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1. 
Pattern Recognition and Machine Intelligence 8th International Conference, PReMI 2019, Tezpur, India, December 17-20, 2019, Proceedings, Part I için kapak resmi
Pattern Recognition and Machine Intelligence 8th International Conference, PReMI 2019, Tezpur, India, December 17-20, 2019, Proceedings, Part I
Yazar 
Deka, Bhabesh. editor. (orcid)0000-0002-9679-6159 Maji, Pradipta. editor. (orcid)0000-0002-8288-8917 Mitra, Sushmita. editor. (orcid)0000-0001-9285-1117 Bhattacharyya, Dhruba Kumar. editor. (orcid)0000-0002-9506-7640 Bora, Prabin Kumar. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-34869-4
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2. 
Pattern Recognition and Machine Intelligence 8th International Conference, PReMI 2019, Tezpur, India, December 17-20, 2019, Proceedings, Part II için kapak resmi
Pattern Recognition and Machine Intelligence 8th International Conference, PReMI 2019, Tezpur, India, December 17-20, 2019, Proceedings, Part II
Yazar 
Deka, Bhabesh. editor. (orcid)0000-0002-9679-6159 Maji, Pradipta. editor. (orcid)0000-0002-8288-8917 Mitra, Sushmita. editor. (orcid)0000-0001-9285-1117 Bhattacharyya, Dhruba Kumar. editor. (orcid)0000-0002-9506-7640 Bora, Prabin Kumar. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-34872-4
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3. 
Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications 22nd Iberoamerican Congress, CIARP 2017, Valparaíso, Chile, November 7–10, 2017, Proceedings için kapak resmi
Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications 22nd Iberoamerican Congress, CIARP 2017, Valparaíso, Chile, November 7–10, 2017, Proceedings
Yazar 
Mendoza, Marcelo. editor. (orcid)0000-0002-7969-6041 Velastín, Sergio. editor. (orcid)0000-0001-6775-7137 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-75193-1
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4. 
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings için kapak resmi
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Yazar 
Fränti, Pasi. editor. Brown, Gavin. editor. Loog, Marco. editor. Escolano, Francisco. editor. Pelillo, Marcello. editor. (orcid)0000-0001-8992-9243
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-662-44415-3
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5. 
Recent Trends in Image Processing and Pattern Recognition Second International Conference, RTIP2R 2018, Solapur, India, December 21–22, 2018, Revised Selected Papers, Part II için kapak resmi
Recent Trends in Image Processing and Pattern Recognition Second International Conference, RTIP2R 2018, Solapur, India, December 21–22, 2018, Revised Selected Papers, Part II
Yazar 
Santosh, K. C. editor. Hegadi, Ravindra S. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-13-9184-2
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6. 
Recent Trends in Image Processing and Pattern Recognition Second International Conference, RTIP2R 2018, Solapur, India, December 21–22, 2018, Revised Selected Papers, Part III için kapak resmi
Recent Trends in Image Processing and Pattern Recognition Second International Conference, RTIP2R 2018, Solapur, India, December 21–22, 2018, Revised Selected Papers, Part III
Yazar 
Santosh, K. C. editor. Hegadi, Ravindra S. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-13-9187-3
Format: 
Durum 
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7. 
Artificial Neural Networks in Pattern Recognition 8th IAPR TC3 Workshop, ANNPR 2018, Siena, Italy, September 19–21, 2018, Proceedings için kapak resmi
Artificial Neural Networks in Pattern Recognition 8th IAPR TC3 Workshop, ANNPR 2018, Siena, Italy, September 19–21, 2018, Proceedings
Yazar 
Pancioni, Luca. editor. Schwenker, Friedhelm. editor. Trentin, Edmondo. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-99978-4
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8. 
Advances in Feature Selection for Data and Pattern Recognition için kapak resmi
Advances in Feature Selection for Data and Pattern Recognition
Yazar 
Stańczyk, Urszula. editor. Zielosko, Beata. editor. Jain, Lakhmi C. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-67588-6
Format: 
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9. 
Machine Learning and Data Mining in Pattern Recognition 14th International Conference, MLDM 2018, New York, NY, USA, July 15-19, 2018, Proceedings, Part I için kapak resmi
Machine Learning and Data Mining in Pattern Recognition 14th International Conference, MLDM 2018, New York, NY, USA, July 15-19, 2018, Proceedings, Part I
Yazar 
Perner, Petra. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-96136-1
Format: 
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10. 
Machine Learning and Data Mining in Pattern Recognition 14th International Conference, MLDM 2018, New York, NY, USA, July 15-19, 2018, Proceedings, Part II için kapak resmi
Machine Learning and Data Mining in Pattern Recognition 14th International Conference, MLDM 2018, New York, NY, USA, July 15-19, 2018, Proceedings, Part II
Yazar 
Perner, Petra. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-96133-0
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11. 
Data Analysis and Pattern Recognition in Multiple Databases için kapak resmi
Data Analysis and Pattern Recognition in Multiple Databases
Yazar 
Adhikari, Animesh. author. Adhikari, Jhimli. author. Pedrycz, Witold. author. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-03410-2
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12. 
Machine Learning and Data Mining in Pattern Recognition 10th International Conference, MLDM 2014, St. Petersburg, Russia, July 21-24, 2014, Proceedings için kapak resmi
Machine Learning and Data Mining in Pattern Recognition 10th International Conference, MLDM 2014, St. Petersburg, Russia, July 21-24, 2014, Proceedings
Yazar 
Perner, Petra. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-08979-9
Format: 
Durum 
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