Search Results for Integrated circuits--Testing.

|

Kütüphane Hesabım

|

|

|

Remember to clear the cache and close the browser window.

Search Limit

Rooms Restriction Values

18

Search Field

Target Value

Limit Value

Restriction Value

Arama:

Gelişmiş Arama

Arama Sonuçlarını Sınırlandır

Yazar

Wang, Laung-Terng.

(2)

Abramovici, Miron.

(1)

(1)

Agrawal, Vishwani D., 1943-

(1)

Bakir, Muhannad S., editor.

(1)

Breuer, Melvin A.

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

(1)

Chakrabarty, Krishnendu, editor of compilation.

(1)

Chen, Wai-Kai, 1936-

(1)

Domingo, George, 1937- author.

(1)

Dorf, Richard C., author

(1)

Dorf, Richard C., editor.

(1)

Franzon, Paul D., editor.

(1)

Friedman, Arthur D.

(1)

Frobenius, Rex.

(1)

Goel, Sandeep K, editor of compilation.

(1)

Heyman, Joseph S.

(1)

Huang, Wei, editor.

(1)

Hurst, Stanley L.

(1)

IEEE Circuits and Systems Society.

(1)

(1)

Lidow, Alex, author.

(1)

Machado, Gerson A. S., ed.

(1)

Marinissen, Eric Jan, editor.

(1)

Meng, Hong, editor.

(1)

Oklobdzija, Vojin G.

(1)

Oklobdzija, Vojin G., author.

(1)

Perelroyzen, Evgeni.

(1)

Pineda de Gyvez, José.

(1)

Pradhan, Dhiraj K.

(1)

Puers, R., editor.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Scott, Allan W.

(1)

Sharma, Rohit, editor.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Voldman, Steven H.

(1)

Wang, Albert Z. H., 1962- author.

(1)

Wang, Francis C.

(1)

(1)

Whitaker, Jerry C.

(1)

Wiley InterScience (Online service)

(1)

(1)

Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

(1)

Zurawski, Richard.

(1)

Tümünü genişlet

Dil

(27)

Yayın Yılı

-

(4)

(3)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Tümünü genişlet

Konu

Electronic books.

(6)

Digital integrated circuits -- Testing.

(4)

Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

(3)

Integrated circuits -- Testing.

(3)

Integrated circuits -- Very large scale integration -- Testing.

(3)

Computer engineering.

(2)

Digital integrated circuits -- Design and construction.

(2)

Electrostatics.

(2)

Integrated circuits -- Protection.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

TECHNOLOGY & ENGINEERING -- Mechanical.

(2)

TECHNOLOGY & ENGINEERING.

(2)

(2)

Three-dimensional integrated circuits.

(2)

(1)

Cell phones -- Equipment and supplies -- Design and construction.

(1)

Circuits intégrés -- Conception et construction.

(1)

Circuits intégrés -- Protection.

(1)

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Dijital entegre devreler -- Test.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges -- Prevention.

(1)

Electric discharges.

(1)

Electrical engineering.

(1)

Electronic apparatus and appliances

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic apparatus and appliances.

(1)

Electronic circuits--Testing.

(1)

Electronic digital computers.

(1)

Electronic packaging.

(1)

(1)

(1)

Embedded computer systems -- Handbooks, manuals, etc.

(1)

Expert systems (Computer science).

(1)

Field-effect transistors.

(1)

Gallium nitride.

(1)

Guides et manuels.

(1)

(1)

Handbooks and manuals

(1)

Handbooks and manuals.

(1)

Imagerie tridimensionnelle -- Guides, manuels, etc.

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Computer-aided design.

(1)

Integrated circuits -- Design and construction

(1)

Integrated circuits -- Design and construction.

(1)

Integrated circuits -- Protection

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits -- Very large scale integration.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Internet Resources.

(1)

Logic circuits--Computer-aided design.

(1)

(1)

Low voltage integrated circuits.

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Computer-aided design.

(1)

Metal oxide semiconductors, Complementary -- Testing.

(1)

Microelectronic packaging.

(1)

Microelectronics.

(1)

Mise sous boîtier (Électronique)

(1)

Multichip modules (Microelectronics)

(1)

Nanoelectronics

(1)

Nanoelectronics.

(1)

Nanotechnologie.

(1)

(1)

Nanotechnology.

(1)

Nanoélectronique.

(1)

Nitrure de gallium.

