(1)

Maloberti, F., ed.

(1)

Mang, Theo. editor.

(1)

Meng, Hong, editor.

(1)

Mohindru, Pooja.

(1)

Perry, Douglas L.

(1)

Russell, Gordon, ed.

(1)

Soin, R. S., ed.

(1)

SpringerLink (Online service)

(1)

Taylor, Gaynor, ed.

(1)

Wang, Albert Z. H., 1962- author.

(1)

Whitaker, Jerry C.

(1)

Tümünü genişlet

Dil

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Yayın Yılı

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Tümünü genişlet

Konu

Application-specific integrated circuits.

(2)

Digital integrated circuits.

(2)

Electronic circuits -- Testing.

(2)

Electronic circuits--Testing.

(2)

Linear integrated circuits.

(2)

Logic circuits--Computer-aided design.

(2)

(2)

Analog-to-digital converters.

(1)

(1)

Chemistry, Technical.

(1)

Circuits intégrés -- Conception et construction.

(1)

Circuits intégrés -- Protection.

(1)

(1)

Corrosion and anti-corrosives.

(1)

(1)

(1)

Digital integrated circuits -- Testing.

(1)

(1)

Dijital entegre devreler -- Test.

(1)

Discrete cosine transforms.

(1)

Electric discharges -- Prevention.

(1)

Electronic apparatus and appliances

(1)

Electronic apparatus and appliances.

(1)

Electronic books.

(1)

Electronic circuits -- Computer simulation.

(1)

Electronic circuits -- Handbooks, manuals, etc.

(1)

Electronic circuits -- Testing -- Data processing.

(1)

Electronic packaging.

(1)

(1)

(1)

Electrostatics.

(1)

Elektronik devreler -- Test etme.

(1)

Expert systems (Computer science).

(1)

Field-effect transistors.

(1)

Gallium nitride.

(1)

Industrial Chemistry.

(1)

Integrated circuits -- Design and construction

(1)

Integrated circuits -- Design and construction.

(1)

Integrated circuits -- Protection

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Verification.

(1)

Integrated circuits -- Very large scale integration -- Testing.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Testing.

(1)

Integrated circuits--Very large scale integration.

(1)

(1)

Materials science.

(1)

Mise sous boîtier (Électronique)

(1)

Nitrure de gallium.

(1)

Operational amplifiers.

(1)

Power transistors.

(1)

Semi-conducteurs.

(1)

(1)

Semiconductors.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Solid state electronics

(1)

Solid state electronics.

(1)

Static eliminators

(1)

Static eliminators.

(1)

Switched capacitor filters.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

TECHNOLOGY & ENGINEERING.

(1)

TECHNOLOGY / Electronics / Circuits / General

(1)

TECHNOLOGY / Electronics / Circuits / Logic

(1)

TECHNOLOGY / Electronics / Microelectronics

(1)

Telecommunication.

(1)

Transistors de puissance.

(1)

Transistors à effet de champ.

(1)

(1)

antistatic agent.

(1)

(1)

Électronique de l'état solide.

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

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Materyal Türü

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CRC Ekitapları

Elektronik Kütüphane

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Wiley E-Kitap Koleksiyonu

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1.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits için kapak resmi

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Yazar

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Yer Numarası

TK7874.75 B87 2000

Format:

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Beytepe Kütüphanesi~1

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2.

GaN power devices for efficient power conversion için kapak resmi

GaN power devices for efficient power conversion

GaN power devices for efficient power conversion

Yazar

Lidow, Alex, author.

Yer Numarası

TK7871.95 .L53 2025

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980

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3.

Flexible electronic packaging and encapsulation technology için kapak resmi

Flexible electronic packaging and encapsulation technology

Flexible electronic packaging and encapsulation technology

Yazar

Meng, Hong, editor. Huang, Wei, editor.

Yer Numarası

TK7870.15 .F54 2024

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527845729

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4.

Practical ESD protection design için kapak resmi

Practical ESD protection design

Practical ESD protection design

Yazar

Wang, Albert Z. H., 1962- author.

Yer Numarası

TK7874

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434

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5.

Electronic circuit analysis using LTSpice XVII simulator : a practical guide for beginners. için kapak resmi

Electronic circuit analysis using LTSpice XVII simulator : a practical guide for beginners.

Electronic circuit analysis using LTSpice XVII simulator : a practical guide for beginners.

Yazar

Mohindru, Pooja.

Yer Numarası

TK7867 .M64 2021

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9781003199489
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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6.

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used için kapak resmi

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Yazar

Domingo, George, 1937- author.

Yer Numarası

TK7871.85 .D66 2020

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124

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7.

Encyclopedia of Lubricants and Lubrication için kapak resmi

Encyclopedia of Lubricants and Lubrication

Encyclopedia of Lubricants and Lubrication

Yazar

Mang, Theo. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-642-22647-2

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8.

Applied formal verification için kapak resmi

Applied formal verification

Applied formal verification

Yazar

Perry, Douglas L. Foster, Harry, 1956-

Yer Numarası

ONLINE

Elektronik Erişim

Subscription required

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9.

Advances in electronic testing : challenges and methodologies için kapak resmi

Advances in electronic testing : challenges and methodologies

Advances in electronic testing : challenges and methodologies

Yazar

Gizopoulos, Dimitris.

Yer Numarası

TK7867 .A385 2006

Format:

Durum

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10.

The electronics handbook için kapak resmi

The electronics handbook

The electronics handbook

Yazar

Whitaker, Jerry C.

Yer Numarası

TK7867 .E4244 2005

Elektronik Erişim

Click here to view.

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Durum

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11.

Algorithmic and Knowledge-based CAD for VLSI için kapak resmi

Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Yazar

Taylor, Gaynor, ed. Russell, Gordon, ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS004E

Format:

Durum

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12.

Analogue-digital ASICs Circuit techniques, design tools and applications için kapak resmi

Analogue-digital ASICs Circuit techniques, design tools and applications

Analogue-digital ASICs Circuit techniques, design tools and applications

Yazar

Soin, R. S., ed. Maloberti, F., ed. Franca, J., ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS003E

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