Search Results for Integrated circuits--Testing.

|

Kütüphane Hesabım

|

|

|

Remember to clear the cache and close the browser window.

Search Limit

Rooms Restriction Values

8

Search Field

Target Value

Limit Value

Restriction Value

Arama:

Gelişmiş Arama

Arama Sonuçlarını Sınırlandır

Daraltılmış:

+

Shelf Location: Elektronik Kütüphane

Yazar

Wang, Laung-Terng.

(2)

Abramovici, Miron.

(1)

(1)

Breuer, Melvin A.

(1)

Friedman, Arthur D.

(1)

Frobenius, Rex.

(1)

Heyman, Joseph S.

(1)

Hurst, Stanley L.

(1)

IEEE Circuits and Systems Society.

(1)

(1)

Machado, Gerson A. S., ed.

(1)

Pineda de Gyvez, José.

(1)

Pradhan, Dhiraj K.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Scott, Allan W.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Voldman, Steven H.

(1)

Wang, Francis C.

(1)

(1)

Wiley InterScience (Online service)

(1)

(1)

Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

(1)

Tümünü genişlet

Dil

(11)

Yayın Yılı

-

(3)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Tümünü genişlet

Konu

Electronic books.

(4)

Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

Integrated circuits -- Testing.

(3)

Digital integrated circuits -- Testing.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits -- Very large scale integration -- Testing.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

(2)

Cell phones -- Equipment and supplies -- Design and construction.

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits -- Design and construction.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges.

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic circuits--Testing.

(1)

Electrostatics.

(1)

Expert systems (Computer science).

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Computer-aided design.

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Logic circuits--Computer-aided design.

(1)

(1)

Low voltage integrated circuits.

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Computer-aided design.

(1)

Microelectronic packaging.

(1)

Multichip modules (Microelectronics)

(1)

Nondestructive testing -- Congresses.

(1)

Radio frequency integrated circuits -- Testing.

(1)

Radio frequency integrated circuits.

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

Three-dimensional integrated circuits.

(1)

(1)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(1)

Tümünü genişlet

Materyal Türü

Kütüphane

Çevrimiçi Kütüphane

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Liste görünümüne geç

Küçük resim görünümüne geç

Eylem Seç

Ayırt
Listelerime ekle
Eposta
Yazdır

14 sonuç bulundu

Arama sonuçlarına abone ol

1 2

000000000000DEFAULT_TR

Yazdır

Liste seç

Bunu varsayılan liste yap.

Öğeler başarıyla eklendi

Öğeler eklenirken hata oldu. Lütfen tekrar deneyiniz.

One or more items could not be added because you are not logged in.

1.

3D IC stacking technology için kapak resmi

3D IC stacking technology

3D IC stacking technology

Yazar

Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

Yer Numarası

ONLINE

Elektronik Erişim

Subscription required

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

2.

ESD failure mechanisms and models için kapak resmi

ESD failure mechanisms and models

ESD failure mechanisms and models

Yazar

Voldman, Steven H. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

3.

RF measurements for cellular phones and wireless data systems için kapak resmi

RF measurements for cellular phones and wireless data systems

RF measurements for cellular phones and wireless data systems

Yazar

Scott, Allan W. Frobenius, Rex.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

4.

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach için kapak resmi

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Yazar

Yichuang Sun, ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS019E

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

5.

System-on-chip test architectures nanometer design for testability için kapak resmi

System-on-chip test architectures nanometer design for testability

System-on-chip test architectures nanometer design for testability

Yazar

Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780123739735

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

6.

VLSI test principles and architectures design for testability için kapak resmi

VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

Yazar

Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780123705976

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

7.

Integrated circuit manufacturability the art of process and design integration için kapak resmi

Integrated circuit manufacturability the art of process and design integration

Integrated circuit manufacturability the art of process and design integration

Yazar

Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

8.

VLSI Testing Digital and mixed analogue/digital techniques için kapak resmi

VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

Yazar

Hurst, Stanley L.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS009E

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

9.

Low-power HF Microelectronics A unified approach için kapak resmi

Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Yazar

Machado, Gerson A. S., ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS008E

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

10.

Principles of semiconductor network testing için kapak resmi

Principles of semiconductor network testing

Principles of semiconductor network testing

Yazar

Afshar, Amir.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750694728

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

11.

Algorithmic and Knowledge-based CAD for VLSI için kapak resmi

Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Yazar

Taylor, Gaynor, ed. Russell, Gordon, ed.

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1049/PBCS004E

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

12.

Digital circuit testing a guide to DFT and other techniques için kapak resmi

Digital circuit testing a guide to DFT and other techniques

Digital circuit testing a guide to DFT and other techniques

Yazar

Wang, Francis C.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780127345802

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

Eylem Seç

Ayırt
Listelerime ekle
Eposta
Yazdır

1 2

Copyright 2011 Sirsi Corporation - Enterprise Version 5.0.0.11