(1)

Nondestructive testing -- Congresses.

(1)

Power electronics.

(1)

Power transistors.

(1)

Production engineering.

(1)

Radio frequency integrated circuits -- Testing.

(1)

Radio frequency integrated circuits.

(1)

Semi-conducteurs.

(1)

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Semiconductors.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Solid state electronics

(1)

Solid state electronics.

(1)

Static eliminators

(1)

Static eliminators.

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional imaging

(1)

Three-dimensional imaging -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

Transistors de puissance.

(1)

Transistors à effet de champ.

(1)

(1)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(1)

antistatic agent.

(1)

electronic engineering.

(1)

(1)

(1)

Électronique de l'état solide.

(1)

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

Tümünü genişlet

Materyal Türü

Shelf Location

Beytepe Genel Koleksiyon

CRC Ekitapları

Elektronik Kütüphane

Wiley E-Kitap Koleksiyonu

Kütüphane

Beytepe Kütüphanesi

Çevrimiçi Kütüphane

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Liste görünümüne geç

Küçük resim görünümüne geç

Eylem Seç

Ayırt
Listelerime ekle
Eposta
Yazdır

30 sonuç bulundu

Arama sonuçlarına abone ol

1 2 3

000000000000DEFAULT_TR

Yazdır

Liste seç

Bunu varsayılan liste yap.

Öğeler başarıyla eklendi

Öğeler eklenirken hata oldu. Lütfen tekrar deneyiniz.

One or more items could not be added because you are not logged in.

1.

Testing for small-delay defects in nanoscale CMOS integrated circuits için kapak resmi

Testing for small-delay defects in nanoscale CMOS integrated circuits

Testing for small-delay defects in nanoscale CMOS integrated circuits

Yazar

Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.

Yer Numarası

TK7871.99 .M44 T43 2014

Elektronik Erişim

Click here to view.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

2.

GaN power devices for efficient power conversion için kapak resmi

GaN power devices for efficient power conversion

GaN power devices for efficient power conversion

Yazar

Lidow, Alex, author.

Yer Numarası

TK7871.95 .L53 2025

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

3.

Flexible electronic packaging and encapsulation technology için kapak resmi

Flexible electronic packaging and encapsulation technology

Flexible electronic packaging and encapsulation technology

Yazar

Meng, Hong, editor. Huang, Wei, editor.

Yer Numarası

TK7870.15 .F54 2024

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527845729

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

4.

Practical ESD protection design için kapak resmi

Practical ESD protection design

Practical ESD protection design

Yazar

Wang, Albert Z. H., 1962- author.

Yer Numarası

TK7874

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

5.

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used için kapak resmi

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Yazar

Domingo, George, 1937- author.

Yer Numarası

TK7871.85 .D66 2020

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

6.

Handbook of 3D integration. Volume 4, Design, test, and thermal management için kapak resmi

Handbook of 3D integration. Volume 4, Design, test, and thermal management

Handbook of 3D integration. Volume 4, Design, test, and thermal management

Yazar

Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.

Yer Numarası

TK7874.893 .H36 2019

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

7.

Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar için kapak resmi

Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar

Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar

Yazar

Dorf, Richard C., author Dorf, Richard C., editor.

Yer Numarası

TK145

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9781315222158
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

8.

Nanoelectronics : materials, devices, applications için kapak resmi

Nanoelectronics : materials, devices, applications

Nanoelectronics : materials, devices, applications

Yazar

Puers, R., editor.

Yer Numarası

TK7874.84

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

9.

Design of 3D integrated circuits and systems için kapak resmi

Design of 3D integrated circuits and systems

Design of 3D integrated circuits and systems

Yazar

Sharma, Rohit, editor.

Yer Numarası

TK7874.893 .D48 2014

Elektronik Erişim

Click here to view.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

10.

3D IC stacking technology için kapak resmi

3D IC stacking technology

3D IC stacking technology

Yazar

Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

Yer Numarası

ONLINE

Elektronik Erişim

Subscription required

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

11.

ESD failure mechanisms and models için kapak resmi

ESD failure mechanisms and models

ESD failure mechanisms and models

Yazar

Voldman, Steven H. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

12.

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach için kapak resmi

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Yazar

Yichuang Sun, ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS019E

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

Eylem Seç

Ayırt
Listelerime ekle
Eposta
Yazdır

1 2 3

Copyright 2011 Sirsi Corporation - Enterprise Version 5.0.0.11