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1. 
Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy için kapak resmi
Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
Yazar 
Perkowitz, S.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780125507707
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Durum 
Çevrimiçi Kütüphane~1
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2. 
Wide-band-gap semiconductors proceedings of the Seventh Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 8-12 June 1992 için kapak resmi
Wide-band-gap semiconductors proceedings of the Seventh Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 8-12 June 1992
Yazar 
Trieste ICTP-IUPAP Semiconductor Symposium (7th : 1992) Van de Walle, Chris Gilbert.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444815736
Format: 
Durum 
Çevrimiçi Kütüphane~1
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3. 
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 için kapak resmi
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Yazar 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
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