chapter 1 Thermal, mechanical, quantum, and analytical sensors -- chapter 2 Instrumentation amplifiers and parameter errors -- chapter 3 Instrumentation filters with nominal error -- chapter 4 Signal acquisition, conditioning, and processing -- chapter 5 Data conversion devices and errors -- chapter 6 Sampled data and recovery with intersample error -- chapter 7 Advanced instrumentation systems and error analysis -- chapter 8 Automation systems concurrent engineering -- chapter 9 Molecular beam epitaxy semiconductor processing -- chapter 10 Aerospace composites rule-based manufacturing -- chapter 11 Fuzzy logic laser deposition superconductor production -- chapter 12 Neural network directed steel annealing -- chapter 13 X-Ray controlled vapor infiltration ceramic densification.